dual beam SEM
dual beam SEM, Total:61 items.
The international standard classification for "dual beam SEM" includes: Chemical analysis , Optical equipment , Other standards related to analytical chemistry .
The Chinese standard classification for "dual beam SEM" includes: Basic standards and general methods , Magnifier and microscope , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Chemical Measurement .
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
Guangdong Provincial Standard of the People's Republic of China
- DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
- GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
- GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
- GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary
Professional Standard - Commodity Inspection
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
National Metrological Verification Regulations of the People's Republic of China
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
Group Standards of the People's Republic of China
- T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
Military Standard of the People's Republic of China-General Armament Department
- GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
- GJB 2666-1996 Specification for scanning reflective beryllium mirrors
Professional Standard - Education
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
SCC
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- 08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
GSO
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
- OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
KR-KS
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
Korean Agency for Technology and Standards (KATS)
- KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
- KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
- KS I 0051-2019 General rules for scanning electron microscopy
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-1999 General rules for scanning electron microscopy
British Standards Institution (BSI)
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
- BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
American Society for Testing and Materials (ASTM)
- ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
Association Francaise de Normalisation
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
Japanese Industrial Standards Committee (JISC)
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
- JIS K 0132:1997 General rules for scanning electron microscopy
dual beam SEM,Dual Beam Scanning Electron Microscope,Automatic Dual Beam Spectrometer,double beam diffraction,double bundle yarn,double bundle of yarn,double bundle condition,TEM Double Beam Diffraction,double beam,double beam electron microscope,double beam electron microscope,dual beam analysis,Electron Double Beam Microscopy,TEM Double Beam Diffraction,Dual Beam Photometer,double beam microscope,double beam microscope,electron diffraction double beam,How to analyze the diffraction double beam,double beam electron microscope
