Energy Spectrometer Scanning Electron Microscope

Energy Spectrometer Scanning Electron Microscope, Total:67 items.

The international standard classification for "Energy Spectrometer Scanning Electron Microscope" includes: Other standards related to analytical chemistry , Optical equipment , Chemical analysis , Protection against crime .

The Chinese standard classification for "Energy Spectrometer Scanning Electron Microscope" includes: Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Basic standards and general methods , Crime judging technology , Chemical Measurement .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 17361-2013 Microbeam analysis—Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM and XEDS
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Group Standards of the People's Republic of China

T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method
T/GAIA 017-2022 Determination of fluorine content in the surface coating of aluminum and aluminum alloys— Scanning electron microscope and energy dispersive spectrometer method
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope
T/CMAIA 002-2023 3D intelligent skin scanner

Professional Standard - Machinery

JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

Professional Standard - Public Safety Standards

GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1418-2017 Analysis of elements in glass evidence in Forensics—Scanning electron microscope/energy dispersive X-ray spectrometry(SEM/EDX)
GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1520-2018 Forensic science―Examination methods for elements of black powder and flash powder―Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 909-2010 Collecting and packaging method for trace evidence—Gunshot residue(SEM/EDS examination)

Professional Standard - Aviation

HB 20094.4-2012 Test method for determination of wear metals in operating liquid for aviation.Part 4: Scanning electron microscopy and energy dispersive spectrometry

Fujian Provincial Standard of the People's Republic of China

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
JJF 1712-2018 Calibration Specification for Thin Layer Chromatography Scanners

National Metrological Verification Regulations of the People's Republic of China

JJG(航空) 044-1989 Verification rules for single-scan oscillographic polarographs
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air

Professional Standard - Military and Civilian Products

WJ 2299-1995 Inductively Coupled Plasma Sequential Scanning Spectrometer Verification Regulations

Military Standard of the People's Republic of China-General Armament Department

GJB 2666-1996 Specification for scanning reflective beryllium mirrors
GJB 2666A-2018 Specification for scanning reflective beryllium mirrors

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

American Society for Testing and Materials (ASTM)

ASTM E1683-02(2014)e1 Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E1683-02(2022) Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry

SCC

AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

DIN

DIN ISO 15632:2022 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...

NEMA - National Electrical Manufacturers Association

NEMA NU 2-2012 Performance Measurements of Positron Emission Tomographs
NEMA NU 2-2018 Performance Measurements of Positron Emission Tomographs (PET)

Korean Agency for Technology and Standards (KATS)

KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS A ISO 16067-2-2005(2020) Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

British Standards Institution (BSI)

BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners

GSO

BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 15632-2023 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers(EDS) for use with a scanning electron microscope(SEM) or a

Others: ESEM,Scanning Electron Microscopy,Scanning Electron Microscopy,Scanning electron microscope energy spectrometer,Scanning electron microscope energy spectrometer,Scanning electron microscope energy spectrometer,SEM-EDS,Energy Spectrometer Scanning Electron Microscope,Scanning Electron Microscopy Electron Spectroscopy,SEM/EDS,SEM-EDS,Scanning Electron Microscopy,Scanning Electron Microscopy,SEM/EDS,Energy Spectrometer Scanning Electron Microscope,Scanning Electron Microscopy,SEM-EDS,Scanning Electron Microscope--Energy Spectroscopy