Atomic Force Microscopy Sample Preparation Method

Atomic Force Microscopy Sample Preparation Method, Total:67 items.

The international standard classification for "Atomic Force Microscopy Sample Preparation Method" includes: Physics. Chemistry , Chemical analysis , Animal feeding stuffs , Optics and optical measurements , Test conditions and procedures in general , Testing of metals .

The Chinese standard classification for "Atomic Force Microscopy Sample Preparation Method" includes: Optical Measurement , Basic standards and general methods , Basic Subject in general , Oil shale , Basic standards and general methods , Metal physical property test method , Electron optics and other physical optics instrument .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
GB/T 45770-2025 Surface chemical analysis—Atomic force microscopy—Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic step
GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
GB/T 14698-2017 Identification method of feed material by microscopy

Group Standards of the People's Republic of China

T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/GDASE 0008-2020 Determination of Young's modulus of graphene film
T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device

Professional Standard - Petroleum

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Professional Standard - Machinery

JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
JB/T 9352-1999 Test method for the transmission electron microscope

Professional Standard - Nuclear Industry

EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool

未注明发布机构

AMPP Paper 17739-2022 In Situ Atomic Force Microscopy Study of Microstructure Dependent Inhibitor Adsorption Mechanism on Carbon Steel
AMPP Paper 16610-2021 In situ contact-mode atomic force microscopy studies on the adsorption mechanism of organic inhibitors

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0581-2020 General analysis rules for transmission electron microscope
JY/T 011-1996 General rules for transmission electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

Taiwan Provincial Standard of the People's Republic of China

CNS 11018-1984 Method of Preparing Coal Samples for Microscopical Analysis by Reflected Light

Korean Agency for Technology and Standards (KATS)

KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS I 0051-1999 General rules for scanning electron microscopy

International Organization for Standardization (ISO)

ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary

German Institute for Standardization

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern

GCC Standardization Organization

GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

British Standards Institution (BSI)

BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy

ESDU - Engineering Sciences Data Unit

SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)

Japanese Industrial Standards Committee (JISC)

JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation

American Society for Testing and Materials (ASTM)

ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy

Gosstandart of Russia

GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification

Standard Association of Australia （SAA）

AS 2061:1989 Preparation of coal samples for incident light microscopy

National Association of Corrosion Engineers (NACE)

NACE Paper 14792-2020 In situ atomic force microscopy and electrochemical measurements of organic inhibitors on mild steel

Military Standards (MIL-STD)

DOD A-A-54656-1992 IMMERSION OIL, MICROSCOPY

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