Electron Double Beam Microscopy

Electron Double Beam Microscopy, Total:106 items.

The international standard classification for "Electron Double Beam Microscopy" includes: Chemical analysis , Physicochemical methods of analysis , Chemical technology (Vocabularies) , Optical equipment .

The Chinese standard classification for "Electron Double Beam Microscopy" includes: Basic standards and general methods , Electron optics and other physical optics instrument .

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB 7667-1996 The dose of X-rays leakage from electron microscope
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary
GB/T 21636-2008 Microbeam analysis - Electron Probe Micro Analysis (EPMA) - Vocabulary
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41398-2022 Microscopes一Minimum requirements for binocular tubes
GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary
GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary

Professional Standard - Machinery

JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 5480-1991 Diaphragm of Electron Microscope

Professional Standard - Education

JY/T 011-1996 General rules for transmission electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy

Group Standards of the People's Republic of China

T/CSTM 00162-2020 Calibration methods for transmission electron microscope

SCC

BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness

Korean Agency for Technology and Standards (KATS)

KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B 5613-1996 SINGLE OBJECTIVE BINOCULAR MICROSCOPES
KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
KS B 5614-2023 Binocular stereo microscopes
KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis

GSO

OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 19055:2017 Microscopes -- Minimum requirements for binocular tubes

Association Francaise de Normalisation

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF X21-016*NF ISO 15932:2014 Microbeam analysis - Analytical electron microscopy - Vocabulary
NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.

British Standards Institution (BSI)

BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)

American Society for Testing and Materials (ASTM)

ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization

Japanese Industrial Standards Committee (JISC)

JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method

Defense Logistics Agency

DLA MIL-M-37869-1978 MICROSCOPE, OPTICAL, BINOCULAR

Military Standards (MIL-STD)

DOD A-A-50852 A-1985 MICROSCOPE, OPTICAL, BINOCULAR
DOD A-A-51796 A-1991 MICROSCOPE, OPTICAL (BINOCULAR)

IN-BIS

IS 8275-1976 Specification for binocular eyepieces for microscopes

Others: Central Dual Beam Scanning Electron Microscope,Dual Beam Scanning Electron Microscope,Microbeam Analysis Analysis Electron Microscopy Transmission Electron Microscopy Selected Area Electron Diffraction Analysis Method,Transmission Electron Microscopy Double Beam Diffraction,double beam electron microscope,Electron Double Beam Microscopy