under the electron microscope

under the electron microscope, Total:193 items.

The international standard classification for "under the electron microscope" includes: Optical equipment , Chemical analysis , Ophthalmic equipment .

The Chinese standard classification for "under the electron microscope" includes: Papermaking in general , Magnifier and microscope , Oil shale , Basic standards and general methods , Electron optics and other physical optics instrument , Chemical Measurement , Medical optical instrument and endoscope .

Professional Standard - Public Safety Standards

GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 22056-2008 Microscopes - Marking of objectives and eyepieces
GB/T 9246-2008 Microscopes—Oculars (eyepieces)
GB/T 22056-2018 Microscopes—Marking of objectives and eyepieces
GB/T 2609-1996 Microscopes--Objectives
GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 43846.2-2024 Microscopes—Designation of microscope objectives—Part 2: Chromatic correction
GB/T 9247-2008 Microscopes—Condensers
GB/T 2679.11-2008 Paper and board - qualitative analysis of mineral filler and mineral coating - SEM/EDAX method
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 2609-2006 Microscopes - Objectives
GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 9247-1996 Microscopes-Condensers
GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
GB/T 2609-2015 Microscopes―Objectives
GB/T 9246-1996 Microscopes-Oculars (eyepieces)
GB 7667-1996 The dose of X-rays leakage from electron microscope

Professional Standard - Machinery

JB/T 7398.1-1994 Symbols for Microscope Objectives and Eyepieces
JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 7398.13-1994 Specimens slides for microscopes and biological microscopes
JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

Professional Standard - Petroleum

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0581-2020 General analysis rules for transmission electron microscope
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 011-1996 General rules for transmission electron microscopy

Group Standards of the People's Republic of China

T/CSTM 00162-2020 Calibration methods for transmission electron microscope

National Metrological Verification Regulations of the People's Republic of China

JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Professional Standard - Medicine

YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery

Professional Standard - Ferrous Metallurgy

YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)
DVS 2801-1968 Resistance welding in microscopy (survey)
DVS 2802-1970 Ultrasonic welding process in microscopy (survey)

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2025 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO 10934:2025 Microscopes — Vocabulary for light microscopy
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 19012-4:2024 Microscopes - Designation of microscope objectives - Part 4: Polarization characteristics
ISO 9344:2011 Microscopes - Graticules for eyepieces
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO/PRF 19012-4:2024 Microscopes
ISO/DIS 19012-4 Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction
ISO 8578:2012 Microscopes - Marking of objectives and eyepieces
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes

American Society for Testing and Materials (ASTM)

ASTM STP 372-1965 Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E3060-16 Standard Guide for Subvisible Particle Measurement in Biopharmaceutical Manufacturing Using Dynamic (Flow) Imaging Microscopy
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO ISO 8578:2015 Microscopes -- Marking of objectives and eyepieces

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 11883:2016 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes

British Standards Institution (BSI)

BS ISO 25498:2025 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 10934:2025 Microscopes. Vocabulary for light microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
BS 3836-2:1965 Specification for components of microscopes. Dimensions and marking of microscopes
24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
BS 7012-16:1997 Light microscopes-Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
BS ISO 8578:2012 Microscopes. Marking of objectives and eyepieces

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS B 7144:1995 Microscope -- Connection of condensers for transmitted light with substage sleeves
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
JIS B 7148:1992 Microscope eyepieces
JIS B 7150:1993 Micrometer microscopes
JIS B 7139-2:2008 Stereomicroscopes -- Part 2: Testing of stereomicroscopes
JIS B 7139-4:2008 Stereomicroscopes -- Part 4: Marking of stereomicroscopes
JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
JIS B 7252:2015 Marking of microscope objectives and eyepieces
JIS B 7252:2001 Marking of microscope objectives and eyepieces

GCC Standardization Organization

GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 19012-1:2015 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes

Korean Agency for Technology and Standards (KATS)

KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2024 General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS B 5601-1995(2021) Micrometer microscopes
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS B 5601-1995 Micrometer microscopes
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 11884-2-2021 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B 5601-2021 Micrometer microscopes
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 8578:2006 Optics and optical instruments-Microscopes-Marking of objectives and eyepieces
KS B ISO 19012-1:2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
KS B 5619-1999 Microscopes-Eyepiece reticles
KS B ISO 8578:2016 Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope

Association Francaise de Normalisation

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components

Military Standards (MIL-STD)

DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS

International Electrotechnical Commission (IEC)

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

Bureau of Indian Standards

IS 13108-2019 Optics and Photonics â€” Microscopes â€” Immersion Liquids for Light Microscopy ( Second Revision )

FI-SFS

SFS 4463-1980 Fiber diameter measurement under projection microscope

Spanish Association for Standardization (UNE)

AENOR UNE 1059:1956 Microcopy.

German Institute for Standardization

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN 58889:1986-09 Lenses and oculars for microscops - Marking
DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern

Magyar Szabványügyi Testület

MNOSZ 5534-1956 Microscope light mirror

Gosstandart of Russia

GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols

National Association of Corrosion Engineers (NACE)

NACE Paper 04271-2014 Underfilm Corrosion Creep and Cathodic Delamination: Under the Microscope