SEM Testing International
SEM Testing International, Total:174 items.
The international standard classification for "SEM Testing International" includes: Chemical analysis , Linear and angular measurements in general , Metallic coatings , Optical equipment , Other standards related to analytical chemistry , Linear and angular measurements , Man-made fibres , Other standards related to optics and optical measurements , Other methods of testing of metals , Protection against crime .
The Chinese standard classification for "SEM Testing International" includes: Electron optics and other physical optics instrument , Material Protection , Chemical Measurement , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Chemical fibre in general , Optical Measurement , Magnifier and microscope , Oil shale , Metallographic testing method , Crime judging technology .
Professional Standard - Machinery
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 7503-1994 Thickness of Cross Section of Metal Coatings Scanning Electron Microscope Measuring Method
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Group Standards of the People's Republic of China
- T/NLIA 004-2021 In-situ SEM tensile test method for additive manufactured aluminum alloy
- T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
- T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method
- T/GAIA 017-2022 Determination of fluorine content in the surface coating of aluminum and aluminum alloys— Scanning electron microscope and energy dispersive spectrometer method
- T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
- T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy
- T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
- GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
- GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
- GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
- GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
- GB/T 30834-2014 Standard test methods for rating and classifying inclusions in steel―Scanning Electron Microscope
- GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
- GB/T 36422-2018 Man-made fiber—Test method for micro morphology and diameter—Scanning electron microscope method
- GB/T 30834-2022 Rating and classifying of inclusions in steel—Scanning electron microscope method
- GB/T 16594-1996 Micron grade lenght measurement by SEM
- GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
- GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
- GB/T 17722-1999 Gold-plated thickness measurement by SEM
Military Standard of the People's Republic of China-General Armament Department
- GJB 737.11-1993 Test methods for pyrotechnic chemicals Particle size determination Scanning electron microscopy
Professional Standard - Commodity Inspection
- SN/T 3009-2011 Identification of Seawater Corrosion on Metallic Surface by SEM
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films
- DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms
Professional Standard - Education
- JY/T 010-1996 General rules for analytical scanning electron microscopy
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB 5891.6-2006 Test method of loading material for initiating explosive device Part 6: Measurement of grain size Scanning electron microscopy
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
国家能源局
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
Professional Standard - Petroleum
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
- SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 38783-2020 Method of coating thickness determination for precious metalcomposites by scanning electron microscope
- GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
工业和信息化部
- YS/T 1491-2021 Method for determination of sphericity of nickel-based high-temperature alloy powder by scanning electron microscopy
- SJ/T 11759-2020 Test method for determining the aspect ratio of solar cell's grid line electrode-confocal laser scanning microscope
Professional Standard - Judicatory
- SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry
Guangdong Provincial Standard of the People's Republic of China
- DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method
Fujian Provincial Standard of the People's Republic of China
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 20685:2010 3-D scanning methodologies for internationally compatible anthropometric databases
- ISO 20685:2005 3-D scanning methodologies for internationally compatible anthropometric databases
- ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
- ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 20685-1:2018 3-D scanning methodologies for internationally compatible anthropometric databases — Part 1: Evaluation protocol for body dimensions extracted from 3-D body scans
- ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
Gosstandart of Russia
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
- GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
- GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
- GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification
- GOST R 8.630-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Methods for verification
- GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
- GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R ISO 20685-2013 Ergonomics. 3-D scanning methodologies for internationally compatible anthropometric databases
- GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
Korean Agency for Technology and Standards (KATS)
- KS I 0051-1999 General rules for scanning electron microscopy
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2019 General rules for scanning electron microscopy
- KS D ISO 22493-2012(2017) Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS D ISO 9220:2009 Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
- KS D ISO 9220-2022 Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
- KS D ISO 9220-2009(2022) Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
- KS D ISO 9220-2009(2017) Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
- KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope
- KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
- KS D ISO 16700:2013 Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
British Standards Institution (BSI)
- BS EN ISO 20685:2005 3-D scanning methodologies for internationally compatible anthropomteric databases
- BS EN ISO 20685:2010 3-D scanning methodologies for internationally compatible anthropometric databases
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- BS EN ISO 20685-1:2018 3-D scanning methodologies for internationally compatible anthropometric databases. Evaluation protocol for body dimensions extracted from 3-D body scans
- BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- 21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
Bureau of Indian Standards
- IS 17030-2018 3-D Scanning Methodologies for Internationally Compatible Anthropometric Databases
- IS 17030-1-2024 3-D Scanning Methodologies for Internationally Compatible Anthropometric Databases - Part 1 Evaluation Protocol for Body Dimensions Extracted from 3-D Body Scans
Danish Standards Foundation
- DANSK DS/EN ISO 20685:2010 3-D scanning methodologies for internationally compatible anthropometric databases
- DS/EN ISO 20685:2010 3-D scanning methodologies for internationally compatible anthropometric databases
- DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
- DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
- DANSK DS/EN ISO 20685-1:2018 3-D scanning methodologies for internationally compatible anthropometric databases – Part 1: Evaluation protocol for body dimensions extracted from 3-D body scans (ISO 20685-1:2018)
CEN - European Committee for Standardization
- EN ISO 20685:2005 3-D scanning methodologies for internationally compatible anthropometric databases
- EN ISO 20685-1:2018 3-D scanning methodologies for internationally compatible anthropometric databases - Part 1: Evaluation protocol for body dimensions extracted from 3-D body scans
European Committee for Standardization (CEN)
- EN ISO 20685:2010 3-D scanning methodologies for internationally compatible anthropometric databases (ISO 20685:2010)
- EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
- prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
- EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
Association of German Mechanical Engineers
- VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method
- VDI VDE 2656 Blatt 1-2019 Determination of geometrical quantities by using of scanning probe microscopes
SCC
- VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- AENOR UNE-EN ISO 9220:1996 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
Association Francaise de Normalisation
- NF X35-012:2010 3-D scanning methodologies for internationally compatible anthropometric databases.
- NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
- NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- NF X35-012-1*NF EN ISO 20685-1:2018 3-D scanning methodologies for internationally compatible anthropometric databases - Part 1 : evaluation protocol for body dimensions extracted from 3-D body scans
Lithuanian Standards Office
- LST EN ISO 20685:2010 3-D scanning methodologies for internationally compatible anthropometric databases (ISO 20685:2010)
- LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
GSO
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
- GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
- OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
- BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
Standards Norway
- NS-EN ISO 20685:2010 3-D scanning methodologies for internationally compatible anthropometric databases (ISO 20685:2010)
- NS-EN ISO 20685:2005 3-D scanning methodologies for internationally compatible anthropometric databases (ISO 20685:2005)
- NS-EN ISO 9220:1994 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method (ISO 9220:1988)
- NS-EN ISO 20685-1:2018 3-D scanning methodologies for internationally compatible anthropometric databases - Part 1: Evaluation protocol for body dimensions extracted from 3-D body scans (ISO 20685-1:2018)
Spanish Association for Standardization (UNE)
- UNE-EN ISO 20685:2006 3-D scanning methodologies for internationally compatible anthropometric databases (ISO 20685:2005)
- UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- UNE-EN ISO 20685-1:2018 3-D scanning methodologies for internationally compatible anthropometric databases - Part 1: Evaluation protocol for body dimensions extracted from 3-D body scans (ISO 20685-1:2018) (Endorsed by Asociación Española de Normalización in March of 2019.)
- UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
American Water Works Association (AWWA)
- AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
American Society for Testing and Materials (ASTM)
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM B748-90(2001) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
VDI - Verein Deutscher Ingenieure
- VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
- VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method
- VDI 3877 Blatt 1-2009 Indoor air pollution - Measurement of settled dust on surfaces - Scanning electron microscopy method
SE-SIS
- SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
- SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
German Institute for Standardization
- DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
- DIN EN ISO 20685 E:2010 Draft Document - 3-D scanning methodologies for internationally compatible anthropometric databases (ISO/FDIS 20685:2010); German version FprEN ISO 20685:2010
- DIN EN ISO 20685-1:2019-03 3-D scanning methodologies for internationally compatible anthropometric databases - Part 1: Evaluation protocol for body dimensions extracted from 3-D body scans (ISO 20685-1:2018); German version EN ISO 20685-1:2018
- DIN EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
- DIN EN ISO 20685-1 E:2017-06 3-D Scanning Methods for Internationally Compatible Anthropometric Databases Part 1: Protocol for the Assessment of Body Dimensions Extracted from 3-D Body Scans (Draft)
Semiconductor Equipment and Materials International (SEMI)
- SEMI F73-0309-2009 TEST METHOD FOR SCANNING ELECTRON MICROSCOPY (SEM) EVALUATION OF WETTED SURFACE CONDITION OF STAINLESS STEEL COMPONENTS
Alliance of Telecommunications Industry Solutions (ATIS)
- ATIS 0300102-2011 Scanner Testing Results per ATIS-0300085, BCSC Test Specification for Product Label Scanning
ATIS - Alliance for Telecommunications Industry Solutions
- 0300102-2011 Scanner Testing Results per ATIS-0300085@ BCSC Test Specification for Product Label Scanning
AT-ON
- OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
International Telecommunication Union (ITU)
- ITU-R SM.1839 SPANISH-2007 Test procedure for measuring the scanning speed of radio monitoring receivers
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