GB/T 40128-2021 in English
VALIDSurface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets
- Issued on:2021-05-21
- Implemented on:2021-12-01
- File Format:PDF
- Delivery:Via email within 5 business days
$301.00
《GB/T 40128-2021表面化学分析 原子力显微术 二硫化钼片层材料厚度测量方法》由TC38（全国微束分析标准化技术委员会）归口，TC38SC2（全国微束分析标准化技术委员会表面化学分析分会）执行，主管部门为国家标准化管理委员会。
Introduction
Technical background and significance of the standard
With the deepening of research on two-dimensional materials, molybdenum disulfide (MoS2) nanosheets have become a research hotspot due to their unique electronic structure and catalytic properties. This standard establishes for the first time a unified method for measuring the thickness of layered MoS2 using atomic force microscopy (AFM), filling the gap in the thickness measurement standard for nanomaterials.
Core Measurement Principle
| Working Mode | Force Type | Applicable Scenarios | Resolution |
|---|---|---|---|
| Contact Mode | Repulsive Force | High Modulus Samples | 0.1 nm |
| Tapping Mode | Intermittent Contact | Flexible Nanosheet (Recommended) | 0.2 nm |
The thickness is determined by measuring the height difference between the edge of the nanosheet and the substrate. The standard specifically specifies two data processing methods:
- Regional average method: the software automatically calculates the step height difference
- Single-side step fitting method: eliminate substrate tilt error through linear regression
Key technical requirements
Instrument configuration
- Z-axis resolution of AFM ≤1 nm
- Probe elastic coefficient: tapping mode＞2 N/m
- Environmental control: temperature (20±5)℃, humidity ≤60%
Key points of sample preparation
Take mechanical stripping method as an example:
1. Mica substrate tape cleavage2. MoS2 crystal stripping3. Sample dripping after ethanol dispersion4. Nitrogen blow drying
Measurement uncertainty analysis
The standard gives a complete uncertainty assessment model:
| Sources of uncertainty | Contribution value | Evaluation method |
|---|---|---|
| Measurement repeatability | 6.2% | Class A |
| Instrument calibration | 1.2% | Class B |
Typical expanded uncertainty can reach 12.8% (k=2)
Implementation suggestions
1. Probe selection: Silicon probe (resonance frequency ~300 kHz) is recommended
2. Parameter optimization: Scan rate 1-2 Hz, pixels ≥256×256
3. Quality Control: Calibrate with step height standards before each batch measurement
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