GB/T 32262-2015 in English

VALID

Preparation of deoxyribonucleic acid sample for atomic force microscope measurement

Issued on:2015-12-10
Implemented on:2017-01-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $180.00
$175.00

Standard No:	GB/T 32262-2015
Document status:	VALID
Title in English:	Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
Title in Chinese:	用于原子力显微镜检测的脱氧核糖核酸样品的制备方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2015-12-10
Implemented on:	2017-01-01
ICS Classification:	07.030-Physics. Chemistry
Professional Classification:	GB-National Standard
Related Keywords:	deoxyribonucleic acid sample dna sample preparation procedure describes atomic force microscope atomic force microscopy detection mica substrate modification ensure sample quality
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《GB/T 32262-2015用于原子力显微镜检测的脱氧核糖核酸样品的制备方法》由TC279（全国纳米技术标准化技术委员会）归口，主管部门为中国科学院。
本标准规定了用于AFM检测分析的DNA样品的制备方法，其中包括：方法概要、实验材料和器材、环境条件、云母衬底的修饰、DNA溶液的处理、DNA在衬底上的固定、DNA样品的保存、DNA样品的评价等。
本标准适用于制备利用AFM研究单个DNA分子的高分辨成像和纳米操纵实验的、吸附在原子级平整的云母衬底上的各种DNA样品，以及研究其物化性质和生物学功能等。与DNA分子结构相类似的生物材料的固定也可参照本标准。

Introduction

GB/T32262-2015 Standard Interpretation

This standard specifies the method for preparing deoxyribonucleic acid (DNA) samples for atomic force microscopy (AFM) analysis, including key steps such as mica substrate modification, DNA solution treatment, DNA fixation on the substrate, and sample preservation. The following is a detailed interpretation from three aspects: standard framework, technical requirements, and implementation recommendations.

Comparison of Standard Frameworks

Chapters	Main Contents	Technical Requirements
1 Scope	Specifies the scope of application of the standard	Applicable to the preparation of DNA samples for atomic force microscopy detection
5 Experimental Materials and Equipment	Specifies the materials and instruments required for the experiment	Including mica, DNA stock solution, APTES solution, etc.
7 DNA Sample Preparation Procedure	Describes the preparation steps in detail	Including mica modification, DNA treatment, fixation and preservation
8 Detection and evaluation indicators of DNA samples	Specifies the detection method and evaluation criteria	Requires AFM imaging quality and related indicators

Technical background and evolution analysis

Atomic force microscopy (AFM) is a high-resolution characterization tool widely used in imaging and manipulation of nanoscale materials. Since DNA molecules have a chain structure and are prone to adhesion and aggregation, their dispersion and fixation in AFM experiments are key challenges.

This standard is based on the following technical background:

Use the negative charge property of DNA molecules
Achieve electrostatic interaction through mica substrate modification
Ensure sample quality by combining ultra-clean environment and temperature control conditions

Implementation suggestions

Case study: mica substrate modification

During the mica substrate modification process, it is recommended to use APTES solution for treatment. The specific steps are as follows:

Rinse the newly cleaved mica with ultrapure water and blow dry.
Apply an appropriate amount of APTES solution to cover the mica surface and let it stand for 2 minutes.
After washing with ultrapure water, place it in an 80℃ oven for 30 minutes.

Notes:It is recommended to operate under ultra-clean working conditions and ensure that the modified mica surface is free of contamination. It is recommended to use atomically flat mica sheets (Rq<0.1nm).

Significance of standard formulation

This standard provides a unified technical specification for the preparation of DNA samples for AFM detection, which has the following important significance:

Ensure the repeatability of experimental results
Improve the imaging quality of DNA samples at the nanoscale
Promote the development of biomolecular manipulation and functional research

By following this standard, researchers can prepare high-quality DNA samples that meet the requirements of AFM detection for sample flatness, dispersion and binding force.

More samples: DL/T 5154-2012 JGJ 94-2008 JJG 21-2008

Sample only — not a preview of GB/T 32262-2015

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