Electron Probe X-ray Microanalysis
Electron Probe X-ray Microanalysis, Total:26 items.
The international standard classification for "Electron Probe X-ray Microanalysis" includes: Chemical technology (Vocabularies) , Other standards related to analytical chemistry , Physicochemical methods of analysis , Optical measuring instruments , Test conditions and procedures in general .
The Chinese standard classification for "Electron Probe X-ray Microanalysis" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
- GB/T 30705-2014 Microbeam analysis―Electron probe microanalysis―Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- GB/T 21636-2008 Microbeam analysis - Electron Probe Micro Analysis (EPMA) - Vocabulary
- GB/T 28634-2012 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
- GB/T 32055-2015 Microbeam analysis―Electron probe microanalysis―Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
- GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- GB/T 15247-2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using calibration curve method
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
- GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)
KR-KS
- KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
Korean Agency for Technology and Standards (KATS)
- KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
- KS D ISO 16592:2011 Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
- KS D ISO 16592-2011(2016) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
- KS D ISO 23833:2012 Microbeam analysis-Electron probe microanalysis(EPMA)-Vocabulary
Association Francaise de Normalisation
- NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
- NF ISO 11938:2012 Microbeam analysis - Electron microprobe analysis (Castaing microprobe) - Elemental mapping analysis methods using wavelength dispersive spectrometry
International Organization for Standardization (ISO)
- ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
Japanese Industrial Standards Committee (JISC)
- JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
British Standards Institution (BSI)
- BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
- 19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
SCC
- BS ISO 17470:2004 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GSO
- BH GSO ISO 17470:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
x-ray microanalysis,Electron Probe X-ray Microanalysis,Electron Probe Microanalysis,Electron Probe Microanalysis,Electron Probe Microanalyzer,Ray Microanalysis,Electron Probe X-ray Analysis,epma - Electron Probe Microanalyzer,Electron Probe X-ray Microanalysis,Electron Probe X-ray Microanalysis,Electron Probe Microanalyzer epma,Electron Probe X-ray Microanalysis,Ray Microanalysis,Transmission Electron Microscopy X-ray Energy Spectroscopy Analysis of Biological Thin Standard Samples
