scanning electron microscope
scanning electron microscope, Total:39 items.
The international standard classification for "scanning electron microscope" includes: Protection against crime , Linear and angular measurements in general , Metallic coatings , Chemical analysis .
The Chinese standard classification for "scanning electron microscope" includes: Crime judging technology , Electron optics and other physical optics instrument , Material Protection , Chemical Measurement , Basic standards and general methods .
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences―Part 6:Scanning electron microscopy
- GB/T 16594-1996 Micron grade lenght measurement by SEM
- GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences - Part 6:Scanning electron microscope/ X ray energy dispersive spectrometry
- GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary
- GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
Inner Mongolia Provincial Standard of the People's Republic of China
- DB15/T 3564-2024 Quantitative analysis of cashmere, sheep wool and their mixtures, scanning electron microscope fine-grained image recognition method
Professional Standard - Commodity Inspection
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Group Standards of the People's Republic of China
- T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
- T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
Military Standard of the People's Republic of China-General Armament Department
- GJB 2666-1996 Specification for scanning reflective beryllium mirrors
- GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
Professional Standard - Education
- JY/T 010-1996 General rules for analytical scanning electron microscopy
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
British Standards Institution (BSI)
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
Korean Agency for Technology and Standards (KATS)
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2019 General rules for scanning electron microscopy
- KS I 0051-1999 General rules for scanning electron microscopy
- KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
American Water Works Association (AWWA)
- AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
GCC Standardization Organization
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
American Society for Testing and Materials (ASTM)
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
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