atomic microscope
atomic microscope, Total:215 items.
The international standard classification for "atomic microscope" includes: Optical equipment , Animal feeding stuffs , Products of the chemical industry in general , Test conditions and procedures in general , Optics and optical measurements , Ophthalmic equipment .
The Chinese standard classification for "atomic microscope" includes: Electron optics and other physical optics instrument , Magnifier and microscope , Basic standards and general methods for dye , Livestock and poultry feed and additive , Basic standards and general methods , Basic Subject in general , Medical optical instrument and endoscope , General and microsurgical devices .
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
- T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
- T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
- T/GDASE 0008-2020 Determination of Young's modulus of graphene film
- T/CSP 13-2024 Particulate technology—Analysis of sub-micron and nanometer heterostructure—Transmission electron microscopy
- T/BSPT 6-2024 Particulate technology—Analysis of sub-micron and nanometer heterostructure—Transmission electron microscopy
Professional Standard - Machinery
- JB/T 8230.9-1995 Microscope eyepiece series
- JB/T 5481-1991 Lamp Filament of Electron Microscope
- JB/T 8230.2-1995 Microscope objective lens series
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 8230.11-1999 Microscopes.Graticules for oculars
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 7398.3-1994 Microscope Objective Thread
- JB/T 5383-1991 Specification for Transmission Electron Microscope
- JB/T 7398.13-1994 Specimens slides for microscopes and biological microscopes
- JB/T 5480-1991 Diaphragm of Electron Microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 27596-2011 Dyestuffs—Determination of particle fineness—Microscope method
- GB/T 34269-2017 Atlas of microscopic examination for feedstuff
- GB/T 2609-1996 Microscopes--Objectives
- GB/T 43846.2-2024 Microscopes—Designation of microscope objectives—Part 2: Chromatic correction
- GB/T 9247-2008 Microscopes—Condensers
- GB/T 9246-2008 Microscopes—Oculars (eyepieces)
- GB/T 26600-2024 Microscopes—Immersion liquid for light microscopy
- GB/T 9246-1996 Microscopes-Oculars (eyepieces)
- GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
- GB/T 27668-2023 Microscopes—Vocabulary for light microscopy
- GB/T 9247-1996 Microscopes-Condensers
- GB/T 33714-2017 Nanotechnology―Test method for size of nanoparticles―Atomic force microscopy
- GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
- GB 2609-1981 Object lens for microscopes series
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
- GB/T 14698-2017 Identification method of feed material by microscopy
- GB/T 2609-2006 Microscopes - Objectives
- GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
- GB/T 2609-2015 Microscopes―Objectives
- GB 9246-1988 Microscopes--Series of oculars(eyepieces)
Military Standard of the People's Republic of China-General Armament Department
- GJB 8684.23-2015 Test methods for pyrotechnic properties - Part 23: Determination of particle size distribution of smoke solid particles by electron microscopy
- GJB 8684.22-2015 Test methods for pyrotechnic properties - Part 22: Determination of smoke solid particle number concentration by electron microscopy
- GJB 772.102-1989 Test methods for explosives Particle size determination microscopy
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB 5384.22-2005 Test methods of performance for pyrotechnic composition Part 21: Concentration determination of solid smoke particles quantities Electron microscope method
- GJB 5384.23-2005 Test methods of performance for pyrotechnic composition Part 23: Determination of particles size distribution for solid smoke particles Electron microscope method
Professional Standard - Medicine
- YY 0067-1992 Micro-circulation microscopes
- YY 0067-2007 Micro-circulation microscopes
- YY/T 0067-2007 Micro-circulation microscopes
- YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
未注明发布机构
- AMPP Paper 17739-2022 In Situ Atomic Force Microscopy Study of Microstructure Dependent Inhibitor Adsorption Mechanism on Carbon Steel
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Education
- JY/T 011-1996 General rules for transmission electron microscopy
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
American Society for Testing and Materials (ASTM)
- ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
- ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM STP 372-1965 Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E3060-16 Standard Guide for Subvisible Particle Measurement in Biopharmaceutical Manufacturing Using Dynamic (Flow) Imaging Microscopy
German Institute for Standardization
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
- DIN EN ISO 21363:2022 Nanotechnologies – measurements of particle size and particle shape distributions using transmission electron microscopy
- DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
- DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
- DIN 22020-3:1998-08 Investigations of raw material in hard-coal-mining - Microscopical examination of hard coal, coke and briquettes - Part 3: Maceral analysis on particulated blocks
- DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
Association Francaise de Normalisation
- NF X11-660:1983 Granulométrie - Analyse granulométrique par microscopie optique - Généralités sur le microscope.
- X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
- NF E48-651:1986 Hydraulic fluid power. Fluids. Determination of particulate contamination by the counting method using a microscope.
- NF X11-661:1990 Particle size analysis. Determination of particle size of powders. Optical microscope method.
- NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
- NF T16-404*NF EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
- NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
- NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
Japanese Industrial Standards Committee (JISC)
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS B 7148:1992 Microscope eyepieces
- JIS B 7150:1993 Micrometer microscopes
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
- JIS B 7147:1993 Biological microscope objectives
- JIS B 7141:1994 Microscope -- Screw thread for objectives
- JIS B 7141:2003 Microscope -- Screw thread for objectives
Society of Automotive Engineers (SAE)
- SAE ARP598C-2003 (R) Aerospace Microscopic Sizing and Counting of Particulate Contamination for Fluid Power Systems
International Organization for Standardization (ISO)
- ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 10934:2025 Microscopes — Vocabulary for light microscopy
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2025 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 9344:2011 Microscopes - Graticules for eyepieces
- ISO/PRF 19012-4:2024 Microscopes
- ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
- ISO 21363:2020 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
- ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction
- ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
- ISO 19012-4:2024 Microscopes - Designation of microscope objectives - Part 4: Polarization characteristics
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
- ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
- ISO/DIS 19012-4 Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics
- ISO 9344:2016 Microscopes - Graticules for eyepieces
GCC Standardization Organization
- GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
- GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 19749:2024 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
British Standards Institution (BSI)
- BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- 21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
- BS ISO 10934:2025 Microscopes. Vocabulary for light microscopy
- BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
- BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
- BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
- BS ISO 25498:2025 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
- BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
- BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- 19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
- BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
- BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
- BS 3406-4:1963 Methods for determination of particle size distribution-Optical microscope method
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
- BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
- BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
- BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
- BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
- BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
- BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
- BS ISO 9344:2011 Microscopes. Graticules for eyepieces
- BS ISO 9344:2016 Microscopes. Graticules for eyepieces
- BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
Korean Agency for Technology and Standards (KATS)
- KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
- KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
- KS I ISO 4407:2012 Hydraulic fluid power-Fluid contamination-Determination of particulate contamination by the counting method using an optical microscope
- KS B 5601-1995(2021) Micrometer microscopes
- KS B 5601-1995 Micrometer microscopes
- KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS B 5601-2021 Micrometer microscopes
- KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
- KS B ISO 19012-1:2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
- KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
- KS L 2010-2009(2019) Slide glasses for microscope
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
- KS B 5617-2013 Stage micrometer for biological microscope
- KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS B 5617-1993 Stage micrometer for biological microscope
- KS B 5615-2016 Biological microscope objectives
- KS B 5616-2013 Biological microscope eyepieces
- KS B 5615-2021 Biological microscope objectives
- KS B 5616-2018 Biological microscope eyepieces
- KS B 5616-2023 Biological microscope eyepieces
- KS B 5615-2016(2021) Biological microscope objectives
- KS B 5615-1997 Biological microscope objectives
- KS L 2010-2009(2024) Slide glasses for microscope
- KS B 5616-1981 Biological Microscope Eyepieces
- KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
- KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
- KS C ISO 21363-2023 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2024 General rules for scanning electron microscopy
- KS I 0051-2019 General rules for scanning electron microscopy
ESDU - Engineering Sciences Data Unit
- SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- OS GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces
IN-BIS
- IS 5258-1969 Determination of Powder Particle Size by Optical Microscopy
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
American Water Works Association (AWWA)
- AWWA QTC98270 Count Matching In-situ Particle Counts to Scanning Electron Microscopic Counts for Treatment Facility Process Control
PL-PKN
- PN C04424-02-1985 Pigments Determination of particie size distribution Microscopic method-simple
Military Standards (MIL-STD)
- DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
- DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
- DOD A-A-51689-1986 DISK, MICROMETER, MICROSCOPE EYEPIECE
- DOD A-A-54868-1993 MICROSCOPE, OPTICAL STEREOSCOPIC
Bureau of Indian Standards
- IS 13108-2019 Optics and Photonics — Microscopes — Immersion Liquids for Light Microscopy ( Second Revision )
- IS 17849-2022 Nanotechnologies Measurements of particle size and shape distributions by transmission electron microscopy
Spanish Association for Standardization (UNE)
- AENOR UNE 1059:1956 Microcopy.
PH-BPS
- PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
Magyar Szabványügyi Testület
- MNOSZ 5534-1956 Microscope light mirror
- MNOSZ 15577-1953 microscope light
European Committee for Standardization (CEN)
- EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
- EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
Danish Standards Foundation
- DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
American Society of Mechanical Engineers (ASME)
- ASME B1.11-1958 Microscope Objective Thread Errata - July 1972
- ASME B1.11-1958(R2016) Microscope Objective Thread Errata - July 1972
American National Standards Institute （ANSI)
- ANSI B1.11-1958 Microscope Objective Thread
- ANSI/ASME B1.11-1958 Microscope Objective Thread
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC TM-650 2.2.14.1-1995 Solder Powder Particle Size Distribution - Measuring Microscope Method
atomic microscope,Atomic Mechanics Microscopy,scanning electron microscope,electron microscope original,original microscope,Scanning Electron Microscopy,The original transmission electron microscope,The origin of the polarizing microscope,Principles of Microscopy
