Sign In |Help & Support
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)

electronic scanning equipment

electronic scanning equipment, Total:43 items.

The international standard classification for "electronic scanning equipment" includes: Chemical analysis , Photographic paper, films and cartridges .

The Chinese standard classification for "electronic scanning equipment" includes: Basic standards and general methods , Basic standards and general methods for photosensitive material , Electron optics and other physical optics instrument , Chemical Measurement .


中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Professional Standard - Chemical Industry

  • HG/T 3640-1999 Photography - Film dimensions - Film for electronic scanner use

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1731-2018 Calibration Specification for Ultrasonic C Scan Equipments
  • JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Machinery

National Metrological Verification Regulations of the People's Republic of China

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary

Professional Standard - Education

  • JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

SCC

  • AENOR UNE 57083:1974 Paper. Paper tapes, for use in electronic scanning equipment.
  • AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
  • BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary

Japanese Industrial Standards Committee (JISC)

RU-GOST R

  • GOST R 56109-2014 Medical electrical equipment. Positron emission tomographs together with X-ray equipment for computed tomography. Technical requirements for governmental purchases
  • GOST R 56108-2014 Medical electrical equipment. Positron emission tomograph. Technical requirements for governmental purchases
  • GOST R 56123-2014 Medical electrical equipment. Single photon emission computed tomographs. Technical requirements for governmental purchases

GSO

International Organization for Standardization (ISO)

  • ISO/IEC 17991:2021 Information technology -- Office equipment -- Method for measuring scanning productivity of digital scanning devices
  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
  • ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary

Korean Agency for Technology and Standards (KATS)

British Standards Institution (BSI)

  • BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
  • BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
  • 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

KR-KS

Association Francaise de Normalisation

  • NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.

American Society for Testing and Materials (ASTM)

  • ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope