How to analyze energy spectrum analysis
How to analyze energy spectrum analysis, Total:288 items.
The international standard classification for "How to analyze energy spectrum analysis" includes: Other standards related to analytical chemistry , Chemical analysis , Radiation protection , Optical equipment , Physicochemical methods of analysis , Medical Sciences and health care facilities in general , Geology. Meteorology. Hydrology , Optical measuring instruments , Organic chemicals in general , Nickel, chromium and their alloys , Extraction and processing of petroleum and natural gas , Measurement of electrical and magnetic quantities , Other non-ferrous metals and their alloys , Application of statistical methods .
The Chinese standard classification for "How to analyze energy spectrum analysis" includes: Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Radiological sanitation protection , Electron optics and other physical optics instrument , Oceanology , Organic chemicals in general , Heavy metals and their alloys analysis method , Petroleum extraction , Technical management , Technical Management , Electronic measurement and equipment in general , Precious metals and their alloys , Mathematics .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 32055-2015 Microbeam analysis―Electron probe microanalysis―Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
- GB/T 15244-2013 Microbeam analysis—Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
- GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
- GB/T 16140-2018 Determination of radionuclides in water by gamma spectrometry
- GB/Z 32494-2016 Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information
- GB/T 5123-1985 Nickel-Method of spectral analysis
- GB/T 17359-2012 Microbeam analysis - Quantitative analysis using energy dispersive spectrometry
- GB/T 11462-1989 Test methods of spectrum analyzers
- GB/T 28634-2025 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
- GB/T 42256-2022 Determination of ruthenium-106 in seawater─Gamma spectrometry
- GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
- GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
- GB/T 6041-2002 General rules for mass spectrometric analysis
- GB/T 17359-2023 Microbeam analysis—Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
- GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
- GB/T 28634-2012 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
- GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
- GB/T 20725-2025 Microbeam analysis—Electron probe microanalysis—Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
- GB/T 41074-2021 Microbeam analysis―Method of specimen preparation for analysis of general powders using WDS and EDS
- GB/T 11713-2015 General analytical methods of high-purity germanium gamma spectrometer
- GB/T 16140-1995 Gamma spectrometry method for analysis of radionuclides in water
- GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
- GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
- GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
- GB/T 6041-2020 General rules for mass spectrometric analysis
- GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
- GB/T 11743-2013 Determination of Radionuclides in Soil by Gamma Spectrometry
- GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis
- GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
- GB/T 16141-1995 Analytical method for radionuclides by alpha spectrometry
Taiwan Provincial Standard of the People's Republic of China
- CNS 12511-1989 General Rules for Mass Spectrometric Analysis
- CNS 12509-1989 General Rules Analytical Methods in Gas Chromatography/Mass Spectrometry
- CNS 14341-1999 Optical spectrum analyzer
- CNS 6493-1980 General Rules for Analytical Method in Polarography
- CNS 12416-1988 Genenral Rules for Emission Spectroscopic Analysis
Professional Standard - Petroleum
- SY/T 6189-1996 Quantitative Analysis of Energy Spectra for Minerals in Rocks
- SY/T 7315-2016 Comprehensive two-dimensional gas chromatography component analysis method for condensate oil
- SY/T 6189-2018 Quantitative analysis method for rock minerals by X-ray energy spectrum (EDS)
- SY/T 5252-2002 Natural gamma spectrographic method of analysing for core sample
Group Standards of the People's Republic of China
- T/CI 060-2022 Online chromatographic analysis system
- T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
- T/ZPP 017-2023 Mass Cytometry Analyzer
Professional Standard - Electron
- SJ 2656-1986 Method for defermination of Tungsten by spectrometry
- SJ/Z 3206.2-1989 Laser source and its performance requirements for determination of emision spectrum
- SJ/T 10234-1991 Spectrum analyzer for QF4031
- SJ 20914-2004 General specification for spectrum analyzer
- SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum
- SJ 2657-1986 Mothod of molybdeuum spectral analysis
未注明发布机构
- FORD FLTM EU-AJ 051-01-2000 METHOD OF CARBON TYPE ANALYSIS OF LUBRICATING OILS BY INFRARED SPECTROSCOPY
- JIS K 8272:1972(1994) Liquid Chromatography Method for Analysis
Xinjiang Provincial Standard of the People's Republic of China
- DB65/T 4489-2022 Identification method of natural colored cotton EDS energy spectrum analysis method
Professional Standard - Non-ferrous Metal
- YS/T 84-1994 Iridium matrix for spectroscopic analysis
- YS/T 84-2020 Iridium matrix for spectral analysis
- YS/T 85-2006 Basis rhodium as spectral analysis
- YS/T 84-2006 Basis iridium as spectral analysis
- YS/T 82-2006 Basis platinum as spectral analysis
- YS/T 83-2020 Palladium matrix for spectral analysis
- YS/T 83-2006 Basis palladium as spectral analysis
- YS/T 85-1994 Rhodium Matrix for Spectroscopic Analysis
- YS/T 82-1994 Platinum substrates for spectroscopic analysis
- YS/T 82-2020 Platinum matrix for spectral analysis
- YS/T 85-2020 Rhodium matrix for spectral analysis
- YS/T 83-1994 Palladium Matrix for Spectroscopic Analysis
National Metrological Verification Regulations of the People's Republic of China
- JJG 1035-2022 Optical Spectrum Analyzers in Telecommunication
Professional Standard - Hygiene
- WS/T 184-1999 Gamma spectrometry method of analysing radionuclides in air
Professional Standard - Aerospace
- QJ 2673-1994 Random Series Spectral Analysis Method
National Metrological Technical Specifications of the People's Republic of China
- JJF 1396-2013 Calibration Specification for Spectrum Analyzer
Professional Standard - Geology
- DZ 51-1987 Gas Chromatography Analysis of Saturated Hydrocarbons
Korean Agency for Technology and Standards (KATS)
- KS D 1950-1999 Methods for determination of cobalt in nickel materials for electron tubes
- KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
- KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
- KS D ISO 22309-2011(2016) Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
- KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS D ISO 22309-2011(2021) Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
- KS D ISO 22309-2021 Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
- KS D 1682-2008 Methods for emission spectrochemical analysis of lead ingot
- KS D ISO 17973-2021 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D 1681-2003 Method for emission spectrochemica1 analysis of aluminium ingot
- KS D 1684-2008 Methods for emission spectrographic analysis of magnesium ingot
- KS D ISO 19319-2020 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS D ISO 17973-2011(2016) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D ISO 19319:2005 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS M 0025-2008(2023) General rules for mass spectrometric analysis
- KS D ISO 17974-2021 Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
- KS D ISO 17973-2011(2021) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS M 0037-2008 General rules for polarographic analysis
- KS D ISO 17974-2011(2016) Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
- KS M 0031-2017(2022) General rules for gas chromatographic analysis
- KS M 0035-1993 General rules for ion chromatographic analysis
- KS D 1653-1991 Method of spectrochemica analysis
- KS M 0031-1999 General rules for gas chromatographic analysis
- KS M 0025-2008(2018) General rules for mass spectrometric analysis
- KS D ISO 17973:2011 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS M 0035-2008(2023) General rules for ion chromatographic analysis
- KS M 0027-2023 General rules for analytical methods in gas chromatography mass spectrometry
- KS M ISO 12787-2014(2024) Cosmetics — Analytical methods — Validation criteria for analytical results using chromatographic techniques
- KS M 0027-1993 General Rules for Analytical Methods in Gas Chromatography Mass Spectrometry
- KS M 0027-2008(2023) General rules for analytical methods in gas chromatography mass spectrometry
- KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
- KS M 0025-2023 General rules for mass spectrometric analysis
- KS M 0037-2013 General rules for polarographic analysis
- KS M 0025-1993 General rules for mass spectrometric analysis
- KS D ISO 3815-2011 Zinc and zinc alloys-Spectrographic analysis
British Standards Institution (BSI)
- BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
- BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 22309:2006 Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS)
- BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
- 20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
- 09/30191895 DC BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS 3156-4:1969 Analysis of fuel gases-Gas chromatographic analysis
- 21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- BS EN 1325-1:1997 Value management, value analysis, functional analysis vocabulary-Value analysis and functional analysis
- BS EN 61290-1-1:1998 Optical spectrum analyzer
- BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- BS ISO 17973:2024 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
- 23/30469291 DC BS ISO 17973. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
- BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
- BS PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
- BS EN 62129:2006 Calibration of optical spectrum analyzers
- BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
- BS ISO 17470:2004 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
GCC Standardization Organization
- GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
- GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
- GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- GSO ISO 15472:2013 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
- OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- OS GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
- OS GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
- OS GSO ISO 12787:2013 Cosmetics -- Analytical methods -- Validation criteria for analytical results using chromatographic techniques
International Organization for Standardization (ISO)
- ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
- ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
- ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
- ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
- ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
- ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
- ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- ISO 17973:2024 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
- ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
- ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- ISO 3815:1976 Zinc and zinc alloys; Spectrographic analysis
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
- BH GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- BH GSO ISO 13424:2017 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
- BH GSO ISO 17974:2016 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
- BH GSO ISO 17470:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- BH GSO ISO 12787:2016 Cosmetics -- Analytical methods -- Validation criteria for analytical results using chromatographic techniques
IN-BIS
- IS 11148-1984 Spectrum Analyzer Performance
- IS 7658-1975 Spectral analysis method of aluminum
Association of German Mechanical Engineers
- VDI VDE 2631 Blatt-11 E:2019-07 Form measurement spectral analysis (Fourier analysis harmonic analysis)
- VDI/VDE 2631 BLATT 11-2020 Shape measurement technology - spectral analysis (Fourier analysis, harmonic analysis)
- VDI VDE DGQ DKD 2622 Blatt-11 E:2019-11 Calibration of spectrum analyzers
- VDI 3822-2011 Damage analysis — Basics and implementation of a damage analysis
Association Francaise de Normalisation
- NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
- NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
- NF X50-150-1:1996 Value management, value analysis, functional analysis vocabulary. Part 1 : value analysis and functional analysis.
- NF C93-845:2006 Calibration of optical spectrum analyzers.
- NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
- FD X50-101:1995 Functional analysis - Functional analysis interdisciplinary tool for competitiveness
- NF ISO 17974:2009 Chemical Analysis of Surfaces - High Resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental and Chemical State Analysis
- NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling
- NF X21-004*NF ISO 22309:2012 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above.
Japanese Industrial Standards Committee (JISC)
- JIS Z 8826:2005 Particle size analysis -- Photon correlation spectroscopy
- JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
- JIS C 6192:2008 Calibration of optical spectrum analyzers
- JIS K 0127:2001 General rules for ion chromatographic analysis
- JIS K 0118:1979 General rules for mass spectrometric analysis
RO-ASRO
- STAS 1706/17-1971 CUPPER speelrochemical analysis
- STAS 11464-1980 IRON AND STEEL Spectrochemical analysis
- STAS 5177-1981 EMISSION SPECTROGRAPHICAL ANALYSIS Terminology
U.S. Air Force
- AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
- AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER
- AIR FORCE A-A-59130 VALID NOTICE 1-2012 Analyzer, Spectrum 10 KHZ to 50 GHZ
American Society for Testing and Materials (ASTM)
- ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E1508-98(2003) Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
- ASTM E1508-98 Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
- ASTM E1508-12a(2019) Standard guide for quantitative analysis using energy dispersive spectroscopy
- ASTM C791-83(2000) Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
- ASTM E1508-12 Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
- ASTM E1508-98(2008) Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
- ASTM E1508-12a Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
- ASTM STP 562-1974 Spectrochemical Analysis Algorithms
- ASTM C696-11 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Uranium Dioxide Powders and Pellets
- ASTM E51-67(1978) Spectral analysis method of tin alloy
PT-IPQ
- NP EN 1325-1-2001 Value Management,Value Analysis,Functional Analysis Vocabulary Part 1:Value Analysis and Functional Analysis
South African Bureau of Standard
- SANS 5567:1968 Spectrographic analysis of copper
Gosstandart of Russia
- GOST 12223.0-1976 Iridium. Method of spectral analysis
- GOST 14316-1991 Molybdenum. Spectrum analysis methods
- GOST 14339.5-1991 Tungsten. Methods of spectral analysis
- GOST 12227.0-1976 Rodium. Method of spectral analysis
- GOST 8776-1979 Cobalt. Methods of chemical-atomic-emission spectral analysis
- GOST 8857-1977 Lead. Method of spectral analysis
- GOST 8776-1999 Cobalt. Methods of chemical-atomic-emission spectral analysis
- GOST 16274.8-1977 Bismuth. Spectral methods of analysis
- GOST 27611-1988 Cast iron. Photoelectrical sspeciral method of analisis
- GOST 29103-1991 Tungsten, molibdenum. General requirements for methods of chemical and spectral analysis
- GOST 15483.10-2004 Tin. Methods of atomic-emission spectral analysis
- GOST 12228.1-1978 Ruthenium. Method of spectral analysis
- GOST 22397-1977 Zinc powder. Method of spectral analysis
- GOST 18895-1981 Steel. Method of photoelectric spectral analysis
- GOST 17818.15-1990 Graphite. Method of spectrum analysis
- GOST 17261-1977 Zinc. Spectral method of analysis
- GOST 18895-1997 Steel. Method of photoelectric spectral analysis
- GOST 3221-1985 Primary aluminium. Methods of spectral analysis
- GOST 15483.10-1978 Tin. Spectral methods for determination of bismuth, iron, copper, arsenic, lead, antimony, zinc and aluminium
- GOST 12224.1-1978 Osmimum. Chemical-spectral method of analysis
- GOST 7727-1981 Aluminium alloys. Methods of spectral analysis
- GOST 16273.1-2014 Selenium technical. Method of spectral analysis
- GOST 9816.4-2014 Tellurium technical. Method of spectral analysis
- GOST 7728-1979 Magnesium alloys. Methods of spectral analysis
- GOST 1367.1-1983 Antimony. Spectral method for the determination of impurities without preliminary concentration
- GOST 1367.11-1983 Antimony. Chemical-spectral method of analysis
- GOST 13348-1974 Antimonous antimonides. Method of spectral analysis
- GOST 23328-1978 Zinc antifriction alloys. Methods of spectral analysis
- GOST 23328-1995 Zinc alloys. Methods of spectral analysis
- GOST 23902-1979 Titanium alloys. Methods of spectral analysis
- GOST 7.28-1980 System of standards "information, libraries and publishing". Representation of extended Latin alphabet for information interchange on magnetic tapes
- GOST 30082-1993 Zinc-aluminium alloys. Spectral method of analysis
- GOST 12551.2-1982 Alloys platinum-copper. Methods of spectral analysis
- GOST 16273.1-1985 Technical selenium. Method of spectral analysis
- GOST 9816.4-1984 Technical tellurium. Method of spectral analysis
- GOST 27809-1988 Steel and cast iron. Methods of spectropgapnic analysis
- GOST R 56240-2014 Copper. Spectral methods of impurity analysis
- GOST 16321.2-1970 Silver-copper alloys. Method of spectral analysis
- GOST 12554.2-1983 Platinum-ruthenium alloys. Method of spectral analysis
- GOST 22536.14-1988 Carbon steel and unalloyed cast iron. Methods for determination of zirconium
- GOST R 57988-2017 Polymer composites. Thermogravimetric analysis coupled with analysis by infrared spectroscopy (TGA/IR)
- GOST 12558.2-1978 Palladium-silver alloys. Method of spectral of analysis
- GOST 12562.2-1982 Alloys gold-platinum. Methods of spectral analysis
- GOST R 57851.1-2017 Gas-condensate mixture. Part 1. Separation gas. Compositional analysis by gas chromatography method
- GOST 12555.2-1983 Silver-platinum alloys. Method of spectral analysis
BR-ABNT
- ABNT P-EB-304-1969 "Spectral Analysis" Standard
Spanish Association for Standardization (UNE)
- UNE-EN 1325-1:1996 VALUE MANAGEMENT, VALUE ANALYSIS, FUNCTIONAL ANALYSIS VOCABULARY. PART 1: VALUE ANALYSIS AND FUNCTIONAL ANALYSIS.
- AENOR UNE-EN 14726:2006 Aluminum and aluminum alloys. Chemical analysis. Guideline for spark optical emission spectrometric analysis
Ente Nazionale Italiano di Unificazione
- UNI EN 1325-1:1998 Value Management, Value Analysis, Functional Analysis vocabulary - Value Analysis and Functional Analysis
- UNI EN 27941:1995 Commercial promane and butane. Analysis by gas chromatography
Lithuanian Standards Office
- LST EN 1325-1-2004 Value Management, Value Analysis, Functional Analysis vocabulary - Part 1: Value Analysis and Functional Analysis
Standards Norway
- NS-EN 1325-1:1996 Value Management, Value Analysis, Functional Analysis vocabulary — Part 1: Value Analysis and Functional Analysis
- NS 9815:1995 Water and air analysis - Gas chromatographic analysis for the determination of polycyclic aromatic hydrocarbons (PAH)
- NS-EN 14726:2005 Aluminium and aluminium alloys — Chemical analysis — Guideline for spark optical emission spectrometric analysis
Danish Standards Foundation
- DANSK DS/EN 1325-1:1996 Value management, value analysis, functional analysis vocabulary - Part 1: Value analysis and functional analysis
- DS/EN 1325-1:1997 Value management, value analysis, functional analysis vocabulary - Part 1: Value analysis and functional analysis
- DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
- DS/EN 62129:2006 Calibration of optical spectrum analyzers
- DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
German Institute for Standardization
- DIN EN 1325-1:1996 Value management, value analysis, functional analysis, vocabulary - Part 1: Value analysis and functional analysis; German version EN 1325-1:1996
- DIN EN 1325-1:1996-11 Vocabulary for value management, value analysis and functional analysis - Part 1: Value analysis and functional analysis
- DIN 51418-1 E:2007-07 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN EN ISO 29581-2 E:2007-07 Chemical analysis methods for cement. Part 2: X-ray fluorescence spectrometry analysis
- DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- DIN ISO 15632:2015-10 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
European Committee for Standardization (CEN)
- CEN EN 62129-2006 Calibration of optical spectrum analyzers
- CEN EN 62129-2006_ Calibration of optical spectrum analyzers
Institute of Electrical and Electronics Engineers (IEEE)
- IEEE 748-1979 STANDARD FOR SPECTRUM ANALYZERS
- IEEE Std 748-1979 IEEE Standard for Spectrum Analyzers
- IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers
CZ-CSN
- CSN 38 5562-1982 Natural gas. Chromatographic analysis
- CSN 42 0600 Cast.2-1975 Antimony of high purity. Methods of chemical and spectral analysis. Preparation of the sample
- CSN 42 1211-1986 The sampling of technical iron for spectrometric and chemical analysis
Standard Association of Australia (SAA)
- AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
- AS 2347:1998(R2016) Zinc and zinc alloys - Sampling for chemical and spectrochemical analysis
- AS 2347:1998 Zinc and zinc alloys - Sampling for chemical and spectrochemical analysis
Swedish Institute for Standards
- SS-EN 62129:2006 Calibration of optical spectrum analyzers
- SS-EN 14726:2005 Aluminium and aluminium alloys - Chemical analysis - Guideline for spark optical emission spectrometric analysis
Comitato Elettrotecnico Italiano
- CEI EN 62129:2006 Calibration of optical spectrum analyzers
International Electrotechnical Commission (IEC)
- IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- IEC 62129:2006 Calibration of optical spectrum analyzers
US-CFR-file
- CFR 33-148.277-2013 Navigation and navigable waters. Part148:Deepwater ports: general. Section148.277:How may Federal agencies and States participate in the application process?
- CFR 33-148.213-2013 Navigation and navigable waters. Part148:Deepwater ports: general. Section148.213:How do I withdraw my application?
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