How to use a SEM

How to use a SEM, Total:75 items.

The international standard classification for "How to use a SEM" includes: Chemical analysis , Linear and angular measurements in general , Metallic coatings , Optical equipment , Linear and angular measurements , Other standards related to analytical chemistry .

The Chinese standard classification for "How to use a SEM" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Material Protection , Electrochemical, thermochemistry and optical profile type analyzer , Chemical Measurement .

Group Standards of the People's Republic of China

T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
GB/T 17722-1999 Gold-plated thickness measurement by SEM
GB/T 16594-1996 Micron grade lenght measurement by SEM
GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
GB/T 43661-2024 Surface chemical analysis—Scanning probe microscopy—Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Machinery

JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 6842-1993 Test Method of Scanning Electron Microscope

Professional Standard - Commodity Inspection

SN/T 3009-2011 Identification of Seawater Corrosion on Metallic Surface by SEM
SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

VDI - Verein Deutscher Ingenieure

VDI/VDE 2656 Blatt 1-2006 Bestimmung geometrischer Messgroessen mit Rastersondermikroskopen - Kalibrierung von Messsystemen

Association of German Mechanical Engineers

VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method

SCC

VDI/VDE 2656 BLATT 1-2019 Determination of geometric measurements with scanning probe microscopes - calibration of measuring systems
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
11/30199166 DC BS ISO 11952. Surface chemical analysis. Scanning probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
AWWA ACE95232 The Hidden Financial Resources of Municipal Utilities: How to Find Them-How to Use Them
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
AWWA ACE63260 How NOT to Use Optimization-based Model Calibration

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO 11952:2019 Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary

Aeronautical Radio Inc.

ARINC 419-3 SECTION 3.0 How to Use This Document

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy

GSO

GSO ISO 11952:2015 Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems
OS GSO ISO 11952:2015 Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems
BH GSO ISO 11952:2017 Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

British Standards Institution (BSI)

BS ISO 11952:2019 Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
24/30497406 DC BS ISO 5490 Steel - Rating and classifying nonmetallic inclusions using the scanning electron microscope

Korean Agency for Technology and Standards (KATS)

KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary

SSPC - The Society for Protective Coatings

CHAPTER 1-1995 How to Use SSPC Specifications and Guides
HOW TO USE-2000 How to Use SSPC Specifications and Guides
CHAPTER 1-2004 HOW TO USE SSPC STANDARDS@ SPECIFICATIONS@ AND GUIDES

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

American Society for Testing and Materials (ASTM)

ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization

BE-NBN

NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

The Society for Protective Coatings (SSPC)

SSPC CHAPTER 1-2004 HOW TO USE SSPC STANDARDS, SPECIFICATIONS, AND GUIDES

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc.

ASHRAE AT-01-12-2-2001 How to Use the New Codes in Moderate Seismic Areas