Dual Beam Scanning Electron Microscope
Dual Beam Scanning Electron Microscope, Total:64 items.
The international standard classification for "Dual Beam Scanning Electron Microscope" includes: Chemical analysis .
The Chinese standard classification for "Dual Beam Scanning Electron Microscope" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Chemical Measurement .
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
National Metrological Verification Regulations of the People's Republic of China
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
Professional Standard - Machinery
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
Professional Standard - Education
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
- JY/T 010-1996 General rules for analytical scanning electron microscopy
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
国家能源局
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
Professional Standard - Petroleum
- SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
SCC
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- 08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
GSO
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
- OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
Korean Agency for Technology and Standards (KATS)
- KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
- KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
- KS I 0051-2019 General rules for scanning electron microscopy
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-1999 General rules for scanning electron microscopy
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KR-KS
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
British Standards Institution (BSI)
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
Association Francaise de Normalisation
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
American Society for Testing and Materials (ASTM)
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
Central Dual Beam Scanning Electron Microscope,dual beam SEM,Dual Beam Scanning Electron Microscope,Transmission Electron Microscopy Double Beam Diffraction,double beam electron microscope
