secondary electron scanning

secondary electron scanning, Total:182 items.

The international standard classification for "secondary electron scanning" includes: Chemical analysis , Photographic paper, films and cartridges , Protection against crime , Physics. Chemistry , Textile fibres .

The Chinese standard classification for "secondary electron scanning" includes: Basic standards and general methods , Basic standards and general methods for photosensitive material , Chemical Measurement , Electron optics and other physical optics instrument , Oil shale , Crime judging technology , Artificial lens , Technical management .

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 33838-2017 Microbeam analysis―Scanning electron microscopy―Methods of evaluating image sharpness

Professional Standard - Chemical Industry

HG/T 3640-1999 Photography - Film dimensions - Film for electronic scanner use

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Professional Standard - Machinery

JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

Taiwan Provincial Standard of the People's Republic of China

CNS 14197-1998 Electric linear scanining ultrasonic diagnostic equipment

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Shandong Provincial Standard of the People's Republic of China

DB37/T 2393-2013 Secondary lithium ion battery electrolyte

Group Standards of the People's Republic of China

T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy
T/SAS 0003-2018 Bismuth germanate scintillation crystals for positron emission tomography
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 39867-2021 Bismuth germanate scintillation crystal for positron emission tomography
GB/T 40826-2021 Test method for hand-arranging staple length of dehaired cashmere—Flatbed scanner method

Professional Standard - Military and Civilian Products

WJ 2299-1995 Inductively Coupled Plasma Sequential Scanning Spectrometer Verification Regulations

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

Inner Mongolia Provincial Standard of the People's Republic of China

DB15/T 981-2016 Carded cashmere hand row length test method drawing board electronic scanner method
DB15/T 1341-2018 Specification for calibration of electronic scanner for carded cashmere hand row length chart

Professional Standard - Public Safety Standards

GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry

Professional Standard - Agriculture

SN/T 3807-2014 Determination for purity of phthalic anhydride - Differential scanning calorimetry

工业和信息化部

SJ/T 11601-2016 Information technology-General specification of non-contact type two-dimensional bar code scanner

Professional Standard - Electron

SJ/T 10987-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5435CP magnetic field sweep circuits
SJ/T 11008-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD11235CP line and field sweep circuits

Fujian Provincial Standard of the People's Republic of China

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 7542:1993 Dimensions of photographic film for electronic scanner use
JIS T 1507:1989 Electronic linear scanning ultrasonic diagnostic equipment
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 11312:1993 Photography; film dimensions; film for electronic scanner use
ISO 16067-2:2004 Photography - Electronic scanners for photographic images - Spatial resolution measurements - Part 2: Film scanners
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 16067-1:2003 Photography - Spatial resolution measurements of electronic scanners for photographic images - Part 1: Scanners for reflective media
ISO 21550:2004 Photography - Electronic scanners for photographic images - Dynamic range measurements
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 13083:2015 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes

SCC

AENOR UNE 57083:1974 Paper. Paper tapes, for use in electronic scanning equipment.
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
BS PD IEC/TR 61948-3:2005 Nuclear medicine instrumentation. Routine tests-Positron emission tomographs
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
BS PD IEC/TR 61948-3:2018 Nuclear medicine instrumentation. Routine tests-Positron emission tomographs
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
AWWA QTC97119 Laser Scanning Device for Detecting Cryptosporidium
DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
AENOR UNE-EN ISO 9220:1996 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
DANSK DS/IEC TR 61948-3:2018 Nuclear medicine instrumentation – Routine tests – Part 3: Positron emission tomographs

Korean Agency for Technology and Standards (KATS)

KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS A ISO 16067-2-2005(2020) Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS A ISO 16067-2-2020 Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS A ISO 16067-2:2005 Photography-Electronic scanners for photographic images-Spatial resolution measurement-Part 2:Film scanners
KS A ISO 16067-1:2005 Photography-Spatial resolution measurements of electronic scanners for photographic image-Part 1:Scanners for reflective media
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS A ISO 16067-1-2020 Photography－Spatial resolution measurements of electronic scanners for photographic image－Part 1：Scanners for reflective media
KS A ISO 16067-1-2005(2020) Photography－Spatial resolution measurements of electronic scanners for photographic image－Part 1：Scanners for reflective media
KS A ISO 21550-2020 Photography－Electronic scanners for photographic images－Dynamic range measurements
KS A ISO 21550:2005 Photography－Electronic scanners for photographic images－Dynamic range measurements
KS X ISO/IEC 15780:2013 Information technology－8 mm wide magnetic tape cartridge－Helical scan recording－AIT－1 format
KS A ISO 21550-2005(2020) Photography－Electronic scanners for photographic images－Dynamic range measurements
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS C IEC 61182-10:2013 Printed boards－Electronic data description and transfer－Part 10：Electronic data hierarchy
KS C IEC 61182-10:2003 Printed boards-Electronic data description and transfer-Part 10:Electronic data hierarchy
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS X ISO 12653-1-2022 Electronic imaging－Test target for the black-and-white scanning of office documents－Part 1：Characteristics
KS C IEC 61182-10-2003(2008) Printed boards－Electronic data description and transfer－Part 10：Electronic data hierarchy
KS X ISO 12653-1-2007(2017) Electronic imaging－Test target for the black-and-white scanning of office documents－Part 1：Characteristics
KS X ISO 12653-1-2007(2022) Electronic imaging－Test target for the black-and-white scanning of office documents－Part 1：Characteristics

British Standards Institution (BSI)

BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 16067-1:2003 Photography. Spatial resolution measurements for electronic scanners for photographic images. Scanners for reflective media
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 21550:2004 Photography - Electronic scanners for photographic images - Dynamic range measurements
PD IEC/TR 61948-3:2018 Nuclear medicine instrumentation. Routine tests. Positron emission tomographs
BS ISO 12653-1:2001 Electronic imaging. Test target for the black-and-white scanning of office documents. Characteristics
BS ISO 12653-1:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Characteristics
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 12653-2:2001 Electronic imaging. Test target for the black-and-white scanning of office documents. Method of use
BS ISO 13083:2015 Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes

GSO

GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
GSO ISO 21550:2013 Photography -- Electronic scanners for photographic images -- Dynamic range measurements
BH GSO ISO 16067-1:2016 Photography -- Spatial resolution measurements of electronic scanners for photographic images -- Part 1: Scanners for reflective media
GSO ISO 16067-1:2013 Photography -- Spatial resolution measurements of electronic scanners for photographic images -- Part 1: Scanners for reflective media
OS GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
OS GSO ISO 21550:2013 Photography -- Electronic scanners for photographic images -- Dynamic range measurements
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO IEC 61182-10:2014 Printed boards - Electronic data description and transfer - Part 10: Electronic data hierarchy
BH GSO IEC 61182-10:2016 Printed boards - Electronic data description and transfer - Part 10: Electronic data hierarchy

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

Association Francaise de Normalisation

NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF Z42-010-1:1992 Electronic imaging - Scanning of office documents - part1:Subcontracting of scanning - Guide to detailed technical instructions for bureaux
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope

American Society for Testing and Materials (ASTM)

ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

NEMA - National Electrical Manufacturers Association

NEMA NU 2-2012 Performance Measurements of Positron Emission Tomographs
NEMA NU 2-2018 Performance Measurements of Positron Emission Tomographs (PET)

CZ-CSN

CSN 36 7003-1985 Electronic equipment Secondary power supply systems Classification

VDI - Verein Deutscher Ingenieure

VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

Society of Motion Picture and Television Engineers (SMPTE)

SMPTE 293M-2003 Television - 720 X 483 Active Line at 59.94-Hz Progressive Scan Production - Digital Representation
SMPTE 294M-2001 Television 720 X 483 Active Line at 59.94-Hz Progressive Scan Production - Bit-Serial Interfaces
SMPTE EG 25-2003 Telecine Scanning for Film Transfer to Television

IN-BIS

IS 9782-1981 Specification for television scan generators

PT-IPQ

NP 3081-1985 Electronic component. Semiconductor chip inspection in microelectronics scanning, basic specifications

SE-SIS

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

RU-GOST R

GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
GOST R 56109-2014 Medical electrical equipment. Positron emission tomographs together with X-ray equipment for computed tomography. Technical requirements for governmental purchases
GOST R 56108-2014 Medical electrical equipment. Positron emission tomograph. Technical requirements for governmental purchases
GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration

Danish Standards Foundation

DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

German Institute for Standardization

DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022

European Committee for Standardization (CEN)

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

Spanish Association for Standardization (UNE)

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

US-FCR

FCR 21 CFR PART 212-2014 CURRENT GOOD MANUFACTURING PRACTICE FOR POSITRON EMISSION TOMOGRAPHY DRUGS
FCR 21 CFR PART 212-2013 CURRENT GOOD MANUFACTURING PRACTICE FOR POSITRON EMISSION TOMOGRAPHY DRUGS
FCR 21 CFR PART 212-2015 CURRENT GOOD MANUFACTURING PRACTICE FOR POSITRON EMISSION TOMOGRAPHY DRUGS

International Electrotechnical Commission (IEC)

IEC 61182-10:1999 Printed boards - Electronic data description and transfer - Part 10: Electronic data hierarchy

Lithuanian Standards Office

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

DIN

DIN EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

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