atomic force
atomic force, Total:7 items.
The international standard classification for "atomic force" includes: Testing of metals , Test conditions and procedures in general , Optics and optical measurements , Chemical analysis .
The Chinese standard classification for "atomic force" includes: Metal physical property test method , Basic standards and general methods , Optical Measurement , Basic Subject in general , Basic standards and general methods .
Group Standards of the People's Republic of China
- T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
- GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
- GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic step
- GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40128-2021 Surface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets
- GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
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