SEM detection method
SEM detection method, Total:11 items.
The international standard classification for "SEM detection method" includes: Linear and angular measurements in general , Optical equipment , Other standards related to analytical chemistry , Linear and angular measurements .
The Chinese standard classification for "SEM detection method" includes: Optical Measurement , Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
- GB/T 17722-1999 Gold-plated thickness measurement by SEM
- GB/T 16594-1996 Micron grade lenght measurement by SEM
- GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effects on topography induced by nanoparticles
- GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
Professional Standard - Public Safety Standards
- GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
Professional Standard - Machinery
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
Group Standards of the People's Republic of China
- T/CNIA 0161-2023 Method for inspecting the microstructure and morphology of deformed aluminum and aluminum alloys Scanning electron microscopy method
Professional Standard - Education
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
Korean Agency for Technology and Standards (KATS)
- KS I 0051-1999 General rules for scanning electron microscopy
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