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Database: 365,228(8 Aug 2026)

Yeast cell scanning electron microscopy sample preparation method

Yeast cell scanning electron microscopy sample preparation method, Total:29 items.

The international standard classification for "Yeast cell scanning electron microscopy sample preparation method" includes: Chemical analysis , Other standards related to analytical chemistry , Linear and angular measurements in general , Optical equipment , Linear and angular measurements .

The Chinese standard classification for "Yeast cell scanning electron microscopy sample preparation method" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Material Protection , Oil shale , Electrochemical, thermochemistry and optical profile type analyzer .


Professional Standard - Petroleum

  • SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
  • SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
  • SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope

国家能源局

  • SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Professional Standard - Machinery

  • JB/T 7503-1994 Thickness of Cross Section of Metal Coatings Scanning Electron Microscope Measuring Method
  • JB/T 6842-1993 Test Method of Scanning Electron Microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
  • GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
  • GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
  • GB/T 16594-1996 Micron grade lenght measurement by SEM
  • GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
  • GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
  • GB/T 17722-1999 Gold-plated thickness measurement by SEM

Professional Standard - Education

  • JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
  • JY/T 010-1996 General rules for analytical scanning electron microscopy

Group Standards of the People's Republic of China

  • T/CNIA 0161-2023 Method for inspecting the microstructure and morphology of deformed aluminum and aluminum alloys Scanning electron microscopy method
  • T/NLIA 004-2021 In-situ SEM tensile test method for additive manufactured aluminum alloy

Shanghai Provincial Standard of the People's Republic of China

  • DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

Professional Standard - Commodity Inspection

  • SN/T 3009-2011 Identification of Seawater Corrosion on Metallic Surface by SEM

Military Standard of the People's Republic of China-General Armament Department

  • GJB 737.11-1993 Test methods for pyrotechnic chemicals Particle size determination Scanning electron microscopy

Guangdong Provincial Standard of the People's Republic of China

  • DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

工业和信息化部

  • YS/T 1491-2021 Method for determination of sphericity of nickel-based high-temperature alloy powder by scanning electron microscopy

Japanese Industrial Standards Committee (JISC)

  • JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation

Korean Agency for Technology and Standards (KATS)

International Organization for Standardization (ISO)

  • ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary

American Society for Testing and Materials (ASTM)

  • ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

SE-SIS

  • SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

GOST