Scanning Electron Microscope and Energy Spectrometer

Scanning Electron Microscope and Energy Spectrometer, Total:73 items.

The international standard classification for "Scanning Electron Microscope and Energy Spectrometer" includes: Other standards related to analytical chemistry , Optical equipment , Chemical analysis , Protection against crime .

The Chinese standard classification for "Scanning Electron Microscope and Energy Spectrometer" includes: Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Basic standards and general methods , Crime judging technology , Chemical Measurement .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM and XEDS
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 17361-2013 Microbeam analysis—Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences - Part 6:Scanning electron microscope/ X ray energy dispersive spectrometry
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Group Standards of the People's Republic of China

T/JSP 01-2025 Testing and Judgment of Graphene Materials in Cold Sprayed Zinc Paint Using Scanning Electron Microscopy-X-ray Energy Dispersive Spectroscopy Analysis
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope
T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method
T/GAIA 017-2022 Determination of fluorine content in the surface coating of aluminum and aluminum alloys— Scanning electron microscope and energy dispersive spectrometer method
T/CMAIA 002-2023 3D intelligent skin scanner

Professional Standard - Machinery

JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air

Professional Standard - Aviation

HB 20094.4-2012 Test method for determination of wear metals in operating liquid for aviation.Part 4: Scanning electron microscopy and energy dispersive spectrometry

Professional Standard - Public Safety Standards

GA/T 909-2010 Collecting and packaging method for trace evidence—Gunshot residue(SEM/EDS examination)
GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1520-2018 Forensic science―Examination methods for elements of black powder and flash powder―Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1418-2017 Analysis of elements in glass evidence in Forensics—Scanning electron microscope/energy dispersive X-ray spectrometry(SEM/EDX)
GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry

Fujian Provincial Standard of the People's Republic of China

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
JJF 1712-2018 Calibration Specification for Thin Layer Chromatography Scanners

Professional Standard - Agriculture

QB/T 8088.1-2024 Determination of Inner Wall Corrosion of Metal Containers for Food Part 1: Scanning Electron Microscope-Energy Spectrometry

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG(航空) 044-1989 Verification rules for single-scan oscillographic polarographs

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Professional Standard - Military and Civilian Products

WJ 2299-1995 Inductively Coupled Plasma Sequential Scanning Spectrometer Verification Regulations

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

International Organization for Standardization (ISO)

ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

American Society for Testing and Materials (ASTM)

ASTM E1683-02(2014)e1 Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E1683-02(2022) Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy

American Water Works Association (AWWA)

AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy

Korean Agency for Technology and Standards (KATS)

KS D ISO 15632-2023 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers(EDS) for use with a scanning electron microscope(SEM) or a
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS A ISO 16067-2-2005(2020) Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

German Institute for Standardization

DIN ISO 15632:2022 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN ISO 15632:2022-02 Draft Document - Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (E...

British Standards Institution (BSI)

13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

National Electrical Manufacturers Association（NEMA)

NEMA NU 2-2012 Performance Measurements of Positron Emission Tomographs
NEMA NU 2-2024 Performance Measurements of Positron Emission Tomographs (PETS)
NEMA NU 2-2018 Performance Measurements of Positron Emission Tomographs (PET)

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

GCC Standardization Organization

GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners