Scanning Electron Spectroscopy

Scanning Electron Spectroscopy, Total:80 items.

The international standard classification for "Scanning Electron Spectroscopy" includes: Protection against crime , Other standards related to analytical chemistry , Optical equipment , Chemical analysis , Photographic paper, films and cartridges .

The Chinese standard classification for "Scanning Electron Spectroscopy" includes: Crime judging technology , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Basic standards and general methods , Basic standards and general methods for photosensitive material , Chemical Measurement .

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
GB/T 32869-2016 Nanotechnologies-Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences - Part 6:Scanning electron microscope/ X ray energy dispersive spectrometry
GB/T 17361-2013 Microbeam analysis—Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM and XEDS
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary

Professional Standard - Public Safety Standards

GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
GA/T 909-2010 Collecting and packaging method for trace evidence—Gunshot residue(SEM/EDS examination)
GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1418-2017 Analysis of elements in glass evidence in Forensics—Scanning electron microscope/energy dispersive X-ray spectrometry(SEM/EDX)
GA/T 1520-2018 Forensic science―Examination methods for elements of black powder and flash powder―Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 823.3-2018 Examination methods for paint evidence in Forensics―Part 3:Scanning electron microscope/energy dispersive X-ray analysis(SEM/EDX)

Fujian Provincial Standard of the People's Republic of China

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1215-2013 Characterization of Single-Walled Carbon Nanotubes Using Scanning Electron Microscopy and Energy Spectroscopy
DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy

Professional Standard - Machinery

JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer
JB/T 6842-1993 Test Method of Scanning Electron Microscope

Group Standards of the People's Republic of China

T/GAIA 017-2022 Determination of fluorine content in the surface coating of aluminum and aluminum alloys— Scanning electron microscope and energy dispersive spectrometer method
T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method
T/CMAIA 002-2023 3D intelligent skin scanner
T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope

Professional Standard - Military and Civilian Products

WJ 2299-1995 Inductively Coupled Plasma Sequential Scanning Spectrometer Verification Regulations

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Professional Standard - Chemical Industry

HG/T 3640-1999 Photography - Film dimensions - Film for electronic scanner use

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
JJF 1712-2018 Calibration Specification for Thin Layer Chromatography Scanners

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

Taiwan Provincial Standard of the People's Republic of China

CNS 14197-1998 Electric linear scanining ultrasonic diagnostic equipment

NEMA - National Electrical Manufacturers Association

NEMA NU 2-2012 Performance Measurements of Positron Emission Tomographs
NEMA NU 2-2018 Performance Measurements of Positron Emission Tomographs (PET)

American Society for Testing and Materials (ASTM)

ASTM E1683-02(2014)e1 Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1683-02(2022) Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 7542:1993 Dimensions of photographic film for electronic scanner use
JIS T 1507:1989 Electronic linear scanning ultrasonic diagnostic equipment

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO 11312:1993 Photography; film dimensions; film for electronic scanner use

SCC

AENOR UNE 57083:1974 Paper. Paper tapes, for use in electronic scanning equipment.
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary

Korean Agency for Technology and Standards (KATS)

KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS A ISO 16067-2-2005(2020) Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary

British Standards Institution (BSI)

BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

GSO

GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

GOSTR

PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry

Association Francaise de Normalisation

NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.

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