Atomic Force Microscope Detection
Atomic Force Microscope Detection, Total:2 items.
The international standard classification for "Atomic Force Microscope Detection" includes: Physics. Chemistry .
The Chinese standard classification for "Atomic Force Microscope Detection" includes: Optical Measurement .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
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