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Database: 365,228(8 Aug 2026)

How to analyze energy spectrum analysis

How to analyze energy spectrum analysis, Total:288 items.

The international standard classification for "How to analyze energy spectrum analysis" includes: Other standards related to analytical chemistry , Chemical analysis , Radiation protection , Optical equipment , Physicochemical methods of analysis , Medical Sciences and health care facilities in general , Geology. Meteorology. Hydrology , Optical measuring instruments , Organic chemicals in general , Nickel, chromium and their alloys , Extraction and processing of petroleum and natural gas , Measurement of electrical and magnetic quantities , Other non-ferrous metals and their alloys , Application of statistical methods .

The Chinese standard classification for "How to analyze energy spectrum analysis" includes: Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Radiological sanitation protection , Electron optics and other physical optics instrument , Oceanology , Organic chemicals in general , Heavy metals and their alloys analysis method , Petroleum extraction , Technical management , Technical Management , Electronic measurement and equipment in general , Precious metals and their alloys , Mathematics .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 32055-2015 Microbeam analysis―Electron probe microanalysis―Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
  • GB/T 15244-2013 Microbeam analysis—Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
  • GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
  • GB/T 16140-2018 Determination of radionuclides in water by gamma spectrometry
  • GB/Z 32494-2016 Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information
  • GB/T 5123-1985 Nickel-Method of spectral analysis
  • GB/T 17359-2012 Microbeam analysis - Quantitative analysis using energy dispersive spectrometry
  • GB/T 11462-1989 Test methods of spectrum analyzers
  • GB/T 28634-2025 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
  • GB/T 42256-2022 Determination of ruthenium-106 in seawater─Gamma spectrometry
  • GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
  • GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
  • GB/T 6041-2002 General rules for mass spectrometric analysis
  • GB/T 17359-2023 Microbeam analysis—Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
  • GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
  • GB/T 28634-2012 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
  • GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
  • GB/T 20725-2025 Microbeam analysis—Electron probe microanalysis—Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
  • GB/T 41074-2021 Microbeam analysis―Method of specimen preparation for analysis of general powders using WDS and EDS
  • GB/T 11713-2015 General analytical methods of high-purity germanium gamma spectrometer
  • GB/T 16140-1995 Gamma spectrometry method for analysis of radionuclides in water
  • GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
  • GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
  • GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
  • GB/T 6041-2020 General rules for mass spectrometric analysis
  • GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
  • GB/T 11743-2013 Determination of Radionuclides in Soil by Gamma Spectrometry
  • GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis
  • GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
  • GB/T 16141-1995 Analytical method for radionuclides by alpha spectrometry

Taiwan Provincial Standard of the People's Republic of China

Professional Standard - Petroleum

  • SY/T 6189-1996 Quantitative Analysis of Energy Spectra for Minerals in Rocks
  • SY/T 7315-2016 Comprehensive two-dimensional gas chromatography component analysis method for condensate oil
  • SY/T 6189-2018 Quantitative analysis method for rock minerals by X-ray energy spectrum (EDS)
  • SY/T 5252-2002 Natural gamma spectrographic method of analysing for core sample

Group Standards of the People's Republic of China

Professional Standard - Electron

未注明发布机构

Xinjiang Provincial Standard of the People's Republic of China

  • DB65/T 4489-2022 Identification method of natural colored cotton EDS energy spectrum analysis method

Professional Standard - Non-ferrous Metal

National Metrological Verification Regulations of the People's Republic of China

Professional Standard - Hygiene

  • WS/T 184-1999 Gamma spectrometry method of analysing radionuclides in air

Professional Standard - Aerospace

National Metrological Technical Specifications of the People's Republic of China

Professional Standard - Geology

  • DZ 51-1987 Gas Chromatography Analysis of Saturated Hydrocarbons

Korean Agency for Technology and Standards (KATS)

  • KS D 1950-1999 Methods for determination of cobalt in nickel materials for electron tubes
  • KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
  • KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
  • KS D ISO 22309-2011(2016) Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
  • KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 22309-2011(2021) Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
  • KS D ISO 22309-2021 Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
  • KS D 1682-2008 Methods for emission spectrochemical analysis of lead ingot
  • KS D ISO 17973-2021 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D 1681-2003 Method for emission spectrochemica1 analysis of aluminium ingot
  • KS D 1684-2008 Methods for emission spectrographic analysis of magnesium ingot
  • KS D ISO 19319-2020 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 17973-2011(2016) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D ISO 19319:2005 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS M 0025-2008(2023) General rules for mass spectrometric analysis
  • KS D ISO 17974-2021 Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
  • KS D ISO 17973-2011(2021) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS M 0037-2008 General rules for polarographic analysis
  • KS D ISO 17974-2011(2016) Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
  • KS M 0031-2017(2022) General rules for gas chromatographic analysis
  • KS M 0035-1993 General rules for ion chromatographic analysis
  • KS D 1653-1991 Method of spectrochemica analysis
  • KS M 0031-1999 General rules for gas chromatographic analysis
  • KS M 0025-2008(2018) General rules for mass spectrometric analysis
  • KS D ISO 17973:2011 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS M 0035-2008(2023) General rules for ion chromatographic analysis
  • KS M 0027-2023 General rules for analytical methods in gas chromatography mass spectrometry
  • KS M ISO 12787-2014(2024) Cosmetics — Analytical methods — Validation criteria for analytical results using chromatographic techniques
  • KS M 0027-1993 General Rules for Analytical Methods in Gas Chromatography Mass Spectrometry
  • KS M 0027-2008(2023) General rules for analytical methods in gas chromatography mass spectrometry
  • KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
  • KS M 0025-2023 General rules for mass spectrometric analysis
  • KS M 0037-2013 General rules for polarographic analysis
  • KS M 0025-1993 General rules for mass spectrometric analysis
  • KS D ISO 3815-2011 Zinc and zinc alloys-Spectrographic analysis

British Standards Institution (BSI)

  • BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
  • BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS ISO 22309:2006 Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS)
  • BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
  • BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
  • 20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
  • 09/30191895 DC BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS 3156-4:1969 Analysis of fuel gases-Gas chromatographic analysis
  • 21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
  • BS EN 1325-1:1997 Value management, value analysis, functional analysis vocabulary-Value analysis and functional analysis
  • BS EN 61290-1-1:1998 Optical spectrum analyzer
  • BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
  • BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
  • BS ISO 17973:2024 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
  • BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
  • 23/30469291 DC BS ISO 17973. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
  • BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
  • BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
  • PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
  • BS PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
  • BS EN 62129:2006 Calibration of optical spectrum analyzers
  • BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
  • BS ISO 17470:2004 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…

GCC Standardization Organization

  • GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
  • GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
  • GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
  • GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • GSO ISO 15472:2013 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales

The Directorate General of Specifications and Metrology (DGSM)

  • OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
  • OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • OS GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
  • OS GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
  • OS GSO ISO 12787:2013 Cosmetics -- Analytical methods -- Validation criteria for analytical results using chromatographic techniques

International Organization for Standardization (ISO)

  • ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
  • ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
  • ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
  • ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
  • ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
  • ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
  • ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
  • ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
  • ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
  • ISO 17973:2024 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
  • ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
  • ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • ISO 3815:1976 Zinc and zinc alloys; Spectrographic analysis

Kingdom of Bahrain Testing and Metrology Directorate

  • BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
  • BH GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
  • BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • BH GSO ISO 13424:2017 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
  • BH GSO ISO 17974:2016 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
  • BH GSO ISO 17470:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • BH GSO ISO 12787:2016 Cosmetics -- Analytical methods -- Validation criteria for analytical results using chromatographic techniques

IN-BIS

Association of German Mechanical Engineers

Association Francaise de Normalisation

  • NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
  • NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
  • NF X50-150-1:1996 Value management, value analysis, functional analysis vocabulary. Part 1 : value analysis and functional analysis.
  • NF C93-845:2006 Calibration of optical spectrum analyzers.
  • NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
  • FD X50-101:1995 Functional analysis - Functional analysis interdisciplinary tool for competitiveness
  • NF ISO 17974:2009 Chemical Analysis of Surfaces - High Resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental and Chemical State Analysis
  • NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling
  • NF X21-004*NF ISO 22309:2012 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above.

Japanese Industrial Standards Committee (JISC)

  • JIS Z 8826:2005 Particle size analysis -- Photon correlation spectroscopy
  • JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
  • JIS C 6192:2008 Calibration of optical spectrum analyzers
  • JIS K 0127:2001 General rules for ion chromatographic analysis
  • JIS K 0118:1979 General rules for mass spectrometric analysis

RO-ASRO

U.S. Air Force

American Society for Testing and Materials (ASTM)

  • ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E1508-98(2003) Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
  • ASTM E1508-98 Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
  • ASTM E1508-12a(2019) Standard guide for quantitative analysis using energy dispersive spectroscopy
  • ASTM C791-83(2000) Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
  • ASTM E1508-12 Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
  • ASTM E1508-98(2008) Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
  • ASTM E1508-12a Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
  • ASTM STP 562-1974 Spectrochemical Analysis Algorithms
  • ASTM C696-11 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Uranium Dioxide Powders and Pellets
  • ASTM E51-67(1978) Spectral analysis method of tin alloy

PT-IPQ

  • NP EN 1325-1-2001 Value Management,Value Analysis,Functional Analysis Vocabulary Part 1:Value Analysis and Functional Analysis

South African Bureau of Standard

Gosstandart of Russia

BR-ABNT

Spanish Association for Standardization (UNE)

  • UNE-EN 1325-1:1996 VALUE MANAGEMENT, VALUE ANALYSIS, FUNCTIONAL ANALYSIS VOCABULARY. PART 1: VALUE ANALYSIS AND FUNCTIONAL ANALYSIS.
  • AENOR UNE-EN 14726:2006 Aluminum and aluminum alloys. Chemical analysis. Guideline for spark optical emission spectrometric analysis

Ente Nazionale Italiano di Unificazione

  • UNI EN 1325-1:1998 Value Management, Value Analysis, Functional Analysis vocabulary - Value Analysis and Functional Analysis
  • UNI EN 27941:1995 Commercial promane and butane. Analysis by gas chromatography

Lithuanian Standards Office

  • LST EN 1325-1-2004 Value Management, Value Analysis, Functional Analysis vocabulary - Part 1: Value Analysis and Functional Analysis

Standards Norway

  • NS-EN 1325-1:1996 Value Management, Value Analysis, Functional Analysis vocabulary — Part 1: Value Analysis and Functional Analysis
  • NS 9815:1995 Water and air analysis - Gas chromatographic analysis for the determination of polycyclic aromatic hydrocarbons (PAH)
  • NS-EN 14726:2005 Aluminium and aluminium alloys — Chemical analysis — Guideline for spark optical emission spectrometric analysis

Danish Standards Foundation

German Institute for Standardization

  • DIN EN 1325-1:1996 Value management, value analysis, functional analysis, vocabulary - Part 1: Value analysis and functional analysis; German version EN 1325-1:1996
  • DIN EN 1325-1:1996-11 Vocabulary for value management, value analysis and functional analysis - Part 1: Value analysis and functional analysis
  • DIN 51418-1 E:2007-07 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN EN ISO 29581-2 E:2007-07 Chemical analysis methods for cement. Part 2: X-ray fluorescence spectrometry analysis
  • DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • DIN ISO 15632:2015-10 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)

European Committee for Standardization (CEN)

Institute of Electrical and Electronics Engineers (IEEE)

CZ-CSN

Standard Association of Australia (SAA)

  • AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
  • AS 2347:1998(R2016) Zinc and zinc alloys - Sampling for chemical and spectrochemical analysis
  • AS 2347:1998 Zinc and zinc alloys - Sampling for chemical and spectrochemical analysis

Swedish Institute for Standards

  • SS-EN 62129:2006 Calibration of optical spectrum analyzers
  • SS-EN 14726:2005 Aluminium and aluminium alloys - Chemical analysis - Guideline for spark optical emission spectrometric analysis

Comitato Elettrotecnico Italiano

International Electrotechnical Commission (IEC)

US-CFR-file

  • CFR 33-148.277-2013 Navigation and navigable waters. Part148:Deepwater ports: general. Section148.277:How may Federal agencies and States participate in the application process?
  • CFR 33-148.213-2013 Navigation and navigable waters. Part148:Deepwater ports: general. Section148.213:How do I withdraw my application?