microscope atomic force
microscope atomic force, Total:13 items.
The international standard classification for "microscope atomic force" includes: Testing of metals , Test conditions and procedures in general , Optics and optical measurements , Chemical analysis .
The Chinese standard classification for "microscope atomic force" includes: Metal physical property test method , Optical Measurement , Basic standards and general methods , Basic Subject in general , Basic standards and general methods .
Group Standards of the People's Republic of China
- T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
- GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
- GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic step
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
- GB/T 40128-2021 Surface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets
American Society for Testing and Materials (ASTM)
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
International Organization for Standardization (ISO)
- ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
British Standards Institution (BSI)
- BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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