Kelvin atomic force microscope

Kelvin atomic force microscope, Total:108 items.

The international standard classification for "Kelvin atomic force microscope" includes: Chemical analysis , Optics and optical measurements , Testing of metals , Test conditions and procedures in general , Physics. Chemistry , Animal feeding stuffs , Ophthalmic equipment .

The Chinese standard classification for "Kelvin atomic force microscope" includes: Basic standards and general methods , Basic Subject in general , Metal physical property test method , Basic standards and general methods , Livestock and poultry feed and additive , Optical Measurement , Electron optics and other physical optics instrument , Medical optical instrument and endoscope .

Group Standards of the People's Republic of China

T/GDASE 0008-2020 Determination of Young's modulus of graphene film
T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/CSTM 00162-2020 Calibration methods for transmission electron microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic step
GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
GB/T 14698-2017 Identification method of feed material by microscopy
GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
GB/T 34269-2017 Atlas of microscopic examination for feedstuff
GB/T 45770-2025 Surface chemical analysis—Atomic force microscopy—Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

Professional Standard - Nuclear Industry

EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool

Professional Standard - Machinery

JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 6842-1993 Test Method of Scanning Electron Microscope

Professional Standard - Medicine

YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Education

JY/T 011-1996 General rules for transmission electron microscopy

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy

International Organization for Standardization (ISO)

ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2025 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use

GCC Standardization Organization

GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

British Standards Institution (BSI)

BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 25498:2025 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy

Engineering Sciences Data Unit (ESDU)

SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.
SPB-M6-1-2010 Apr.08: Interfacial and Rheological Properties of Asphaltenes Investigated using AFM
SPB-M14-1-2010 Sept.10: Interactions and rheological properties of Asphaltenes studied by Atomic Force Microscopy

American Society for Testing and Materials (ASTM)

ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM STP 372-1965 Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis
ASTM E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps

German Institute for Standardization

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN 22021:1985-07 Investigations of the raw material in hard-coal-mining; microscopical examinations of rocks
DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern

Korean Agency for Technology and Standards (KATS)

KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2016) Optics and photonics － Minimum requirements for stereomicroscope － Part 2: High performance microscopes
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS B ISO 11884-2:2011 Optics and photonics － Minimum requirements for stereomicroscope － Part 2: High performance microscopes

Association for Materials Protection and Performance (AMPP)

AMPP Paper 17739-2022 In Situ Atomic Force Microscopy Study of Microstructure Dependent Inhibitor Adsorption Mechanism on Carbon Steel
AMPP Paper 16610-2021 In situ contact-mode atomic force microscopy studies on the adsorption mechanism of organic inhibitors

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary

American Water Works Association (AWWA)

AWWA WQTC71603 Investigation of the Effect of Water Quality on the Initial Development of Corroding Copper by Atomic Force Microscopy

Japanese Industrial Standards Committee (JISC)

JIS K 0183:2024 Surface chemical analysis-Scanning probe microscopy-Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
JIS K 0132:1997 General rules for scanning electron microscopy
JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method

National Association of Corrosion Engineers (NACE)

NACE Paper 14792-2020 In situ atomic force microscopy and electrochemical measurements of organic inhibitors on mild steel

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary

Gosstandart of Russia

GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification

Military Standards (MIL-STD)

DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS

Bureau of Indian Standards

IS 13108-2019 Optics and Photonics —— Microscopes —— Immersion Liquids for Light Microscopy ( Second Revision )

Association Francaise de Normalisation

NF ISO 15932:2014 Microbeam Analysis - Analytical Electron Microscopy - Vocabulary

Society of Automotive Engineers (SAE)

SAE ARP598C-2003 (R) Aerospace Microscopic Sizing and Counting of Particulate Contamination for Fluid Power Systems

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