What does a scanning electron microscope energy spectrometer detect?
What does a scanning electron microscope energy spectrometer detect?, Total:37 items.
The international standard classification for "What does a scanning electron microscope energy spectrometer detect?" includes: Protection against crime , Other standards related to analytical chemistry , Optical equipment , Chemical analysis .
The Chinese standard classification for "What does a scanning electron microscope energy spectrometer detect?" includes: Crime judging technology , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Basic standards and general methods , Chemical Measurement .
Professional Standard - Aviation
- HB 20094.4-2012 Test method for determination of wear metals in operating liquid for aviation.Part 4: Scanning electron microscopy and energy dispersive spectrometry
Professional Standard - Judicatory
- SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
- GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences - Part 6:Scanning electron microscope/ X ray energy dispersive spectrometry
- GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 17361-2013 Microbeam analysis—Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
- GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
Fujian Provincial Standard of the People's Republic of China
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
Professional Standard - Public Safety Standards
- GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
- GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 909-2010 Collecting and packaging method for trace evidence—Gunshot residue(SEM/EDS examination)
- GA/T 823.3-2018 Examination methods for paint evidence in Forensics―Part 3:Scanning electron microscope/energy dispersive X-ray analysis(SEM/EDX)
- GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1520-2018 Forensic science―Examination methods for elements of black powder and flash powder―Scanning electron microscope/energy dispersive X-ray analysis
- GA/T 1418-2017 Analysis of elements in glass evidence in Forensics—Scanning electron microscope/energy dispersive X-ray spectrometry(SEM/EDX)
- GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
- GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
Group Standards of the People's Republic of China
- T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method
- T/GAIA 017-2022 Determination of fluorine content in the surface coating of aluminum and aluminum alloys— Scanning electron microscope and energy dispersive spectrometer method
- T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG(航空) 044-1989 Verification rules for single-scan oscillographic polarographs
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Professional Standard - Machinery
- JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer
Professional Standard - Military and Civilian Products
- WJ 2299-1995 Inductively Coupled Plasma Sequential Scanning Spectrometer Verification Regulations
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms
American Society for Testing and Materials (ASTM)
- ASTM E1683-02(2014)e1 Standard Practice for Testing the Performance of Scanning Raman Spectrometers
- ASTM E1683-02(2022) Standard Practice for Testing the Performance of Scanning Raman Spectrometers
SCC
- AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
DIN
- DIN ISO 15632:2022 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
NEMA - National Electrical Manufacturers Association
- NEMA NU 2-2012 Performance Measurements of Positron Emission Tomographs
- NEMA NU 2-2018 Performance Measurements of Positron Emission Tomographs (PET)
KR-KS
- KS D ISO 15632-2023 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers(EDS) for use with a scanning electron microscope(SEM) or a
Korean Agency for Technology and Standards (KATS)
- KS A ISO 16067-2-2005(2020) Photography-Electronic scanners for photographic images-Spatial resolution measurement-Part 2:Film scanners