electron microscope thickness

electron microscope thickness, Total:279 items.

The international standard classification for "electron microscope thickness" includes: Optics and optical measurements , Other standards related to analytical chemistry , Chemical analysis , Surface treatment , Optical equipment , Ophthalmic equipment .

The Chinese standard classification for "electron microscope thickness" includes: Basic Subject in general , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Electron optics and other physical optics instrument , Material Protection , Magnifier and microscope , Chemical Measurement , Medical optical instrument and endoscope , General and microsurgical devices .

Group Standards of the People's Republic of China

T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction

Professional Standard - Machinery

JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 7398.13-1994 Specimens slides for microscopes and biological microscopes
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 9246-1996 Microscopes-Oculars (eyepieces)
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 2609-2006 Microscopes - Objectives
GB/T 2609-1996 Microscopes--Objectives
GB/T 6462-1986 Metallic and oxide coatings--Measurement of coating thickness--Microscopical method
GB/T 2609-2015 Microscopes―Objectives
GB 9246-1988 Microscopes--Series of oculars(eyepieces)
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB 2609-1981 Object lens for microscopes series
GB/T 43846.1-2024 Microscopes—Designation of microscope objectives—Part 1: Flatness of field/Plan
GB/T 6462-2005 Metallic and oxide coatings-Measurement of coating inckness-Microscopical method
GB/T 9246-2008 Microscopes—Oculars (eyepieces)
GB/T 44276.1-2024 Microscopes—Cover glasses—Part 1:Dimensional tolerances, thickness and optical properties
GB/T 9247-2008 Microscopes—Condensers
GB/T 9247-1996 Microscopes-Condensers
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 0581-2020 General analysis rules for transmission electron microscope
JY/T 011-1996 General rules for transmission electron microscopy
JY/T 010-1996 General rules for analytical scanning electron microscopy

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Professional Standard - Medicine

YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
YY 0067-1992 Micro-circulation microscopes
YY 0067-2007 Micro-circulation microscopes

国家食品药品监督管理局

YY/T 0067-2007 Micro-circulation microscopes

机械工业部

JB/T 8230.2-1995 Microscope objective lens series
JB/T 8230.9-1995 Microscope eyepiece series

Professional Standard - Petroleum

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

GSO

GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
BH GSO ISO 19012-1:2016 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan

Korean Agency for Technology and Standards (KATS)

KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D 8544-2021 Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS B ISO 19012-1:2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D 8519-2009 Metallic and oxide coating-Measurement of coating thickness-Microscopical method
KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS D 8519-2015 Metallic and oxide coating－Measurement of coating thickness－Microscopical method
KS D 8519-2009(2015) Metallic and oxide coating－Measurement of coating thickness－Microscopical method
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B 5601-1995 Micrometer microscopes
KS B 5601-1995(2021) Micrometer microscopes
KS B 5601-2021 Micrometer microscopes
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B 5615-1997 Biological microscope objectives
KS B 5615-2016(2021) Biological microscope objectives
KS L 2010-2009(2019) Slide glasses for microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS B 5616-1981 Biological Microscope Eyepieces
KS B 5617-1993 Stage micrometer for biological microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS B 5617-2013 Stage micrometer for biological microscope
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B 5615-2016 Biological microscope objectives
KS B 5616-2013 Biological microscope eyepieces
KS B 5615-2021 Biological microscope objectives
KS B 5616-2018 Biological microscope eyepieces

SCC

DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
HOLDEN HN 0295-2012 Microscopic Measurement of Dry Film Build Thickness
HOLDEN HN 0295-2004 MICROSCOPIC MEASUREMENT OF DRY FILM BUILD THICKNESS
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
AENOR UNE-EN ISO 9220:1996 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
NS-EN ISO 9220:1994 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method (ISO 9220:1988)
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
BS 7012-16:1997 Light microscopes-Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
BS EN ISO 1463:2004 Metallic and oxide coatings. Measurement of coating thickness. Microscopical method
12/30266267 DC BS ISO 19012-1. Microscopes. Designation of microscope objectives. Flatness of field/Plan
BS EN ISO 1463:1995 Metallic and oxide coatings. Measurement of coating thickness. Microscopical method
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
AENOR UNE 1059:1956 Microcopy.
BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
NS-EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)
DANSK DS/EN ISO 1463:2021 Metallic and oxide coatings – Measurement of coating thickness – Microscopical method (ISO 1463:2021)
BS ISO 19012-1:2007 Optics and photonics. Designation of microscope objectives-Flatness of field/plan

British Standards Institution (BSI)

BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS ISO 8255-1:2017 Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 9344:2011 Microscopes. Graticules for eyepieces
BS ISO 9344:2016 Microscopes. Graticules for eyepieces
BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 8255-1:2011 Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
BS 7012-8:1997 Light microscopes - Graticules for eyepieces
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
BS EN ISO 1463:2005 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method
BS EN ISO 1463:2021 Metallic and oxide coatings. Measurement of coating thickness. Microscopical method
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance

Association Francaise de Normalisation

NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF T30-123:1974 Paints. Determination of dry film thickness. Microscope methods.
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X11-660:1983 Granulométrie - Analyse granulométrique par microscopie optique - Généralités sur le microscope.
NF A91-110:2004 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF A91-110:1995 Metallic and oxide coatings. Measurement of coating thickness. Microscopical method.
NF A91-110*NF EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method
X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.

International Organization for Standardization (ISO)

ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO 9344:2016 Microscopes - Graticules for eyepieces
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 1463:2021 Metallic and oxide coatings — Measurement of coating thickness — Microscopical method
ISO 19012-1:2013 Microscopes.Designation of microscope objectives .Part 1: Flatness of field/Plan
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 19012-1:2011 Microscopes - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 1463:1982 Metallic and oxide coatings; Measurement of coating thickness; Microscopical method
ISO 1463:1973 Title missing - Legacy paper document
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 9344:2011 Microscopes - Graticules for eyepieces
ISO 8255-1:2017 Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 8255-1:2011 Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
ISO 1463:2003 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method
ISO/PRF 19012-4:2024 Microscopes
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction

German Institute for Standardization

DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994
DIN EN ISO 1463:2004 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2003); German version EN ISO 1463:2004
DIN EN ISO 1463 E:2020-06 Microscopic method for measuring coating thickness of metallic and oxide coatings (draft)
DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern

European Committee for Standardization (CEN)

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
EN ISO 1463:1994 Metallic and Oxide Coatings - Measurement of Coating Thickness - Microscopical Method (ISO 1463 : 1982)
EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)
EN ISO 1463:2004 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2003)

SE-SIS

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SIS SS-ISO 1463:1983 Meta I lic and oxide coatings - Measure- ment of coating thickness - Microscopi- cal method

Danish Standards Foundation

DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/EN ISO 1463:1994 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method
DS/ISO 1463:1983 Metallic and oxide coatings. Measurement of coating thickness. Microscopical method

Spanish Association for Standardization (UNE)

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
UNE-EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)
UNE-EN ISO 1463:2005 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2003)

TH-TISI

TIS 1083-1992 Standard for measurement of coating thickness by microscopical method

Lithuanian Standards Office

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
LST EN ISO 1463:2004 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2003)
LST EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)

DIN

DIN EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

AT-ON

OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
OENORM EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)

American Society for Testing and Materials (ASTM)

ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2001) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM D5235-18(2024) Standard Test Method for Microscopic Measurement of Dry Film Thickness of Coatings on Wood Products
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM D5235-13 Standard Test Method for Microscopical Measurement of Dry Film Thickness of Coatings on Wood Products
ASTM D5235-14 Standard Test Method for Microscopic Measurement of Dry Film Thickness of Coatings on Wood Products

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
JIS B 7148:1992 Microscope eyepieces
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS B 7150:1993 Micrometer microscopes
JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
JIS B 7147:1993 Biological microscope objectives
JIS B 7141:2003 Microscope -- Screw thread for objectives
JIS B 7141:1994 Microscope -- Screw thread for objectives

BE-NBN

NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B 5616-2023 Biological microscope eyepieces

South African Bureau of Standard

SANS 144:1982 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method

YU-JUS

JUS C.A6.031-1990 Metal11c and oxid coatlngs. tteasurement of coatlng thickness. Hicroscopical method

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)

Military Standards (MIL-STD)

DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
DOD A-A-51689-1986 DISK, MICROMETER, MICROSCOPE EYEPIECE

CZ-CSN

CSN ISO 1463:1993 Metallic and oxide coatings. Measurement of coating thickness. Microscopical method

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components

HU-MSZT

MNOSZ 5534-1956 Microscope light mirror
MNOSZ 15577-1953 microscope light

RU-GOST R

GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols

CH-SNV

SN EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)

PH-BPS

PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

International Electrotechnical Commission (IEC)

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

American Society of Mechanical Engineers (ASME)

ASME B1.11-1958 Microscope Objective Thread Errata - July 1972
ASME B1.11-1958(R2016) Microscope Objective Thread Errata - July 1972

American National Standards Institute （ANSI)

ANSI B1.11-1958 Microscope Objective Thread

NO-SN

NS 1181-1979 Metal and oxide coating - Measurement of thickness by microscopical examination of cross-sections

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components