How to use scanning electron microscope

How to use scanning electron microscope, Total:70 items.

The international standard classification for "How to use scanning electron microscope" includes: Chemical analysis , Linear and angular measurements in general , Metallic coatings , Optical equipment , Linear and angular measurements , Other standards related to analytical chemistry , Protection against crime .

The Chinese standard classification for "How to use scanning electron microscope" includes: Electron optics and other physical optics instrument , Material Protection , Chemical Measurement , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Crime judging technology .

Group Standards of the People's Republic of China

T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
T/COEMA 21O-2024 Polygonal scanning mirror for LIDAR
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
SN/T 3009-2011 Identification of Seawater Corrosion on Metallic Surface by SEM

Professional Standard - Machinery

JB/T 7503-1994 Thickness of Cross Section of Metal Coatings Scanning Electron Microscope Measuring Method
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 17722-1999 Gold-plated thickness measurement by SEM
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
GB/T 16594-1996 Micron grade lenght measurement by SEM
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

SCC

AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
VDI/VDE 2656 BLATT 1-2019 Determination of geometric measurements with scanning probe microscopes - calibration of measuring systems
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy

British Standards Institution (BSI)

18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
24/30497406 DC BS ISO 5490 Steel - Rating and classifying nonmetallic inclusions using the scanning electron microscope

Korean Agency for Technology and Standards (KATS)

KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary

GSO

GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 18115-2:2013 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

American Society for Testing and Materials (ASTM)

ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization

BE-NBN

NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

VDI - Verein Deutscher Ingenieure

VDI/VDE 2656 Blatt 1-2006 Bestimmung geometrischer Messgroessen mit Rastersondermikroskopen - Kalibrierung von Messsystemen

Association of German Mechanical Engineers

VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method