What does an atomic force microscope measure?

What does an atomic force microscope measure?, Total:108 items.

The international standard classification for "What does an atomic force microscope measure?" includes: Test conditions and procedures in general , Testing of metals , Optics and optical measurements , Optical measuring instruments , Physics. Chemistry , Animal feeding stuffs , Ophthalmic equipment , Linear and angular measurements .

The Chinese standard classification for "What does an atomic force microscope measure?" includes: Basic standards and general methods , Metal physical property test method , Optical Measurement , Basic Subject in general , Electron optics and other physical optics instrument , Optical metrological instrument , Livestock and poultry feed and additive , Medical optical instrument and endoscope , Length Measurement .

Group Standards of the People's Republic of China

T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/GDASE 0008-2020 Determination of Young's modulus of graphene film
T/SPSTS 031-2023 Graphene Material Surface Potential Measurement Atomic Force Microscopy
T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic step
GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)

Professional Standard - Nuclear Industry

EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool

Professional Standard - Machinery

JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 9339-1999 Measuring microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 14698-2017 Identification method of feed material by microscopy
GB/T 34269-2017 Atlas of microscopic examination for feedstuff
GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
GB/T 33714-2017 Nanotechnology―Test method for size of nanoparticles―Atomic force microscopy

Professional Standard - Agriculture

WS/T 10018-2024 Leishmania smear microscopy

Professional Standard - Medicine

YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery

National Metrological Verification Regulations of the People's Republic of China

JJG 571-2004 Verification Regulation of Reading Microscope and Measuring Microscope

GSO

GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 13095:2017 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

International Organization for Standardization (ISO)

ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 9344:2011 Microscopes - Graticules for eyepieces
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes

British Standards Institution (BSI)

BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy

American Society for Testing and Materials (ASTM)

ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps

ESDU - Engineering Sciences Data Unit

SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.
SPB-M6-1-2010 Apr.08: Interfacial and Rheological Properties of Asphaltenes Investigated using AFM

German Institute for Standardization

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Korean Agency for Technology and Standards (KATS)

KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS B 5601-1995(2021) Micrometer microscopes
KS B 5601-1995 Micrometer microscopes
KS B 5601-2021 Micrometer microscopes
KS B 5617-1993 Stage micrometer for biological microscope
KS B 5617-2013 Stage micrometer for biological microscope
KS B 5618-1993 Net stage micrometer for biological microscope
KS B 5618-2013 Net stage micrometer for biological microscope
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B 5603-2021 Microscope Test Specimens
KS B 5603-1990(2016) Microscope Test Specimens

Japanese Industrial Standards Committee (JISC)

JIS B 7150:1993 Micrometer microscopes
JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS B 7153:1995 Measuring microscopes
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 0132:1997 General rules for scanning electron microscopy
JIS B 7139-2:2008 Stereomicroscopes -- Part 2: Testing of stereomicroscopes
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method

RU-GOST R

GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification

Military Standards (MIL-STD)

DOD A-A-51689-1986 DISK, MICROMETER, MICROSCOPE EYEPIECE
DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
DOD A-A-54065-1990 SLIDE, MICROSCOPE (BOERNER TEST)

SCC

AWWA WQTC71603 Investigation of the Effect of Water Quality on the Initial Development of Corroding Copper by Atomic Force Microscopy
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary

KR-KS

KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

IPC - Association Connecting Electronics Industries

IPC TP-1113 CD-1994 Circuit Board Ionic Cleanliness Measurement: What Does It Tell Us?

HU-MSZT

MNOSZ 4017-1954 Scratch microscope inspection

Association Francaise de Normalisation

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire

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