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Database: 365,228(8 Aug 2026)

an electron microscope

an electron microscope, Total:330 items.

The international standard classification for "an electron microscope" includes: Optical measuring instruments , Optical equipment , Protection against crime , Physicochemical methods of analysis , Optics and optical measurements in general , Radiographic equipment , Chemical analysis , Ophthalmic equipment .

The Chinese standard classification for "an electron microscope" includes: Electron optics and other physical optics instrument , Magnifier and microscope , Optical metrological instrument , Crime judging technology , Basic standards and general methods , Optical instrument in general , Medical optical instrument and endoscope , Chemical Measurement , General and microsurgical devices .


Professional Standard - Machinery

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

Professional Standard - Education

  • JY/T 011-1996 General rules for transmission electron microscopy
  • JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
  • JY/T 010-1996 General rules for analytical scanning electron microscopy
  • JY/T 0581-2020 General analysis rules for transmission electron microscope

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Group Standards of the People's Republic of China

National Metrological Verification Regulations of the People's Republic of China

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Professional Standard - Medicine

  • YY 0067-2007 Micro-circulation microscopes
  • YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
  • YY 0067-1992 Micro-circulation microscopes

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 22056-2018 Microscopes—Marking of objectives and eyepieces
  • GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
  • GB/T 22062-2020 Microscopes—Graticules for eyepieces

工业和信息化部

  • YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

国家食品药品监督管理局

机械工业部

Shanghai Provincial Standard of the People's Republic of China

  • DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
  • DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

  • SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

  • SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
  • SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
  • SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Taiwan Provincial Standard of the People's Republic of China

Jiangsu Provincial Standard of the People's Republic of China

  • DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

全国标准信息公共服务平台

Korean Agency for Technology and Standards (KATS)

International Organization for Standardization (ISO)

  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
  • ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
  • ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
  • ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
  • ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
  • ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
  • ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
  • ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
  • ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • ISO 9344:2011 Microscopes - Graticules for eyepieces
  • ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO/PRF 19012-4:2024 Microscopes
  • ISO/DIS 19012-4 Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics
  • ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
  • ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
  • ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
  • ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
  • ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction
  • ISO 8578:2012 Microscopes - Marking of objectives and eyepieces
  • ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
  • ISO 19012-3:2015 Microscopes - Designation of microscope objectives - Part 3: Spectral transmittance
  • ISO 9344:2016 Microscopes - Graticules for eyepieces
  • ISO 19012-1:2013 Microscopes.Designation of microscope objectives .Part 1: Flatness of field/Plan
  • ISO 11883:1997 Optics and optical instruments - Microscopes - Marking of stereomicroscopes
  • ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
  • ISO 19012-1:2011 Microscopes - Designation of microscope objectives - Part 1: Flatness of field/Plan
  • ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size

British Standards Institution (BSI)

  • BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
  • BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
  • 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
  • BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
  • 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
  • BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
  • 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
  • BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
  • BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
  • BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
  • BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
  • BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
  • BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
  • BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
  • BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
  • BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
  • BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
  • BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • 19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
  • 24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
  • BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
  • BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
  • BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
  • 18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
  • BS ISO 8578:2012 Microscopes. Marking of objectives and eyepieces
  • BS ISO 9344:2011 Microscopes. Graticules for eyepieces
  • BS ISO 9344:2016 Microscopes. Graticules for eyepieces
  • BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
  • BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
  • 23/30444981 DC BS ISO 19012-4. Microscopes. Designation of microscope objectives - Part 4. Polarization characteristics
  • BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
  • BS ISO 10934-1:2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy
  • BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components
  • BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size

GSO

  • OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
  • GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
  • OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
  • BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
  • BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
  • GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
  • OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
  • GSO ISO 19012-1:2015 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
  • OS GSO ISO 8578:2015 Microscopes -- Marking of objectives and eyepieces
  • BH GSO ISO 11883:2016 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
  • OS GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces
  • BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
  • GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
  • GSO ISO 11883:2013 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
  • BH GSO ISO 19012-1:2016 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
  • OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
  • GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness

Japanese Industrial Standards Committee (JISC)

Association of German Mechanical Engineers

SCC

  • BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
  • 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
  • 12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
  • BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
  • AENOR UNE 1059:1956 Microcopy.
  • BS 3836-2:1965 Specification for components of microscopes. Dimensions and marking of microscopes
  • BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
  • BS 7012-16:1997 Light microscopes-Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
  • 12/30266267 DC BS ISO 19012-1. Microscopes. Designation of microscope objectives. Flatness of field/Plan
  • DIN 58878:1978 Colour designation of objectives for microscopes
  • BS ISO 19012-2:2009 Optics and photonics. Designation of microscope objectives-Chromatic correction
  • VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
  • BS ISO 10934-1:2002 Optics and optical instruments. Vocabulary for microscopy-Light microscopy
  • BS 3836-1:1964 Specification for components of microscopes. Microscope cover slips and slides
  • ISO 8036:2015 Plus Redline Microscopes - Immersion liquids for light microscopy (includes Redline Version)

Association Francaise de Normalisation

  • NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
  • X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
  • NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
  • NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
  • NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
  • XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
  • XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness

KR-KS

  • KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
  • KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
  • KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
  • KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
  • KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
  • KS B 5616-2023 Biological microscope eyepieces
  • KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

RU-GOST R

  • GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
  • GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
  • GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
  • GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
  • GOST 3361-1975 Eyepieces and body-tubes of the microscopes. Attaching dimensions

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

American Society for Testing and Materials (ASTM)

  • ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

Military Standards (MIL-STD)

International Electrotechnical Commission (IEC)

  • IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

Standard Association of Australia (SAA)

  • ISO 19012-4:2024 Microscopes - Designation of microscope objectives - Part 4: Polarization characteristics

German Institute for Standardization

  • DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
  • DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
  • DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
  • DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern

HU-MSZT

American Society of Mechanical Engineers (ASME)

American National Standards Institute (ANSI)

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

VDI - Verein Deutscher Ingenieure

  • VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
  • VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

PT-IPQ

RO-ASRO

Danish Standards Foundation

  • DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery