Electron Microscope Dimensions

Electron Microscope Dimensions, Total:166 items.

The international standard classification for "Electron Microscope Dimensions" includes: Optical equipment , Optical measuring instruments , Linear and angular measurements , Test conditions and procedures in general .

The Chinese standard classification for "Electron Microscope Dimensions" includes: Magnifier and microscope , Optical metrological instrument , Electron optics and other physical optics instrument , Length Measurement , Basic standards and general methods .

Group Standards of the People's Republic of China

T/CSTM 00799-2023 Determination of grain size in steel—High temperature laser scanning confocal microscope method
T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy

Professional Standard - Machinery

JB/T 8230.12-1999 Microscope -- connecting dimensions of tube slides and tube slots
JB/T 8230.8-1999 Microscope -- connecting dimensions of dismountable condenser and colour filter
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 7398.6-1994 Microscope - Motion Ruler
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 8230.5-1999 Microscope -- connecting and fitting dimensions between ocular （eyepiece） and tube
JB/T 7398.2-1994 Microscope Optical Connection Dimensions
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 9339-1999 Measuring microscope
JB/T 9349-1999 Measuring knives for the toolmaker's microscope
JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 9352-1999 Test method for the transmission electron microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB 7667-1996 The dose of X-rays leakage from electron microscope
GB/T 22060-2008 Microscopes - Dimensions of tube slide and tube slot connections
GB 7667-2003 The dose of X-rays leakage from electron microscope

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 22055-2022 Microscopes—Interfacing dimensions for imaging componen

National Metrological Verification Regulations of the People's Republic of China

JJG 571-2004 Verification Regulation of Reading Microscope and Measuring Microscope
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 571-1988 Verification Regulation of Measuring Microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33714-2017 Nanotechnology―Test method for size of nanoparticles―Atomic force microscopy

Professional Standard - Education

JY/T 011-1996 General rules for transmission electron microscopy

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

American Society for Testing and Materials (ASTM)

ASTM F728-81(1997)e1 Standard Practice for Preparing An Optical Microscope for Dimensional Measurements
ASTM F72-95(2001) Standard Specification for Gold Wire for Semiconductor Lead Bonding
ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy

SCC

DIN 58881:1956 Microscopes - Oculars, fitting dimensions
BS 3836-2:1965 Specification for components of microscopes. Dimensions and marking of microscopes
DANSK DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DANSK DS/ISO 21363:2020 Nanotechnologies – Measurements of particle size and shape distributions by transmission electron microscopy
09/30199298 DC BS ISO 9344. Microscopes. Graticules for eyepieces
DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

RU-GOST R

GOST 3469-1991 Mikroscopes. Screw threads for objectives. Dimensions
GOST 11200-1975 Objectives and body-tubes of the microscopes. Attaching dimensions
GOST 3361-1975 Eyepieces and body-tubes of the microscopes. Attaching dimensions
GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 9344:2011 Microscopes - Graticules for eyepieces
ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 8040:1986 Optics and optical instruments; Microscopes; Connecting dimensions of tube slides and tube slots
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary

RO-ASRO

STAS 6851/1-1973 MIGROSCOPES Main dimensions
STAS 6851/2-1975 MICROSCOPES Basic optical dimensions
STAS 7353/4-1982 MICROSCOPES Basic optical dimensions
STAS 7353/3-1982 MICROSCOPES Basic mechanical dimensions

British Standards Institution (BSI)

BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS EN ISO 21363:2022 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS ISO 21363:2020 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
18/30351714 DC BS ISO 21363. Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS ISO 9345:2019 Microscopes. Interfacing dimensions for imaging components
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
BS ISO 8255-1:2017 Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
18/30342638 DC BS ISO 9345. Microscopes. Interfacing dimensions for imaging components
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis

European Committee for Standardization (CEN)

EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

KR-KS

KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
KS C ISO 21363-2023 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

HU-MSZT

MNOSZ 5532-1956 Main dimensions of microscopes and concave and convex mirrors
MNOSZ 5533-1956 Main dimensions of condenser lens inner channel microscope filtration

Spanish Association for Standardization (UNE)

UNE-EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020) (Endorsed by Asociación Española de Normalización in February of 2022.)
UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)

VE-FONDONORMA

NORVEN 84-4-1963 Microscope stand dimensions

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC TM-650 2.2.14.1-1995 Solder Powder Particle Size Distribution - Measuring Microscope Method

PL-PKN

PN N53040-1988 Light microscopes Optical mechanical dimensions

German Institute for Standardization

DIN EN ISO 21363:2022 Nanotechnologies – measurements of particle size and particle shape distributions using transmission electron microscopy
DIN EN ISO 21363 E:2021-09 Nanotechnology Measurement of Particle Size and Shape Distribution by Transmission Electron Microscopy (Draft)
DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
DIN EN ISO 21363:2022-03 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020); German version EN ISO 21363:2022
DIN EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN ISO 8040:2003 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections (ISO 8040:2001)
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022

IN-BIS

IS 3081-1965 General Microscope Dimensions and Markings
IS 4329-1967 Specification for measuring (mobile) microscopes

GSO

GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

Japanese Industrial Standards Committee (JISC)

JIS B 7153:1995 Measuring microscopes
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS B 7150:1993 Micrometer microscopes

Association Francaise de Normalisation

NF EN ISO 21363:2022 Nanotechnologies - Determination of particle size and shape distribution by transmission electron microscopy
NF EN ISO 19749:2023 Nanotechnologies - Determination of particle size and shape distribution by scanning electron microscopy
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF S12-023:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. CONNECTING DIMENSIONS OF TUBE SLIDES AND TUBE SLOTS.
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

Korean Agency for Technology and Standards (KATS)

KS B 5601-1995(2016) Micrometer microscopes
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS B ISO 8040-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8478-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8040-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8478-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B 5601-1995 Micrometer microscopes
KS B 5601-1995(2021) Micrometer microscopes
KS I ISO 4407:2012 Hydraulic fluid power-Fluid contamination-Determination of particulate contamination by the counting method using an optical microscope
KS B 5601-2021 Micrometer microscopes
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B ISO 8040:2006 Optics and optical instruments－Microscopes－Dimensions of tube slide and tube slot connections
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D 8544-2021 Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS B 5617-2013 Stage micrometer for biological microscope
KS B 5617-1993 Stage micrometer for biological microscope
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary

SE-SIS

SIS SS 11 11 15-1985 Steel - Method for assessing the slag inclusion content - Microscopic methods - Manual counting of particles and calculation of size-distribution
SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

Danish Standards Foundation

DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

Military Standards (MIL-STD)

DOD A-A-51689-1986 DISK, MICROMETER, MICROSCOPE EYEPIECE

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