AFM sample preparation method
AFM sample preparation method, Total:21 items.
The international standard classification for "AFM sample preparation method" includes: Physics. Chemistry , Chemical analysis .
The Chinese standard classification for "AFM sample preparation method" includes: Basic standards and general methods , Optical Measurement , Oil shale , Electron optics and other physical optics instrument .
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
- GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
Professional Standard - Petroleum
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
- SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
国家能源局
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
- GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
Group Standards of the People's Republic of China
- T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
Professional Standard - Machinery
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
Professional Standard - Nuclear Industry
- EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool
German Institute for Standardization
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
Japanese Industrial Standards Committee (JISC)
- JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
Korean Agency for Technology and Standards (KATS)
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
Standard Association of Australia （SAA）
- AS 2061:1989 Preparation of coal samples for incident light microscopy
British Standards Institution (BSI)
- BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
International Organization for Standardization (ISO)
- ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ESDU - Engineering Sciences Data Unit
- SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
GSO
- GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
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