GB/T 33714-2017 in English

VALID

Nanotechnology―Test method for size of nanoparticles―Atomic force microscopy

Issued on:2017-05-12
Implemented on:2017-12-01
File Format:PDF
Delivery:Via email within 5 business days

Price(USD)： $310.00
$301.00

Standard No:	GB/T 33714-2017
Document status:	VALID
Title in English:	Nanotechnology―Test method for size of nanoparticles―Atomic force microscopy
Title in Chinese:	纳米技术纳米颗粒尺寸测量原子力显微术
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 5 business days
Issued on:	2017-05-12
Implemented on:	2017-12-01
ICS Classification:	19.020-Test conditions and procedures in general
Chinese Classification:	N04-Basic standards and general methods
Professional Classification:	GB-National Standard
Related Keywords:	probe microscopy terms nanoparticles atomic force microscopy atomic force microscopy introduction probe microscopy terms focus atomic force microscope
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《GB/T 33714-2017纳米技术纳米颗粒尺寸测量原子力显微术》由TC279（全国纳米技术标准化技术委员会）归口，主管部门为中国科学院。

Introduction

1. Standard Overview

GB/T 33714-2017 "Nanotechnology - Nanoparticle Size Measurement - Atomic Force Microscopy" is a national standard of the People's Republic of China. It mainly specifies the method of characterizing the size of nanoparticles by measuring the height of nanoparticles using an atomic force microscope (AFM). This standard is applicable to the measurement of nanoparticles dispersed on a flat substrate surface.

2. Comparison of standard frameworks

Standard dimensions	GB/T 33714—2017	ISO 18115-2	ASTM E2859-11
Technical requirements	Detailed provisions of AFM measurement methods and uncertainty assessment	Focus on the definition of scanning probe microscopy terms	Focus on the statistical analysis of nanoparticle size
Scope of application	Nanoparticles dispersed on the surface of a flat substrate	General scanning probe microscopy terms	Nanoparticles in powders and suspensions
Core Instruments	Atomic Force Microscope (AFM)	Scanning Probe Microscope (SPM)	Various Particle Size Analysis Instruments

3. Implementation Suggestions

3.1 Sample Preparation and Pretreatment

In actual operation, it is recommended to use the nanoparticle deposition method in Appendix A. The specific steps include:

Cleavage and modification of mica substrate (such as PLL solution treatment)
Cleaning and functionalization of silicon wafer (such as APDMES treatment)
Dilution and centrifugal separation of gold nanoparticles

3.2 Optimization of AFM Measurement Conditions

Select an appropriate scanning range and resolution according to the particle size. For example:

10nm particles: scanning range 0.5μm×0.5μm, number of pixels ≥512
60nm particles: scanning range 2.0μm×2.0μm, scanning rate 1Hz

3.3 Data Analysis and Uncertainty Assessment

Refer to the uncertainty assessment method in Appendix C to ensure the accuracy and traceability of the measurement results. Recommendations:

Regularly calibrate the height measurement benchmark of the AFM (such as Si step reference material)
Use commercial software to automate particle analysis and compare with manual measurement results

More samples: JC/T 2453-2018 GB 50021-2001(2009) DL/T 368-2010

Sample only — not a preview of GB/T 33714-2017

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