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Database: 365,228(8 Aug 2026)

particle scanning method

particle scanning method, Total:185 items.

The international standard classification for "particle scanning method" includes: Chemical analysis , Textile fibres , Raw materials and raw glass , Photographic paper, films and cartridges , Protection against crime .

The Chinese standard classification for "particle scanning method" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Synthetic materials in general , Optical Measurement , Oil shale , Ceramic and glass in general , Basic standards and general methods for photosensitive material , Chemical Measurement , Crime judging technology .


国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 40826-2021 Test method for hand-arranging staple length of dehaired cashmere—Flatbed scanner method
  • GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
  • GB/T 33838-2017 Microbeam analysis―Scanning electron microscopy―Methods of evaluating image sharpness

Professional Standard - Machinery

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effects on topography induced by nanoparticles
  • GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
  • GB/T 30020-2013 Test Method for the Defects of Glass - Photoelastic Scanning Method
  • GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • GB/T 43196-2023 Nanotechnologies—Measurements of particle size and shape distributions by scanning electron microscopy
  • GB/T 30020-2023 Test method for determing defects of glass—Photoelastic scanning method

Military Standard of the People's Republic of China-General Armament Department

  • GJB 737.11-1993 Test methods for pyrotechnic chemicals Particle size determination Scanning electron microscopy

Professional Standard - Education

  • JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
  • JY/T 010-1996 General rules for analytical scanning electron microscopy

Professional Standard - Petroleum

  • SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
  • SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
  • SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

  • GJB 5891.6-2006 Test method of loading material for initiating explosive device Part 6: Measurement of grain size Scanning electron microscopy

Shanghai Provincial Standard of the People's Republic of China

  • DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

  • SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Chemical Industry

  • HG/T 3640-1999 Photography - Film dimensions - Film for electronic scanner use

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

Professional Standard - Judicatory

  • SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Fujian Provincial Standard of the People's Republic of China

Professional Standard - Public Safety Standards

  • GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
  • GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
  • GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
  • GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry

Inner Mongolia Provincial Standard of the People's Republic of China

  • DB15/T 3564-2024 Quantitative analysis of cashmere, sheep wool and their mixtures, scanning electron microscope fine-grained image recognition method
  • DB15/T 981-2016 Carded cashmere hand row length test method drawing board electronic scanner method

Group Standards of the People's Republic of China

  • T/CIRA 42-2022 Electron accelerator beam scanning uniformity detection method for aluminum rods used in radiation processing
  • T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy

Taiwan Provincial Standard of the People's Republic of China

  • CNS 14197-1998 Electric linear scanining ultrasonic diagnostic equipment
  • CNS 12007-1987 Method of Test for Helical Scanning Video Tape Recorders

Jiangsu Provincial Standard of the People's Republic of China

  • DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

未注明发布机构

VDI - Verein Deutscher Ingenieure

  • VDI 3861 Blatt 2-1994 Messen anorganischer faserfoermiger Partikeln im stroemenden Reingas - Rasterelektronenmikroskopisches Verfahren
  • VDI 3861 Blatt 2-1996 Messen anorganischer faserfoermiger Partikeln im stroemenden Reingas - Rasterelektronenmikroskopisches Verfahren
  • VDI 3861 Blatt 2-2006 Messen von Emissionen - Messen anorganischer faserfoermiger Partikeln im stroemenden Reingas - Rasterelektronenmikroskopisches Verfahren
  • VDI 3492-2011 Messen von Innenraumluftverunreinigungen - Messen von Immissionen - Messen anorganischer faserfoermiger Partikeln - Rasterelektronenmikroskopisches Verfahren
  • VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
  • VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

Japanese Industrial Standards Committee (JISC)

  • JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
  • JIS K 0132:1997 General rules for scanning electron microscopy
  • JIS K 7542:1993 Dimensions of photographic film for electronic scanner use
  • JIS T 1507:1989 Electronic linear scanning ultrasonic diagnostic equipment
  • JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
  • JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method

GOST

  • GOST R ISO 14966-2022 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method

British Standards Institution (BSI)

  • BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
  • BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
  • 18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
  • BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
  • BS ISO 17097:2024 3-D human body scan data. Methods for the processing of human body scan data
  • BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
  • BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
  • BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • 18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
  • BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
  • BS ISO 26824:2013 Particle characterization of particulate systems. Vocabulary
  • BS ISO 16067-1:2003 Photography. Spatial resolution measurements for electronic scanners for photographic images. Scanners for reflective media
  • 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
  • BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
  • BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
  • BS ISO 12653-2:2001 Electronic imaging. Test target for the black-and-white scanning of office documents. Method of use
  • 21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
  • BS ISO 12653-2:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Method of use
  • 23/30461186 DC BS ISO 17097. 3-D human body scan data - Part 1. Terminologies and methodologies for processing of human scan data

International Organization for Standardization (ISO)

  • ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
  • ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
  • ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
  • ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO 14966:2002/cor 1:2007 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method; Technical Corrigendum 1
  • ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO 16067-2:2004 Photography - Electronic scanners for photographic images - Spatial resolution measurements - Part 2: Film scanners
  • ISO 26824:2013 Particle characterization of particulate systems - Vocabulary
  • ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
  • ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
  • ISO 11312:1993 Photography; film dimensions; film for electronic scanner use
  • ISO/IEC 17991:2021 Information technology -- Office equipment -- Method for measuring scanning productivity of digital scanning devices
  • ISO/DIS 17097:2023 3-D human body scan data — Part 1: Terminologies and methodologies for processing of human scan data
  • ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • ISO 16067-1:2003 Photography - Spatial resolution measurements of electronic scanners for photographic images - Part 1: Scanners for reflective media
  • ISO/CD 17097 3-D digital human body scan data — Part 1: Terminologies and methodologies for processing of human scan data

SCC

  • VDI 3861 BLATT 2-2008 Measuring emissions — Measuring inorganic fibrous particles in flowing clean gas — Scanning electron microscopic method
  • VDI 3861 BLATT 2-2008 Measuring emissions — Measuring inorganic fibrous particles in flowing clean gas — Scanning electron microscopic method
  • DANSK DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
  • VDI 3492-2013 Measuring indoor air pollution — Measuring immissions — Measuring inorganic fibrous particles — Scanning electron microscopy method
  • VDI 3492-2013 Measuring indoor air pollution — Measuring immissions — Measuring inorganic fibrous particles — Scanning electron microscopy method
  • NS-EN ISO 19749:2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
  • AENOR UNE 57083:1974 Paper. Paper tapes, for use in electronic scanning equipment.
  • AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
  • DANSK DS/EN ISO 19749:2023 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
  • BS DISC PD 0016:2001 Document scanning. Guide to scanning business documents
  • BS PD 0016:2001 Document scanning. Guide to scanning business documents
  • AWWA QTC98270 Count Matching In-situ Particle Counts to Scanning Electron Microscopic Counts for Treatment Facility Process Control
  • DIN EN ISO 19749 E:2022 Draft Document - Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German and English version prEN ISO 19749:2022
  • VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
  • DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
  • BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
  • BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
  • AWWA QTC97119 Laser Scanning Device for Detecting Cryptosporidium
  • DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
  • AENOR UNE-EN ISO 9220:1996 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
  • NS-EN 1822-4:2000 High efficiency particulate air filters (HEPA and ULPA) — Part 4: Determining leakage of filter element (Scan method)

Korean Agency for Technology and Standards (KATS)

  • KS I 0051-1999 General rules for scanning electron microscopy
  • KS A ISO 16067-2-2005(2020) Photography-Electronic scanners for photographic images-Spatial resolution measurement-Part 2:Film scanners
  • KS I 0051-2019 General rules for scanning electron microscopy
  • KS M 0044-1999 General rules for scanning electron microscopy
  • KS I 0051-1999(2019) General rules for scanning electron microscopy
  • KS A ISO 16067-2-2020 Photography-Electronic scanners for photographic images-Spatial resolution measurement-Part 2:Film scanners
  • KS D ISO 22493-2012(2017) Microbeam analysis-Scanning electron microscopy-Vocabulary
  • KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
  • KS D ISO 9220-2009(2022) Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
  • KS D ISO 9220-2022 Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
  • KS D ISO 9220:2009 Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
  • KS D ISO 9220-2009(2017) Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
  • KS D ISO 22493:2012 Microbeam analysis-Scanning electron microscopy-Vocabulary
  • KS A ISO 16067-2:2005 Photography-Electronic scanners for photographic images-Spatial resolution measurement-Part 2:Film scanners
  • KS A ISO 16067-1:2005 Photography-Spatial resolution measurements of electronic scanners for photographic image-Part 1:Scanners for reflective media
  • KS A ISO 16067-1-2020 Photography-Spatial resolution measurements of electronic scanners for photographic image-Part 1:Scanners for reflective media
  • KS A ISO 16067-1-2005(2020) Photography-Spatial resolution measurements of electronic scanners for photographic image-Part 1:Scanners for reflective media

Association Francaise de Normalisation

  • NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
  • NF EN ISO 19749:2023 Nanotechnologies - Determination of particle size and shape distribution by scanning electron microscopy
  • NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
  • NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
  • XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
  • XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • NF Z42-010-1:1992 Electronic imaging - Scanning of office documents - part1:Subcontracting of scanning - Guide to detailed technical instructions for bureaux
  • NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope

Danish Standards Foundation

  • DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
  • DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

European Committee for Standardization (CEN)

  • EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
  • EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
  • EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)

KR-KS

  • KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
  • KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

U.S. Military Regulations and Norms

Spanish Association for Standardization (UNE)

  • UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
  • UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

GSO

  • ISO 17097:2024 3-D human body scan data — Methods for the processing of human body scan data
  • GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
  • GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
  • BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
  • GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
  • GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
  • GSO ISO 16067-1:2013 Photography -- Spatial resolution measurements of electronic scanners for photographic images -- Part 1: Scanners for reflective media
  • BH GSO ISO 16067-1:2016 Photography -- Spatial resolution measurements of electronic scanners for photographic images -- Part 1: Scanners for reflective media
  • OS GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
  • GSO ISO 21550:2013 Photography -- Electronic scanners for photographic images -- Dynamic range measurements
  • OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness

Association of German Mechanical Engineers

  • VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method

BSI

German Institute for Standardization

  • DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
  • DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
  • DIN EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
  • DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022

American Society for Testing and Materials (ASTM)

  • ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

IN-BIS

SE-SIS

  • SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

Institute of Electrical and Electronics Engineers (IEEE)

NEMA - National Electrical Manufacturers Association

  • NEMA NU 2-2012 Performance Measurements of Positron Emission Tomographs
  • NEMA NU 2-2018 Performance Measurements of Positron Emission Tomographs (PET)

Lithuanian Standards Office

  • LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

RU-GOST R

  • GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
  • GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification

DIN

  • DIN EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)