atomic force microscopy
atomic force microscopy, Total:20 items.
The international standard classification for "atomic force microscopy" includes: Chemical analysis , Optics and optical measurements , Properties of surfaces , Test conditions and procedures in general , Testing of metals .
The Chinese standard classification for "atomic force microscopy" includes: Basic standards and general methods , Basic Subject in general , Basic standards and general methods , Basic standards and general methods , Metal physical property test method .
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 36969-2018 Nanotechnology—Method for the measurement of the nanofilm-thickness by atomic force microscopy
- GB/T 40128-2021 Surface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets
- GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
- GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
- GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic step
Group Standards of the People's Republic of China
- T/GDASE 0008-2020 Determination of Young's modulus of graphene film
- T/SPSTS 031-2023 Graphene Material Surface Potential Measurement Atomic Force Microscopy
- T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33714-2017 Nanotechnology―Test method for size of nanoparticles―Atomic force microscopy
Professional Standard - Nuclear Industry
- EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool
International Organization for Standardization (ISO)
- ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
British Standards Institution (BSI)
- BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- 21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ESDU - Engineering Sciences Data Unit
- SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
- SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.
GSO
- GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
American Society for Testing and Materials (ASTM)
- ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
- ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
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