SEM of particles
SEM of particles, Total:86 items.
The international standard classification for "SEM of particles" includes: Chemical analysis , Other methods of testing of metals , Linear and angular measurements in general , Optical equipment , Linear and angular measurements , Other standards related to analytical chemistry , Metallic coatings .
The Chinese standard classification for "SEM of particles" includes: Basic standards and general methods , Optical Measurement , Synthetic materials in general , Metallographic testing method , Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Material Protection , Chemical Measurement .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
- GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
- GB/T 35097-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrosmetry—Determination of numberical concentration of inorganic fibrous particles in ambient air
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
- GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
- GB/T 43196-2023 Nanotechnologies—Measurements of particle size and shape distributions by scanning electron microscopy
- GB/T 17722-1999 Gold-plated thickness measurement by SEM
- GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effects on topography induced by nanoparticles
- GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
- GB/T 30834-2022 Rating and classifying of inclusions in steel—Scanning electron microscope method
- GB/T 16594-1996 Micron grade lenght measurement by SEM
Military Standard of the People's Republic of China-General Armament Department
- GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
- GJB 2666-1996 Specification for scanning reflective beryllium mirrors
- GJB 737.11-1993 Test methods for pyrotechnic chemicals Particle size determination Scanning electron microscopy
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB 5891.6-2006 Test method of loading material for initiating explosive device Part 6: Measurement of grain size Scanning electron microscopy
Professional Standard - Commodity Inspection
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Group Standards of the People's Republic of China
- T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
- T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
Professional Standard - Education
- JY/T 010-1996 General rules for analytical scanning electron microscopy
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
Gosstandart of Russia
- GOST R ISO 14966-2022 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
Association of German Mechanical Engineers
- VDI 3861 Blatt 2-1994 Messen anorganischer faserfoermiger Partikeln im stroemenden Reingas - Rasterelektronenmikroskopisches Verfahren
- VDI 3861 Blatt 2-1996 Messen anorganischer faserfoermiger Partikeln im stroemenden Reingas - Rasterelektronenmikroskopisches Verfahren
- VDI 3861 Blatt 2-2006 Messen von Emissionen - Messen anorganischer faserfoermiger Partikeln im stroemenden Reingas - Rasterelektronenmikroskopisches Verfahren
- VDI 3861 BLATT 2-2008 Measuring emissions — Measuring inorganic fibrous particles in flowing clean gas — Scanning electron microscopic method
- VDI 3492-2013 Measuring indoor air pollution — Measuring immissions — Measuring inorganic fibrous particles — Scanning electron microscopy method
- VDI 3492-2011 Messen von Innenraumluftverunreinigungen - Messen von Immissionen - Messen anorganischer faserfoermiger Partikeln - Rasterelektronenmikroskopisches Verfahren
- VDI 3861 BLATT 2-2008 Measuring emissions — Measuring inorganic fibrous particles in flowing clean gas — Scanning electron microscopic method
- VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
- VDI 3492-2013 Measuring indoor air pollution — Measuring immissions — Measuring inorganic fibrous particles — Scanning electron microscopy method
- VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method
- VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
European Committee for Standardization (CEN)
- EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
Korean Agency for Technology and Standards (KATS)
- KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-2024 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2019 General rules for scanning electron microscopy
- KS I 0051-1999 General rules for scanning electron microscopy
- KS D ISO 22493-2012(2017) Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS D 2714-2016(2021) Scanning probe microscope-Method for lateral force microscope
British Standards Institution (BSI)
- BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
- BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
- 18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
- 18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
International Organization for Standardization (ISO)
- ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
- ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
- ISO 14966:2002/cor 1:2007 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method; Technical Corrigendum 1
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
Danish Standards Foundation
- DANSK DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
- DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
- DANSK DS/EN ISO 19749:2023 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
GCC Standardization Organization
- BH GSO ISO 19749:2024 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
- OS GSO ISO 19749:2024 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
Spanish Association for Standardization (UNE)
- UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
Ente Nazionale Italiano di Unificazione
- UNI EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
Association Francaise de Normalisation
- NF EN ISO 19749:2023 Nanotechnologies - Determination of particle size and shape distribution by scanning electron microscopy
- NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
Swedish Institute for Standards
- SS-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
German Institute for Standardization
- DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
- DIN EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
American Society for Testing and Materials (ASTM)
- ASTM E2090-06 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-12(2020) Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
Standards Norway
- NS-EN ISO 19749:2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
American Water Works Association (AWWA)
- AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
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