Scanning Electron Microscope Calibration Sheet
Scanning Electron Microscope Calibration Sheet, Total:29 items.
The international standard classification for "Scanning Electron Microscope Calibration Sheet" includes: Optical equipment .
The Chinese standard classification for "Scanning Electron Microscope Calibration Sheet" includes: Magnifier and microscope .
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
- GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
Group Standards of the People's Republic of China
- T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
American Society for Testing and Materials (ASTM)
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
British Standards Institution (BSI)
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
Association Francaise de Normalisation
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
Korean Agency for Technology and Standards (KATS)
- KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
- KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
- KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
International Organization for Standardization (ISO)
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
Japanese Industrial Standards Committee (JISC)
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
- JIS K 0149-1:2019 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
Gosstandart of Russia
- GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
Association of German Mechanical Engineers
- VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
- VDI VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes Calibration of measurement systems
- VDI/VDE 2656 Blatt 1-2006 Bestimmung geometrischer Messgroessen mit Rastersondermikroskopen - Kalibrierung von Messsystemen
German Institute for Standardization
- DIN 58206-3:1977 Calibration test lenses
- DIN 58206-2:1983 Card Prism Calibration Lens Prism
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