Electron Microscopy Tools
Electron Microscopy Tools, Total:105 items.
The international standard classification for "Electron Microscopy Tools" includes: Optical measuring instruments , Chemical analysis , Optical equipment .
The Chinese standard classification for "Electron Microscopy Tools" includes: Electron optics and other physical optics instrument , Length Measurement , Chemical Measurement , Basic standards and general methods , Magnifier and microscope .
Professional Standard - Machinery
- JB/T 10573-2006 Toolmakers microscope
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 5383-1991 Specification for Transmission Electron Microscope
- JB/T 10573-2013 Toolmakers Microscope
- JB/T 5480-1991 Diaphragm of Electron Microscope
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5481-1991 Lamp Filament of Electron Microscope
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
Taiwan Provincial Standard of the People's Republic of China
- CNS 11276-1985 Toolmakers" Microscopes
全国标准信息公共服务平台
- GB/T 3719-1988 Toolmakers microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
- JJG 56-2000 Verification Regulation of Toolmakers Microscope
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG(航天) 50-1988 Calibration Regulations for Tool Microscopes
Professional Standard - Education
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
- JY/T 011-1996 General rules for transmission electron microscopy
- JY/T 0581-2020 General analysis rules for transmission electron microscope
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 2609-1996 Microscopes--Objectives
- GB/T 9246-2008 Microscopes—Oculars (eyepieces)
- GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
- GB/T 2609-2015 Microscopes―Objectives
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB 7667-2003 The dose of X-rays leakage from electron microscope
- GB 7667-1996 The dose of X-rays leakage from electron microscope
- GB/T 2609-2006 Microscopes - Objectives
- GB/T 9246-1996 Microscopes-Oculars (eyepieces)
Korean Agency for Technology and Standards (KATS)
- KS B 5602-1995 Toolmakers’ microscopes
- KS B 5602-1995(2021) Toolmakers’ microscopes
- KS B 5602-1995(2016) Toolmakers’ microscopes
- KS B 5602-2021 Toolmakers’ microscopes
- KS D ISO 22493-2012(2017) Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2019 General rules for scanning electron microscopy
- KS I 0051-1999 General rules for scanning electron microscopy
- KS D ISO 16700:2013 Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
- KS B 5601-1995(2021) Micrometer microscopes
- KS B 5601-1995 Micrometer microscopes
RU-GOST R
- GOST 8.003-1983 State system for ensuring the uniformity of measurements. Tool-making microscopes. Methods and means of verification
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
- ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 9344:2011 Microscopes - Graticules for eyepieces
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO/PRF 19012-4:2024 Microscopes
GSO
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
- BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
- BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
- BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
- BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
- 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
- 19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
- BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
- JIS B 7148:1992 Microscope eyepieces
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS B 7150:1993 Micrometer microscopes
American Society for Testing and Materials (ASTM)
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
SCC
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
- 12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
- AENOR UNE 1059:1956 Microcopy.
KR-KS
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
Association Francaise de Normalisation
- NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
Association of German Mechanical Engineers
- DVS 2803-1974 Electron-beam welding in microscopy (survey)
VDI - Verein Deutscher Ingenieure
- VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method
Military Standards (MIL-STD)
- DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
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