Electron Microscope Parameters

Electron Microscope Parameters, Total:119 items.

The international standard classification for "Electron Microscope Parameters" includes: Optical equipment , Linear and angular measurements , Chemical analysis , Ophthalmic equipment .

The Chinese standard classification for "Electron Microscope Parameters" includes: Electron optics and other physical optics instrument , Optical metrological instrument , Magnifier and microscope , Length Measurement , Chemical Measurement , Basic standards and general methods , Medical optical instrument and endoscope .

Professional Standard - Machinery

JB/T 2369-1993 Reading Microscope
JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 8380-1996 Polarizing Microscope Reference System
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 42886-2023 Microscopes—Microscopes with digital imaging displays—Information provided to the user regarding imaging performance
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB/T 43846.2-2024 Microscopes—Designation of microscope objectives—Part 2: Chromatic correction
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 22061-2008 Microscopes - Reference system of polarized light microscopy

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 011-1996 General rules for transmission electron microscopy
JY/T 0581-2020 General analysis rules for transmission electron microscope

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 904-1996 Verification Regulation of Microscope for Reading
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG 571-2004 Verification Regulation of Reading Microscope and Measuring Microscope

Group Standards of the People's Republic of China

T/CSTM 00162-2020 Calibration methods for transmission electron microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Professional Standard - Medicine

YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy

RO-ASRO

STAS 7353/2-1975 MICROSCOPES Basic parameters
STAS 7353/5-1982 MICROSCOPES Basic optical parameters

British Standards Institution (BSI)

BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS ISO 18221:2016 Microscopes. Microscopes with digital imaging displays. Information provided to the user regarding imaging performance
BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 18221:2016 Microscopes - Microscopes with digital imaging displays - Information provided to the user regarding imaging performance
ISO/CD 18221:2023 Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance

American Society for Testing and Materials (ASTM)

ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

GSO

OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 8576:2016 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 8576:2015 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
GSO ISO 18221:2021 Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance
GSO ISO 13366-1:2014 Milk -- Enumeration of somatic cells -- Part 1: Microscopic method (Reference method)
BH GSO ISO 18221:2022 Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS B 7251:2000 Reference system of polarized light microscopy
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method

Korean Agency for Technology and Standards (KATS)

KS B ISO 8576:2006 Optics and optical instruments－Microscopes－Reference system of polarized light microscopy
KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS H ISO 13366-1:2021 Milk — Enumeration of somatic cells —Part 1: Microscopic method(Reference method)

KR-KS

KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

German Institute for Standardization

DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)

Association Francaise de Normalisation

NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)

SCC

BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS 7012-1:1990 Light microscopes-Specification for the magnifying power of microscope imaging components
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components

Military Standards (MIL-STD)

DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC

International Electrotechnical Commission (IEC)

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

Standard Association of Australia （SAA）

ISO 19012-4:2024 Microscopes - Designation of microscope objectives - Part 4: Polarization characteristics

GOST

GOST 8074-1982 Toolmaker's microscopes. Types, main parameters and dimensions. Technical requirements