atomic force microscope

atomic force microscope, Total:243 items.

The international standard classification for "atomic force microscope" includes: Testing of metals , Optical equipment , Test conditions and procedures in general , Radiographic equipment , Optics and optical measurements , Optical measuring instruments , Physics. Chemistry , Animal feeding stuffs , Chemical analysis , Ophthalmic equipment .

The Chinese standard classification for "atomic force microscope" includes: Metal physical property test method , Magnifier and microscope , Basic standards and general methods , Optical Measurement , Electron optics and other physical optics instrument , Medical optical instrument and endoscope , Basic Subject in general , Optical metrological instrument , Livestock and poultry feed and additive , Basic standards and general methods , General and microsurgical devices .

Group Standards of the People's Republic of China

T/GDASE 0008-2020 Determination of Young's modulus of graphene film
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
T/SZBX 096-2022 Operation microscopes

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB 9246-1988 Microscopes--Series of oculars(eyepieces)
GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
GB 2609-1981 Object lens for microscopes series
GB/T 2609-2015 Microscopes―Objectives
GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
GB/T 27668-2023 Microscopes—Vocabulary for light microscopy
GB/T 10155-1988 Stereomicroscope
GB/T 9246-1996 Microscopes-Oculars (eyepieces)
GB/T 9246-2008 Microscopes—Oculars (eyepieces)
GB/T 19864.2-2005 Stereomicroscopes - Part 2: High performance microscopes
GB/T 22062-2008 Microscopes - Graticules for oculars
GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
GB/T 19864.2-2013 Stereomicroscopes—Part 2:High performance microscopes
GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic step
GB/T 2609-2006 Microscopes - Objectives
GB/T 43846.2-2024 Microscopes—Designation of microscope objectives—Part 2: Chromatic correction
GB/T 19864.1-2013 Stereomicroscopes—Part 1:Stereomicroscopes for general use
GB/T 26600-2024 Microscopes—Immersion liquid for light microscopy
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 9247-1996 Microscopes-Condensers
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB/T 26600-2011 Microscopes—Immersion liquids for light microscopy
GB/T 9247-2008 Microscopes—Condensers
GB/T 2609-1996 Microscopes--Objectives
GB/T 2985-2008 Biological microscope
GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB 9247-1988 Microscopes--Series of condensers
GB 11239-1989 The operation microscope
GB/T 24665-2009 Polarizing microscope

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
GB/T 22062-2020 Microscopes—Graticules for eyepieces

Professional Standard - Nuclear Industry

EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool

Professional Standard - Machinery

JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 7398.13-1994 Specimens slides for microscopes and biological microscopes
JB/T 10573-2013 Toolmakers Microscope
JB/T 8230.11-1999 Microscopes.Graticules for oculars
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 9339-1999 Measuring microscope
JB/T 9340-1999 Light-section microscope
JB/T 10573-2006 Toolmakers microscope
JB/T 5477-1991 Microscope - Immersion Oil for Fluorescence Microscopy
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 10077-1999 Metallurgical microscope
JB/T 7398.7-1994 Microscope - Revolving Nosepiece
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 2369-1993 Reading Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 7398.3-1994 Microscope Objective Thread

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 14698-2017 Identification method of feed material by microscopy
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
GB/T 34269-2017 Atlas of microscopic examination for feedstuff

Professional Standard - Medicine

YY 0067-1992 Micro-circulation microscopes
YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
YY 0067-2007 Micro-circulation microscopes

机械工业部

JB/T 8230.9-1995 Microscope eyepiece series
JB/T 8230.10-1995 Microscope condenser series
JB/T 8230.2-1995 Microscope objective lens series

国家食品药品监督管理局

YY/T 0067-2007 Micro-circulation microscopes

Professional Standard - Education

JY/T 011-1996 General rules for transmission electron microscopy

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Taiwan Provincial Standard of the People's Republic of China

CNS 11276-1985 Toolmakers" Microscopes

British Standards Institution (BSI)

BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
BS ISO 9344:2011 Microscopes. Graticules for eyepieces
BS ISO 9344:2016 Microscopes. Graticules for eyepieces
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 10934-1:2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy
BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components

International Organization for Standardization (ISO)

ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 9344:2011 Microscopes - Graticules for eyepieces
ISO/PRF 19012-4:2024 Microscopes
ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 9344:2016 Microscopes - Graticules for eyepieces
ISO/DIS 19012-4 Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 19012-1:2013 Microscopes.Designation of microscope objectives .Part 1: Flatness of field/Plan
ISO 11883:1997 Optics and optical instruments - Microscopes - Marking of stereomicroscopes

ESDU - Engineering Sciences Data Unit

SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.
SPB-M6-1-2010 Apr.08: Interfacial and Rheological Properties of Asphaltenes Investigated using AFM
SPB-M14-1-2010 Sept.10: Interactions and rheological properties of Asphaltenes studied by Atomic Force Microscopy

GSO

GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
OS GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces

American Society for Testing and Materials (ASTM)

ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps

Korean Agency for Technology and Standards (KATS)

KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS B 5601-1995(2021) Micrometer microscopes
KS B 5601-1995 Micrometer microscopes
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B 5601-2021 Micrometer microscopes
KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
KS B ISO 19012-1:2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS L 2010-2009(2019) Slide glasses for microscope
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B 5615-1997 Biological microscope objectives
KS B 5615-2016(2021) Biological microscope objectives
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B 5616-1981 Biological Microscope Eyepieces
KS B 5617-1993 Stage micrometer for biological microscope
KS B 5616-2013 Biological microscope eyepieces
KS B 5615-2021 Biological microscope objectives
KS B 5616-2018 Biological microscope eyepieces
KS B 5617-2013 Stage micrometer for biological microscope
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS B 5615-2016 Biological microscope objectives
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS B ISO 11884-2-2021 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B 5602-1995 Toolmakers’ microscopes
KS B 5614-1998 Stereo microscopes
KS B 5603-1990(2021) Microscope Test Specimens
KS P 1232-2019 Operation microscopes
KS B 5603-1985 Microscope Test Specimens
KS L 2010-1981 Slide glasses for microscope
KS P 1231-2008 Slit-lamp microscopes
KS B 5613-1996 SINGLE OBJECTIVE BINOCULAR MICROSCOPES
KS L 2010-2009 Slide glasses for microscope
KS L 2010-1999 Slide glasses for microscope
KS B 5614-2018 Stereo microscopes
KS B 5614-2013 Stereo microscopes
KS B 5619-2019 Microscopes — Eyepiece reticles

German Institute for Standardization

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern

PT-IPQ

NP 303-1963 Microcopies. Terminologie et déíinitions
E E 15-1971 Optical microscope

SCC

AWWA WQTC71603 Investigation of the Effect of Water Quality on the Initial Development of Corroding Copper by Atomic Force Microscopy
AENOR UNE 1059:1956 Microcopy.
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
BS 3836-2:1965 Specification for components of microscopes. Dimensions and marking of microscopes
BS ISO 10934-1:2002 Optics and optical instruments. Vocabulary for microscopy-Light microscopy
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
BS 3836-1:1964 Specification for components of microscopes. Microscope cover slips and slides

Japanese Industrial Standards Committee (JISC)

JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
JIS K 0132:1997 General rules for scanning electron microscopy
JIS B 7148:1992 Microscope eyepieces
JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS B 7150:1993 Micrometer microscopes
JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS B 7147:1993 Biological microscope objectives
JIS B 7141:2003 Microscope -- Screw thread for objectives
JIS B 7141:1994 Microscope -- Screw thread for objectives
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS B 7139-2:2008 Stereomicroscopes -- Part 2: Testing of stereomicroscopes
JIS B 7132:1998 Biological microscopes
JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
JIS B 7139-4:2008 Stereomicroscopes -- Part 4: Marking of stereomicroscopes
JIS B 7140:1986 Microscope test specimens
JIS B 7139:1997 Stereo microscopes

Military Standards (MIL-STD)

DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
DOD A-A-51689-1986 DISK, MICROMETER, MICROSCOPE EYEPIECE
DOD A-A-54868-1993 MICROSCOPE, OPTICAL STEREOSCOPIC
DOD A-A-50831-1982 SLIDE, MICROSCOPE

RU-GOST R

GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification

VE-FONDONORMA

NORVEN 84-1-1963 Microscope related terms and definitions

HU-MSZT

MNOSZ 5534-1956 Microscope light mirror
MNOSZ 15577-1953 microscope light

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B 5616-2023 Biological microscope eyepieces

Association Francaise de Normalisation

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique