Atomic Force Microscopy Sample Preparation

Atomic Force Microscopy Sample Preparation, Total:101 items.

The international standard classification for "Atomic Force Microscopy Sample Preparation" includes: Physics. Chemistry , Chemical analysis , Optics and optical measurements , Items of art and handicrafts , Test conditions and procedures in general , Testing of metals , Other standards related to analytical chemistry .

The Chinese standard classification for "Atomic Force Microscopy Sample Preparation" includes: Optical Measurement , Basic standards and general methods , Basic Subject in general , Oil shale , Basic standards and general methods , Metal physical property test method , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
GB/T 45770-2025 Surface chemical analysis—Atomic force microscopy—Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic step
GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
GB/T 17366-2025 Microbeam analysis—Electron probe microanalysis—Methods of specimen preparation for minerals and rocks
GB/T 45459-2025 Microbeam analysis—Focused ion beam—Preparation of TEM specimens
GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 44205-2024 Sample preparation of ancient lacquer film for microscopy

Group Standards of the People's Republic of China

T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/GDASE 0008-2020 Determination of Young's modulus of graphene film
T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)

Professional Standard - Petroleum

SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Nuclear Industry

EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool

Taiwan Provincial Standard of the People's Republic of China

CNS 11018-1984 Method of Preparing Coal Samples for Microscopical Analysis by Reflected Light

Professional Standard - Machinery

JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution

British Standards Institution (BSI)

BS ISO 17297:2025 Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

International Organization for Standardization (ISO)

ISO 17297:2025 Microbeam analysis - Focused ion beam application for TEM specimen preparation - Vocabulary
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 20705:2019 Textiles — Quantitative microscopical analysis — General principles of testing

Indonesia Standards

SNI 13-4706-1998 Penyiapan sayatan tipis poles untuk mikroskopis bijih

Standard Association of Australia （SAA）

AS 2061:1989 Preparation of coal samples for incident light microscopy
AS 2061:1977 Code of practice for preparation of hard coal samples for microscopical examination by reflected light
AS 2856.1:2000(R2013) Preparation of coal samples for incident light microscopy of coal petrography
AS 2856.1:2000 Coal petrography - Preparation of coal samples for incident light microscopy

GCC Standardization Organization

GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
GSO ASTM E3:2009 Standard Guide for Preparation of Metallographic Specimens

Engineering Sciences Data Unit (ESDU)

SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.
SPB-M6-1-2010 Apr.08: Interfacial and Rheological Properties of Asphaltenes Investigated using AFM
SPB-M14-1-2010 Sept.10: Interactions and rheological properties of Asphaltenes studied by Atomic Force Microscopy

American Society for Testing and Materials (ASTM)

ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM D3997-97 Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
ASTM D2797/D2797M-09 Standard Practice for Preparing Coal Samples for Microscopical Analysis by Reflected Light
ASTM D3997-97(2004) Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM D3997/D3997M-24 Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM STP 949-1987 The Design, Sample Handling, and Applications of Infrared Microscopes
ASTM D2797/D2797M-11 Standard Practice for Preparing Coal Samples for Microscopical Analysis by Reflected Light
ASTM D3997/D3997M-16 Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
ASTM D3997/D3997M-97(2009) Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
ASTM D2797-85(1999) Standard Practice for Preparing Coal Samples for Microscopical Analysis by Reflected Light
ASTM F72-95(2001) Standard Specification for Gold Wire for Semiconductor Lead Bonding
ASTM F728-81(1997)e1 Standard Practice for Preparing An Optical Microscope for Dimensional Measurements
ASTM D2797/D2797M-20 Standard Practice for Preparing Coal Samples for Microscopical Analysis by Reflected Light
ASTM D2797/D2797M-11a(2019) Standard Practice for Preparing Coal Samples for Microscopical Analysis by Reflected Light
ASTM E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps
ASTM D2797/D2797M-20a Standard Practice for Preparing Coal Samples for Microscopical Analysis by Reflected Light

German Institute for Standardization

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern

Association for Materials Protection and Performance (AMPP)

AMPP Paper 16610-2021 In situ contact-mode atomic force microscopy studies on the adsorption mechanism of organic inhibitors
AMPP Paper 17739-2022 In Situ Atomic Force Microscopy Study of Microstructure Dependent Inhibitor Adsorption Mechanism on Carbon Steel

Polski Komitet Normalizacyjny (PKN)

PN H87903-1972 Irwestigations o? copper alloys castings Preparation and sampling ot ?es? pieces for microscopis examinations

Magyar Szabványügyi Testület

MNOSZ 3646-1954 Microbial testing of food samples. Microscopic examination
MNOSZ 5535-1956 Microscope Preparation Healing Spring Table/Peak Position

Japanese Industrial Standards Committee (JISC)

JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
JIS K 0183:2024 Surface chemical analysis-Scanning probe microscopy-Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy

Ente Nazionale Italiano di Unificazione

UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.
UNI 3487:1954 Microscopic examination of zinc and zinc alloys. Sampling. Preparing test specimens. Etchants.
UNI 3493:1954 Microscopic examination of lead and lead alloys. Sampling. Preparing test specimens. Etchants.
UNI 3491:1954 Microscopic examination of nickel and nickel alloys. Sampling. Preparing test specimens. Etchants.
UNI 3594:1955 Microscopic examination of tungsten and sintered tungsten-silver and tungsten- copper. Sampling and preparing test specimens. Etchants.
UNI 7604:1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
UNI 3250:1952 Microscopic examination of non-ferrous metals. Taking samples and preparing test specimens of aluminium and aluminium alloys. Etchants.
UNI EN ISO 20705:2020 Textiles - Quantitative microscopical analysis - General principles of testing
UNI 3137:1965 Microscopic examination of ferrous materials. Cutting of samples and specimens, preparaton and etching of specimens (etching reagents).
UNI 7329:1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.

Spanish Association for Standardization (UNE)

AENOR UNE 7108:1957 PREPARATION OF "CLINKER" SAMPLES AND PORTLAND CEMENT, FOR OBSERVATION UNDER THE MICROSCOPE
UNE 7 108 Preparation of slag and Portland plaster samples for observation in a microscope

National Association of Corrosion Engineers (NACE)

NACE Paper 14792-2020 In situ atomic force microscopy and electrochemical measurements of organic inhibitors on mild steel

American Water Works Association (AWWA)

AWWA WQTC71603 Investigation of the Effect of Water Quality on the Initial Development of Corroding Copper by Atomic Force Microscopy

Gosstandart of Russia

GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification

Association Francaise de Normalisation

NF EN ISO 20705:2020 Textiles - Quantitative analysis by microscopy - General principles of testing
NF G06-008*NF EN ISO 20705:2020 Textiles - Quantitative microscopical analysis - General principles of testing

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC JEDEC J-STD-035A-2022 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Devices

European Committee for Standardization (CEN)

EN ISO 20705:2020 Textiles - Quantitative microscopical analysis - General principles of testing (ISO 20705:2019)

International Electrotechnical Commission (IEC)

IEC TS 62607-6-2:2023 Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy

Society of Automotive Engineers (SAE)

SAE ARP598C-2003 (R) Aerospace Microscopic Sizing and Counting of Particulate Contamination for Fluid Power Systems