double beam microscope

double beam microscope, Total:31 items.

The international standard classification for "double beam microscope" includes: Optical equipment .

The Chinese standard classification for "double beam microscope" includes: .

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41398-2022 Microscopes一Minimum requirements for binocular tubes

American Society for Testing and Materials (ASTM)

ASTM B651-83(2001) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with the Double-Beam Interference Microscope
ASTM B651-83(2015) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope
ASTM B651-83(1995) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with the Double-Beam Interference Microscope
ASTM B651-83(2006) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope
ASTM B651-83(2010) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope
ASTM B588-88(2001) Standard Test Method for Measurement of Thickness of Transparent or Opaque Coatings by Double-Beam Interference Microscope Technique
ASTM B651-83(2024) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope
ASTM B651-83(2019) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope

Korean Agency for Technology and Standards (KATS)

KS B 5613-1996 SINGLE OBJECTIVE BINOCULAR MICROSCOPES
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary

Defense Logistics Agency

DLA MIL-M-37869-1978 MICROSCOPE, OPTICAL, BINOCULAR

KR-KS

KS B 5614-2023 Binocular stereo microscopes
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

IN-BIS

IS 8275-1976 Specification for binocular eyepieces for microscopes

Military Standards (MIL-STD)

DOD A-A-50852 A-1985 MICROSCOPE, OPTICAL, BINOCULAR
DOD A-A-51796 A-1991 MICROSCOPE, OPTICAL (BINOCULAR)

SCC

BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary

Association Francaise de Normalisation

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire

GSO

BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
OS GSO ISO 19055:2017 Microscopes -- Minimum requirements for binocular tubes
GSO ISO 19055:2017 Microscopes -- Minimum requirements for binocular tubes

International Organization for Standardization (ISO)

ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)