The imaging principle of scanning electron microscope

The imaging principle of scanning electron microscope, Total:158 items.

The international standard classification for "The imaging principle of scanning electron microscope" includes: Optical equipment , Document imaging applications , Linear and angular measurements in general , Other standards related to analytical chemistry , Linear and angular measurements , Metallic coatings , Measuring instruments , Protection against crime , Other methods of testing of metals , Man-made fibres , Ophthalmic equipment , Chemical analysis , Diagnostic equipment .

The Chinese standard classification for "The imaging principle of scanning electron microscope" includes: Crime judging technology , Magnifier and microscope , Library, Archives, Literature and Information , Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Material Protection , Physics and Mechanics , Metallographic testing method , Chemical fibre in general , Technical management , Chemical Measurement , Medical optical instrument and endoscope , Basic standards and general methods , Medical apparatus and devices in general .

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method
DB44/T 1833-2016 Electronic imaging office document scanning test target low resolution test target

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
GB/T 20493.3-2018 Electronic imaging—Test target for scanning of office documents—Part 3:Test target for use in lower resolution applications

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 16594-1996 Micron grade lenght measurement by SEM
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences―Part 6:Scanning electron microscopy
GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
GB/T 43845-2024 A weak static magnetic field imaging method based on scanning nitrogen-vacancy probe
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
GB/T 20493.1-2006 Electronic imaging - Test targetfor the black-and-white scanning of office documents - Part 1: Characteristics
GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
GB/T 20493.2-2006 Electronic imaging - Test targetfor the black-and-white scanning of office documents - Part 2: Method of use
GB/T 30834-2014 Standard test methods for rating and classifying inclusions in steel―Scanning Electron Microscope
GB/T 36422-2018 Man-made fiber—Test method for micro morphology and diameter—Scanning electron microscope method
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/T 43661-2024 Surface chemical analysis—Scanning probe microscopy—Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
GB/T 17722-1999 Gold-plated thickness measurement by SEM
GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
GB/T 30834-2022 Rating and classifying of inclusions in steel—Scanning electron microscope method

Group Standards of the People's Republic of China

T/NLIA 004-2021 In-situ SEM tensile test method for additive manufactured aluminum alloy
T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device

Professional Standard - Electron

SJ/T 11006-1996 Semiconductor TV integrated circuits - General principles of measuring methods for horizontal and vertical sweep circuits

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
NB/T 10122-2018 Shale scanning and imagination method using X-ray computed tomography

Professional Standard - Commodity Inspection

SN/T 3009-2011 Identification of Seawater Corrosion on Metallic Surface by SEM
SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Professional Standard - Machinery

JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 6842-1993 Test Method of Scanning Electron Microscope

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Professional Standard - Medicine

YY/T 1895-2023 Intravascular optical coherence tomograph

Professional Standard - Public Safety Standards

GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1418-2017 Analysis of elements in glass evidence in Forensics—Scanning electron microscope/energy dispersive X-ray spectrometry(SEM/EDX)

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33806-2017 Technical requirement of area fluorescent imaging microarray scanner
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Inner Mongolia Provincial Standard of the People's Republic of China

DB15/T 3564-2024 Quantitative analysis of cashmere, sheep wool and their mixtures, scanning electron microscope fine-grained image recognition method

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

Professional Standard - Petroleum

SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

British Standards Institution (BSI)

18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 16067-1:2003 Photography. Spatial resolution measurements for electronic scanners for photographic images. Scanners for reflective media
BS ISO 12653-1:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Characteristics
BS ISO 12653-1:2001 Electronic imaging. Test target for the black-and-white scanning of office documents. Characteristics
BS ISO 12653-2:2001 Electronic imaging. Test target for the black-and-white scanning of office documents. Method of use
BS ISO 12653-2:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Method of use
BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
BS EN ISO 11357-1:2016 Plastics. Differential scanning calorimetry (DSC). General principles
BS EN ISO 11357-1:1997 Plastics - Differential scanning calorimetry (DSC) - General principles
BS EN ISO 11357-1:2009 Plastics - Differential scanning calorimetry (DSC) - General principles
BS ISO 11698-1:2001 Micrographics - Methods of measuring image quality produced by aperture card scanners - Characteristics of the test images
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS EN IEC 61675-1:2022 Radionuclide imaging devices. Characteristics and test conditions. Positron emission tomographs
BS ISO 17097:2024 3-D human body scan data. Methods for the processing of human body scan data

Association Francaise de Normalisation

NF Z42-010-2:1993 Electronic imaging - Scanning of office documents - Part2:Acquisition of electronic imaging management systems - Guidelines for a request for proposals
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.

American Society for Testing and Materials (ASTM)

ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E1441-11 Standard Guide for Computed Tomography (CT) Imaging
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16067-1:2003 Photography - Spatial resolution measurements of electronic scanners for photographic images - Part 1: Scanners for reflective media
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 14535:2001 Photography - Room-light loading packages for electronic scanners and image-setting film and paper rolls - Dimensions and related requirements
ISO 12653-1:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Part 1: Characteristics
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 12653-2:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Part 2: Method of use

GSO

OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
GSO ISO 16067-1:2013 Photography -- Spatial resolution measurements of electronic scanners for photographic images -- Part 1: Scanners for reflective media
BH GSO ISO 16067-1:2016 Photography -- Spatial resolution measurements of electronic scanners for photographic images -- Part 1: Scanners for reflective media
OS GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
OS GSO ISO 21550:2013 Photography -- Electronic scanners for photographic images -- Dynamic range measurements

Korean Agency for Technology and Standards (KATS)

KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS X ISO 12653-1-2022 Electronic imaging－Test target for the black-and-white scanning of office documents－Part 1：Characteristics
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS X ISO 12653-1-2007(2017) Electronic imaging－Test target for the black-and-white scanning of office documents－Part 1：Characteristics
KS X ISO 12653-1-2007(2022) Electronic imaging－Test target for the black-and-white scanning of office documents－Part 1：Characteristics
KS X ISO 12653-2-2022 Electronic imaging－Test target for the black-and-white scanning of office documents－Part 2：Method of use
KS X ISO 12653-1:2007 Electronic imaging-Test target for the black-and-white scanning of office documents-Part 1:Characteristics
KS A ISO 16067-2:2005 Photography-Electronic scanners for photographic images-Spatial resolution measurement-Part 2:Film scanners
KS A ISO 16067-1:2005 Photography-Spatial resolution measurements of electronic scanners for photographic image-Part 1:Scanners for reflective media
KS X ISO 12653-2-2007(2017) Electronic imaging－Test target for the black-and-white scanning of office documents－Part 2：Method of use
KS X ISO 12653-2-2007(2022) Electronic imaging－Test target for the black-and-white scanning of office documents－Part 2：Method of use
KS A ISO 16067-2-2020 Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS A ISO 16067-1-2020 Photography－Spatial resolution measurements of electronic scanners for photographic image－Part 1：Scanners for reflective media
KS X ISO 12653-2:2007 Electronic imaging-Test target for the black-and-white scanning of office documents-Part 2:Method of use
KS A ISO 16067-1-2005(2020) Photography－Spatial resolution measurements of electronic scanners for photographic image－Part 1：Scanners for reflective media

KR-KS

KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

SCC

13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
VDI/VDE 2634 BLATT 2-2012 Optical 3-D measuring systems — imaging systems with area probing
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
AWWA QTC98270 Count Matching In-situ Particle Counts to Scanning Electron Microscopic Counts for Treatment Facility Process Control
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

VDI - Verein Deutscher Ingenieure

VDI/VDE 2634 Blatt 2-2011 Optical 3-D measuring systems - Optical systems based on area scanning
VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

Association of German Mechanical Engineers

VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method

Society of Motion Picture and Television Engineers (SMPTE)

SMPTE 26M-1995 Video Recording - 1-in Helical-Scan Recorders - Raw Stock for Reference Tapes
SMPTE ST 26M-1995 Video Recording - 1-in Helical-Scan Recorders - Raw Stock for Reference Tapes
SMPTE 96M-2004 Television - 35- and 16-mm Motion-Picture Film - Scanned Image Area
SMPTE RP 199-2004 Mapping of Pictures in Wide-Screen (16:9) Scanning Structure to Retain Original Aspect Ratio of the Work

South African Bureau of Standard

SANS 12653-1:2006 Electronic imaging - Test target for the black-and-white scanning of office documents Part 1: Characteristics
SANS 12653-2:2006 Electronic imaging - Test target for the black-and-white scanning of office documents Part 2: Method of use

SE-SIS

SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

RU-GOST R

GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes

Danish Standards Foundation

DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

German Institute for Standardization

DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022

Others: Principles of UV Imaging