Scanned electronic

Scanned electronic, Total:102 items.

The international standard classification for "Scanned electronic" includes: Chemical analysis , Photographic paper, films and cartridges , Document imaging applications , Protection against crime .

The Chinese standard classification for "Scanned electronic" includes: Electron optics and other physical optics instrument , Basic standards and general methods , Basic standards and general methods for photosensitive material , Chemical Measurement , Library, Archives, Literature and Information , Technical management , Crime judging technology .

Professional Standard - Machinery

JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Professional Standard - Chemical Industry

HG/T 3640-1999 Photography - Film dimensions - Film for electronic scanner use

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 20493.1-2006 Electronic imaging - Test targetfor the black-and-white scanning of office documents - Part 1: Characteristics
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

Taiwan Provincial Standard of the People's Republic of China

CNS 14197-1998 Electric linear scanining ultrasonic diagnostic equipment

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Electron

SJ/T 11087-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7698CP horizontal and vertical sweep and chrominance processing circuits
SJ/T 11008-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD11235CP line and field sweep circuits
SJ/T 10987-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5435CP magnetic field sweep circuits

Professional Standard - Petroleum

SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

Group Standards of the People's Republic of China

T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1833-2016 Electronic imaging office document scanning test target low resolution test target

American Society for Testing and Materials (ASTM)

ASTM F1372-93(2020) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM F1372-93(1999) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 7542:1993 Dimensions of photographic film for electronic scanner use
JIS T 1507:1989 Electronic linear scanning ultrasonic diagnostic equipment

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 11312:1993 Photography; film dimensions; film for electronic scanner use
ISO 16067-2:2004 Photography - Electronic scanners for photographic images - Spatial resolution measurements - Part 2: Film scanners
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 12653-1:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Part 1: Characteristics
ISO 16067-1:2003 Photography - Spatial resolution measurements of electronic scanners for photographic images - Part 1: Scanners for reflective media

British Standards Institution (BSI)

18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 12653-1:2001 Electronic imaging. Test target for the black-and-white scanning of office documents. Characteristics
BS ISO 12653-1:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Characteristics
BS ISO 16067-1:2003 Photography. Spatial resolution measurements for electronic scanners for photographic images. Scanners for reflective media
BS ISO 12653-2:2001 Electronic imaging. Test target for the black-and-white scanning of office documents. Method of use
BS ISO 12653-2:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Method of use
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

SCC

AENOR UNE 57083:1974 Paper. Paper tapes, for use in electronic scanning equipment.
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
MIL MIL-C-81953-1973 CABLE ASSEMBLY, MAGNETIC SWEEP MARK 17 MOD 1
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
MIL MIL-G-49141-1977 GENERATOR, SWEEP 5G-677 ( )/U (NO S/S DOCUMENT)
BS DISC PD 0016:2001 Document scanning. Guide to scanning business documents
BS PD 0016:2001 Document scanning. Guide to scanning business documents
BS PD IEC/TR 61948-3:2005 Nuclear medicine instrumentation. Routine tests-Positron emission tomographs

Korean Agency for Technology and Standards (KATS)

KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS A ISO 16067-2-2005(2020) Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS A ISO 16067-2-2020 Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS A ISO 16067-2:2005 Photography-Electronic scanners for photographic images-Spatial resolution measurement-Part 2:Film scanners
KS X ISO 12653-1-2007(2017) Electronic imaging－Test target for the black-and-white scanning of office documents－Part 1：Characteristics
KS A ISO 16067-1:2005 Photography-Spatial resolution measurements of electronic scanners for photographic image-Part 1:Scanners for reflective media
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS X ISO 12653-1-2007(2022) Electronic imaging－Test target for the black-and-white scanning of office documents－Part 1：Characteristics
KS A ISO 16067-1-2020 Photography－Spatial resolution measurements of electronic scanners for photographic image－Part 1：Scanners for reflective media
KS X ISO 12653-1:2007 Electronic imaging-Test target for the black-and-white scanning of office documents-Part 1:Characteristics
KS A ISO 16067-1-2005(2020) Photography－Spatial resolution measurements of electronic scanners for photographic image－Part 1：Scanners for reflective media
KS A ISO 21550-2020 Photography－Electronic scanners for photographic images－Dynamic range measurements
KS X ISO 12653-2-2007(2017) Electronic imaging－Test target for the black-and-white scanning of office documents－Part 2：Method of use
KS X ISO 12653-2-2007(2022) Electronic imaging－Test target for the black-and-white scanning of office documents－Part 2：Method of use

Association Francaise de Normalisation

NF Z42-010-1:1992 Electronic imaging - Scanning of office documents - part1:Subcontracting of scanning - Guide to detailed technical instructions for bureaux
NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF Z42-010-2:1993 Electronic imaging - Scanning of office documents - Part2:Acquisition of electronic imaging management systems - Guidelines for a request for proposals

GSO

GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
GSO ISO 21550:2013 Photography -- Electronic scanners for photographic images -- Dynamic range measurements
GSO ISO 16067-1:2013 Photography -- Spatial resolution measurements of electronic scanners for photographic images -- Part 1: Scanners for reflective media
BH GSO ISO 16067-1:2016 Photography -- Spatial resolution measurements of electronic scanners for photographic images -- Part 1: Scanners for reflective media
OS GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners

PT-IPQ

NP 3081-1985 Electronic component. Semiconductor chip inspection in microelectronics scanning, basic specifications

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

U.S. Military Regulations and Norms

ARMY MIL-PRF-49177 B VALID NOTICE 1-2013 SCAN-INTERLACE, PL-1408/UA
ARMY MIL-PRF-49168C-1997 SCAN-INTERLACE, PL-1403/UA, PL-1403A/UA
ARMY MIL-PRF-49168 C NOTICE 1-2013 SCAN-INTERLACE, PL-1403/UA, PL-1403A/UA

NEMA - National Electrical Manufacturers Association

NEMA NU 2-2012 Performance Measurements of Positron Emission Tomographs
NEMA NU 2-2018 Performance Measurements of Positron Emission Tomographs (PET)

BE-NBN

NBN Z 01-002-1991 Classification and typing of documents

ZA-SANS

SANS 12653-1:2006 Electronic imaging - Test target for the black-and-white scanning of office documents Part 1: Characteristics

VDI - Verein Deutscher Ingenieure

VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren

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