double beam electron microscope

double beam electron microscope, Total:140 items.

The international standard classification for "double beam electron microscope" includes: Optical equipment , Physicochemical methods of analysis , Other standards related to analytical chemistry , Analytical chemistry in general , Navigation and control equipment , Chemical analysis .

The Chinese standard classification for "double beam electron microscope" includes: Office supplies and office implements , Telescope, geodetic survey and aerial survey instrumentation , Magnifier and microscope , Basic standards and general methods , Observation equipment for vessel , Electrochemical, thermochemistry and optical profile type analyzer .

Professional Standard - Education

JY 0301-1991 Bi-Prism

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 26813-2011 Double beam UV/VIS spectrophotometer
GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
GB/T 17117-1997 Prism binoculars
GB/T 44403-2024 Optics and photonics—Telescopic system—General terms and terms for binoculars, monoculars,spotting scopes and telescopic sights
GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
GB/T 17118-1997 Galilean binoculars
GB/T 17117-2008 Binoculars
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 18735-2014 Microbeam analysis-General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope(AEM/EDS)
GB 8842-1988 Specification of prism binoculars on shipboard
GB/T 18312-2015 Inspection rule for binoculars
GB/T 18312-2001 The inspection rule for binoculars

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
GB/T 41398-2022 Microscopes一Minimum requirements for binocular tubes

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

Professional Standard-Ships

CB/T 1176-1999 Specification of prism binoculars on shipboard

未注明发布机构

JIS B 7121:2024 Optics and photonics -- Specifications for binoculars, monoculars and spotting scopes

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Group Standards of the People's Republic of China

T/STIC 110086-2023 Double Beam UV-VIS Spectrophotometer

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B 5614-2023 Binocular stereo microscopes
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

Korean Agency for Technology and Standards (KATS)

KS B 5607-2020 Prism binoculars
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B 5613-1996 SINGLE OBJECTIVE BINOCULAR MICROSCOPES
KS B 5607-2015(2020) Prism binoculars
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B 5606-2020 Galilean binoculars
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B 5606-2015(2020) Galilean binoculars

SCC

BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
MIL MIL-E-49383-1980 EYEPIECE, BINOCULAR, AN/VSG-2
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
MIL MIL-B-60884C-1974 BINOCULAR M19 (SUPERSEDING MIL-B-60884B)
MIL MIL-B-52371A-1971 BINOCULARS, ELECTRONIC AN/PAS-5 (NO S/S DOCUMENT) (SUPERSEDING MIL-B-52371)

Association Francaise de Normalisation

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness

GSO

BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 19055:2017 Microscopes -- Minimum requirements for binocular tubes
GSO ISO 19055:2017 Microscopes -- Minimum requirements for binocular tubes
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness

Japanese Industrial Standards Committee (JISC)

JIS B 7121:1993 Prism binoculars
JIS B 7121-2007 AMD 1:2013 Prism binoculars
JIS B 7122:1993 Galilean binoculars
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS Z 0704:1978 Packaging and packing of binoculars for export
JIS B 7121 AMD 1:2013 Optics and optical instruments.Specifications for binoculars, monoculars and spotting scopes(Amendment 1)
JIS B 7121:2007 Optics and optical instruments -- Specifications for binoculars, monoculars and spotting scopes

American Society for Testing and Materials (ASTM)

ASTM B651-83(2001) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with the Double-Beam Interference Microscope
ASTM B651-83(2015) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope
ASTM B651-83(1995) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with the Double-Beam Interference Microscope
ASTM B651-83(2006) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope
ASTM B651-83(2010) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM B651-83(2019) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope
ASTM B651-83(2024) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope
ASTM B588-88(2001) Standard Test Method for Measurement of Thickness of Transparent or Opaque Coatings by Double-Beam Interference Microscope Technique
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization

International Organization for Standardization (ISO)

ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 19055:2015 Microscopes - Minimum requirements for binocular tubes

HU-MSZT

MSZ 5628-1957 Bifocal spectacle lens semi-products
MSZ 5629-1959 Spherical two-part finished spectacle lenses
MNOSZ 15593-1953 Surveying measurement tools. biprism

IN-BIS

IS 8275-1976 Specification for binocular eyepieces for microscopes
IS 3113-1965 Specification for universal prism binoculars

U.S. Military Regulations and Norms

ARMY MIL-B-60884 C-1974 BINOCULAR M19
ARMY MIL-B-60884 C NOTICE 1-1996 BINOCULAR M19
ARMY MIL-B-60884 C (2)-1979 BINOCULAR M19
ARMY MIL-B-60884 C VALID NOTICE 2-2013 Binocular M19
ARMY MIL-C-13459 B-1971 CASE, BINOCULAR, M62A1 AND M64A1
ARMY MIL-E-49383 VALID NOTICE 1-1986 EYEPIECE, BINOCULAR, AN/VSG-2
ARMY MIL-E-49383-1980 EYEPIECE, BINOCULAR, AN/VSG-2
ARMY MIL-C-13459 B NOTICE 1-1996 CASE, BINOCULAR, M62A1 AND M64A1
ARMY MIL-E-49383 NOTICE 2-1998 EYEPIECE, BINOCULAR, AN/VSG-2

PL-PKN

PN Z53092-1972 Bifocal ophtalmic lenses

British Standards Institution (BSI)

BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS ISO 19055:2015 Microscopes. Minimum requirements for binocular tubes
18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
BS ISO 14132-2:2015 Optics and photonics. Vocabulary for telescopic systems - Terms for binoculars, monoculars and spotting scopes
BS EN 14086:2003 Paper and board - Measurement of specular gloss - 45 ° gloss with a parallel beam, DIN method

Defense Logistics Agency

DLA MIL-M-37869-1978 MICROSCOPE, OPTICAL, BINOCULAR
DLA MS21954 REV B VALID NOTICE 1-2005 BODY, CLUSTER FITTING, TWO-WAY 90 DEG., FLARE
DLA MS21955 REV B VALID NOTICE 1-2005 BODY, CLUSTER FITTING, TWO WAY 180 DEG., FLARE
DLA MS21955 REV B-2000 BODY, CLUSTER FITTING, TWO WAY 180 DEG., FLARE
DLA MS21954 REV B-2000 BODY, CLUSTER FITTING, TWO-WAY 90 DEG., FLARE
DLA A-A-54474-1991 MICROSCOPE, SURGICAL (CO-OBSERVATION, BINOCULAR)
DLA MS53001 REV A VALID NOTICE 3-2005 SWITCH, BEAM SELECTING, HEADLIGHT-DPDT, NO OFF, 28 VOLT DC
DLA MS53001 REV A-1968 SWITCH, BEAM SELECTING, HEADLIGHT-DPDT, NO OFF, 28 VOLT DC
DLA MS53001 REV A VALID NOTICE 2-2000 SWITCH, BEAM SELECTING, HEADLIGHT-DPDT, NO OFF, 28 VOLT DC
DLA MS21959 REV C-2000 BODY, CLUSTER FITTING, TWO-WAY, 90 DEG., INTERNAL BOSS
DLA MS21958 REV C-2000 BODY, CLUSTER FITTING, TWO-WAY, 180 DEG., INTERNAL BOSS

Military Standards (MIL-STD)

DOD A-A-50852 A-1985 MICROSCOPE, OPTICAL, BINOCULAR
DOD A-A-51796 A-1991 MICROSCOPE, OPTICAL (BINOCULAR)
DOD A-A-53030-1987 OPHTHALMOSCOPE, BINOCULAR, INDIRECT
DOD A-A-53432-1988 TEST SET, BINOCULAR VISION
DOD A-A-53545-1988 MAGNIFIER, FOLDING, DOUBLE LENS

IT-UNI

UNI 5103-1962 Civilian prism binoculars. Characteristics and tests

Indonesia Standards

SNI 13-4710-1998 Identification of ore minerals by reflective beam polarization microscope

Society of Automotive Engineers (SAE)

SAE AS21943-2004 BODY, CLUSTER FITTING, TWO WAY, 90°, FLARELESS
SAE AS21943A-2015 BODY, CLUSTER FITTING, TWO WAY 90°, FLARELESS
SAE AS21944B-2015 BODY, CLUSTER FITTING, TWO WAY, 180°, FLARELESS
SAE AS8568-2006 Binoculars, Prismatic, Hand-Held (for Aeronautical Use) (7 x 50 and 6 x 42 (Wide Field))

German Institute for Standardization

DIN 58381:2021-06 Optics and photonics - Operating elements on telescopes, binoculars and telescopic sights
DIN 58381 E:2021-02 Optics and photonics - Operating elements on telescopes, binoculars and telescopic sights
DIN 58381:2021 Optics and photonics - Operating elements on telescopes, binoculars and telescopic sights