Three methods for staining electron microscope samples
Three methods for staining electron microscope samples, Total:45 items.
The international standard classification for "Three methods for staining electron microscope samples" includes: Chemical analysis , Physics. Chemistry .
The Chinese standard classification for "Three methods for staining electron microscope samples" includes: Oil shale , Optical Measurement , Basic standards and general methods , Electron optics and other physical optics instrument .
Professional Standard - Petroleum
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
国家能源局
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33839-2017 Methods of transmission electron microscope for biological specimen containing carbon-based nanomaterials involving biological effect
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
- GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
Professional Standard - Machinery
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
Professional Standard - Education
- JY/T 011-1996 General rules for transmission electron microscopy
- JY/T 010-1996 General rules for analytical scanning electron microscopy
- JY/T 0581-2020 General analysis rules for transmission electron microscope
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
International Organization for Standardization (ISO)
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 5061:2002 Animal feeding stuffs - Determination of castor oil seed husks - Microscope method
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
Japanese Industrial Standards Committee (JISC)
- JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
Korean Agency for Technology and Standards (KATS)
- KS I 0051-1999 General rules for scanning electron microscopy
- KS I ISO 4407:2012 Hydraulic fluid power-Fluid contamination-Determination of particulate contamination by the counting method using an optical microscope
British Standards Institution (BSI)
- 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- BS ISO 5061:2002 Animal feeding stuffs - Determination of castor oil seed husks - Microscope method
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
IN-BIS
- IS 6191-1971 Microbiological color fastness and microscopic test methods for leather
Society of Automotive Engineers (SAE)
- SAE ARP598C-2003 (R) Aerospace Microscopic Sizing and Counting of Particulate Contamination for Fluid Power Systems
- SAE TS64-2-2004 TS64 Standard Method for Microscopic Evaluation of Hydraulic Fluid Samples for Particle Contamination
VDI - Verein Deutscher Ingenieure
- VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
- VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method
SCC
- VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
GSO
- OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
American Society for Testing and Materials (ASTM)
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Association Francaise de Normalisation
- XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
German Institute for Standardization
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)