SEM protocol

SEM protocol, Total:41 items.

The international standard classification for "SEM protocol" includes: Chemical analysis , Linear and angular measurements in general , Metallic coatings .

The Chinese standard classification for "SEM protocol" includes: Chemical Measurement , Electron optics and other physical optics instrument , Crime judging technology , Basic standards and general methods , Material Protection .

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National Metrological Verification Regulations of the People's Republic of China

• JJG 550-1988 Verification Regulation of Scanning Electron Microscope
• JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

National Metrological Technical Specifications of the People's Republic of China

• JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
• JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes

Group Standards of the People's Republic of China

• T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
• T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy

Military Standard of the People's Republic of China-General Armament Department

• GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
• GJB 2666-1996 Specification for scanning reflective beryllium mirrors
• GJB 8288-2014 Verification regulation for ultra-high speed rotating mirror streak camera system

Professional Standard - Machinery

• JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
• JB/T 6842-1993 Test Method of Scanning Electron Microscope

Professional Standard - Commodity Inspection

• SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Jiangsu Provincial Standard of the People's Republic of China

• DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms

Professional Standard - Education

• JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
• JY/T 010-1996 General rules for analytical scanning electron microscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

• GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 16594-1996 Micron grade lenght measurement by SEM
• GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method

American Society for Testing and Materials (ASTM)

• ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
• ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
• ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

Korean Agency for Technology and Standards (KATS)

• KS I 0051-2019 General rules for scanning electron microscopy
• KS M 0044-1999 General rules for scanning electron microscopy
• KS I 0051-1999(2019) General rules for scanning electron microscopy
• KS I 0051-1999 General rules for scanning electron microscopy
• KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
• KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
• KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
• KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope

Japanese Industrial Standards Committee (JISC)

• JIS K 0132:1997 General rules for scanning electron microscopy

International Organization for Standardization (ISO)

• ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

SCC

• 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
• BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
• AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope

GSO

• BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
• GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

KR-KS

• KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

British Standards Institution (BSI)

• 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

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