Ultrafast Atomic Force Microscopy

Ultrafast Atomic Force Microscopy, Total:63 items.

The international standard classification for "Ultrafast Atomic Force Microscopy" includes: Test conditions and procedures in general , Optical equipment , Testing of metals , Optics and optical measurements , Physics. Chemistry , Animal feeding stuffs .

The Chinese standard classification for "Ultrafast Atomic Force Microscopy" includes: Basic standards and general methods , Magnifier and microscope , Metal physical property test method , Basic Subject in general , Electron optics and other physical optics instrument , Livestock and poultry feed and additive .

Group Standards of the People's Republic of China

T/GDASE 0008-2020 Determination of Young's modulus of graphene film
T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic step
GB/T 19864.2-2005 Stereomicroscopes - Part 2: High performance microscopes
GB/T 19864.2-2013 Stereomicroscopes—Part 2:High performance microscopes

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)

Professional Standard - Nuclear Industry

EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool

National Metrological Technical Specifications of the People's Republic of China

JJF(机械)1066-2021 Ultrasound Microscope Performance Calibration Specification
JJF(机械) 1066-2021 Performance Calibration Specification for Ultrasonic Microscopes

Professional Standard - Machinery

JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 5480-1991 Diaphragm of Electron Microscope

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 13-1992 Verification Regulations for High Temperature Microscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 14698-2017 Identification method of feed material by microscopy
GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
GB/T 34269-2017 Atlas of microscopic examination for feedstuff

ESDU - Engineering Sciences Data Unit

SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.

International Organization for Standardization (ISO)

ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope

British Standards Institution (BSI)

BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

GSO

GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope

American Society for Testing and Materials (ASTM)

ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy

Korean Agency for Technology and Standards (KATS)

KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2021 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes

German Institute for Standardization

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

SCC

AWWA WQTC71603 Investigation of the Effect of Water Quality on the Initial Development of Corroding Copper by Atomic Force Microscopy

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy

Military Standards (MIL-STD)

DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC

CZ-CSN

CSN 72 1084-1974 Methodics of pyrogenic microscopy of anorganic substances

RU-GOST R

GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration