Electron microscope with 100,000 times magnification
Electron microscope with 100,000 times magnification, Total:34 items.
The international standard classification for "Electron microscope with 100,000 times magnification" includes: Optical equipment , Non-destructive testing .
The Chinese standard classification for "Electron microscope with 100,000 times magnification" includes: Magnifier and microscope , Basic standards and general methods .
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
- GB/T 20968-2007 Non-destructive testing—Aids to visual inspection—Selection of low-power magnifiers
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
Japanese Industrial Standards Committee (JISC)
- JIS B 7254:2007 Microscopes -- Magnification
American Society for Testing and Materials (ASTM)
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E1951-01 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
- ASTM E1951-14(2019) Standard Guide for Calibrating Reticles and Light Microscope Magnifications
- ASTM E1951-02 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
- ASTM E1951-98 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Military Standards (MIL-STD)
- DOD A-A-53545-1988 MAGNIFIER, FOLDING, DOUBLE LENS
Korean Agency for Technology and Standards (KATS)
- KS B ISO 8039-2021 Microscopes — Values, tolerances and symbols for magnification
- KS B ISO 3058-2001(2021) Non-destructive testing－Aids to visual inspection－Selection of low-power magnifiers
- KS B ISO 3058:2001 Non-destructive testing-Aids to visual inspection-Selection of low-power magnifiers
GSO
- OS GSO ISO 8039:2015 Microscopes -- Values, tolerances and symbols for magnification
- GSO ISO 8039:2015 Microscopes -- Values, tolerances and symbols for magnification
- BH GSO ISO 8039:2016 Microscopes -- Values, tolerances and symbols for magnification
British Standards Institution (BSI)
- BS ISO 8039:2014 Microscopes. Values, tolerances and symbols for magnification
- BS ISO 3058:1998 Non-destructive testing - Aids to visual inspection - Selection of low-power magnifiers
- BS ISO 3058:1998(1999) Non - destructive testing — Aids to visual inspection — Selection of low - power magnifiers
SCC
- BS 7012-1:1990 Light microscopes-Specification for the magnifying power of microscope imaging components
- 11/30228188 DC BS ISO 8039. Microscopes. Values, tolerances and symbols for magnification
- MIL MIL-M-21039B-1979 MAGNIFIER, MEASURING TUBE TYPE, SEVEN POWER AR-60( ) (SUPERSEDING MIL-M-21039A)
DIN
- DIN ISO 8039:2001 Optics and optical instruments - Microscopes - Magnification (ISO 8039:1997)
TR-TSE
- TS 2399-1976 NON - DESTRUCTIVE TESTING - A?DS TO VISUAL INSPECTION - SEUECTION OF LOW - POWER MAGNIFIERS
VN-TCVN
- TCVN 5879-2009 Non-destructive testing.Aids to visual inspection.Selection of low-power magnifiers
International Organization for Standardization (ISO)
- ISO 3058:1974 Non-destructive testing; Aids to visual inspection; Selection of low-power magnifiers
- ISO 3058:1998 Non-destructive testing - Aids to visual inspection - Selection of low-power magnifiers
YU-JUS
- JUS C.A7.092-1985 Non destructive testing. Aids to visual inspection. Selection of low-power magnifiers
