atomic force measurement
atomic force measurement, Total:5 items.
The international standard classification for "atomic force measurement" includes: Optics and optical measurements .
The Chinese standard classification for "atomic force measurement" includes: Basic Subject in general .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
Group Standards of the People's Republic of China
- T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
American Society for Testing and Materials (ASTM)
- ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
- ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
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