Contrast Electron Microscopy

Contrast Electron Microscopy, Total:434 items.

The international standard classification for "Contrast Electron Microscopy" includes: Optical measuring instruments , Optics and optical measurements in general , Testing of metals , Optical equipment , Chemical analysis , Physicochemical methods of analysis , Radiographic equipment , Optics and optical measurements , Products of the chemical industry in general , Ophthalmic equipment , Protection against crime .

The Chinese standard classification for "Contrast Electron Microscopy" includes: Magnifier and microscope , Electron optics and other physical optics instrument , Optical metrological instrument , Metal physical property test method , Basic standards and general methods , Metallographic testing method , Medical optical instrument and endoscope , Basic Subject in general , Basic standards and general methods for dye , Chemical Measurement , General and microsurgical devices , Crime judging technology .

Professional Standard - Machinery

JB/T 7398.13-1994 Specimens slides for microscopes and biological microscopes
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 7398.1-1994 Symbols for Microscope Objectives and Eyepieces
JB/T 10077-1999 Metallurgical microscope
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 7794-1995 Polarizing Microscope
JB/T 7398.3-1994 Microscope Objective Thread
JB/T 2369-1993 Reading Microscope
JB/T 7816-1995 Stereomicroscope
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
JB/T 7398.6-1994 Microscope - Motion Ruler
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 9340-1999 Light-section microscope
JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 8230.9-1995 Microscope eyepiece series
JB/T 10573-2013 Toolmakers Microscope
JB/T 9333-1999 Microscopes -- Immersion oil for general use in light microscopy
JB/T 8230.10-1995 Microscope condenser series
JB/T 7398.11-1994 Microscope - Phase Contrast Device
JB/T 2369-2024 Reading microscope
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 8230.11-1999 Microscopes.Graticules for oculars
JB/T 8230.2-1995 Microscope objective lens series
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 9339-1999 Measuring microscope
JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
JB/T 5477-1991 Microscope - Immersion Oil for Fluorescence Microscopy
JB/T 7398.7-1994 Microscope - Revolving Nosepiece
JB/T 9340-2024 Light-section microscope
JB/T 10573-2006 Toolmakers microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB 2609-1981 Object lens for microscopes series
GB/T 3719-1988 Toolmakers microscope
GB/T 22056-2008 Microscopes - Marking of objectives and eyepieces
GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
GB/T 19864.2-2013 Stereomicroscopes—Part 2:High performance microscopes
GB/T 19864.2-2005 Stereomicroscopes - Part 2: High performance microscopes
GB/T 9246-1996 Microscopes-Oculars (eyepieces)
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 2609-2006 Microscopes - Objectives
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
GB/T 14145-1993 Test method for stacking fault density of epitaxial layers of silicon by interference contrast microscopy
GB/T 22059-2008 Microscopes - Magnifying power
GB/T 2609-1996 Microscopes--Objectives
GB/T 9247-1996 Microscopes-Condensers
GB/T 22056-2018 Microscopes—Marking of objectives and eyepieces
GB/T 22062-2020 Microscopes—Graticules for eyepieces
GB/T 2985-2008 Biological microscope
GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
GB/T 24665-2009 Polarizing microscope
GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 2609-2015 Microscopes―Objectives
GB/T 2985-1999 Biological microscope
GB/T 10155-1988 Stereomicroscope
GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
GB/T 19864.1-2013 Stereomicroscopes—Part 1:Stereomicroscopes for general use
GB/T 22061-2008 Microscopes - Reference system of polarized light microscopy
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 27596-2011 Dyestuffs—Determination of particle fineness—Microscope method
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB/T 19864.1-2005 Stereomicroscopes - Part 1: Stereomicroscopes for general use
GB 11239-1989 The operation microscope
GB/T 26600-2011 Microscopes—Immersion liquids for light microscopy
GB/T 27668-2023 Microscopes—Vocabulary for light microscopy
GB/T 22062-2008 Microscopes - Graticules for oculars
GB/T 43846.2-2024 Microscopes—Designation of microscope objectives—Part 2: Chromatic correction
GB 9247-1988 Microscopes--Series of condensers
GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
GB/T 9247-2008 Microscopes—Condensers
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB 9246-1988 Microscopes--Series of oculars(eyepieces)
GB/T 43846.1-2024 Microscopes—Designation of microscope objectives—Part 1: Flatness of field/Plan
GB/T 26600-2024 Microscopes—Immersion liquid for light microscopy
GB/T 9246-2008 Microscopes—Oculars (eyepieces)

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Group Standards of the People's Republic of China

T/SZBX 096-2022 Operation microscopes
T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/BSPT 6-2024 Particulate technology—Analysis of sub-micron and nanometer heterostructure—Transmission electron microscopy
T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
T/CSP 13-2024 Particulate technology—Analysis of sub-micron and nanometer heterostructure—Transmission electron microscopy

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 011-1996 General rules for transmission electron microscopy
JY/T 0581-2020 General analysis rules for transmission electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Medicine

YY 0067-2007 Micro-circulation microscopes
YY 0067-1992 Micro-circulation microscopes
YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
YY/T 0067-2007 Micro-circulation microscopes

Shanghai Provincial Standard of the People's Republic of China

DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

Professional Standard - Ferrous Metallurgy

YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

Taiwan Provincial Standard of the People's Republic of China

CNS 11276-1985 Toolmakers" Microscopes

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Military Standard of the People's Republic of China-General Armament Department

GJB 8684.22-2015 Test methods for pyrotechnic properties - Part 22: Determination of smoke solid particle number concentration by electron microscopy

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

GJB 5384.22-2005 Test methods of performance for pyrotechnic composition Part 21: Concentration determination of solid smoke particles quantities Electron microscope method

American Society for Testing and Materials (ASTM)

ASTM STP 372-1965 Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM D7201-06(2011) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E210-63(2005) Standard Specification for Microscope Objective Thread
ASTM STP 257-1959 Symposium on Microscopy

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2025 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 9344:2016 Microscopes - Graticules for eyepieces
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 19012-1:2013 Microscopes.Designation of microscope objectives .Part 1: Flatness of field/Plan
ISO 19012-1:2011 Microscopes - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO 10934:2025 Microscopes — Vocabulary for light microscopy
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 9344:2011 Microscopes - Graticules for eyepieces
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO/PRF 19012-4:2024 Microscopes
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 19012-4:2024 Microscopes - Designation of microscope objectives - Part 4: Polarization characteristics
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 21363:2020 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
ISO/DIS 19012-4 Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 11883:1997 Optics and optical instruments - Microscopes - Marking of stereomicroscopes
ISO 19012-1:2007 Optics and photonics - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 8038:2013 Microscopes.Screw threads for objectives and related nosepieces
ISO 8578:2012 Microscopes - Marking of objectives and eyepieces
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO 15227 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO 19012-3:2015 Microscopes - Designation of microscope objectives - Part 3: Spectral transmittance

British Standards Institution (BSI)

BS ISO 25498:2025 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 9344:2011 Microscopes. Graticules for eyepieces
BS ISO 9344:2016 Microscopes. Graticules for eyepieces
BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS 7012-8:1997 Light microscopes - Graticules for eyepieces
BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
BS 7012-16:1997 Light microscopes-Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
12/30266267 DC BS ISO 19012-1. Microscopes. Designation of microscope objectives. Flatness of field/Plan
BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope
BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
BS ISO 10934:2025 Microscopes. Vocabulary for light microscopy
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
BS ISO 19012-1:2007 Optics and photonics. Designation of microscope objectives-Flatness of field/plan
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS 7012-8:1990 Light microscopes-Specification for surface marked graticules for eyepieces
21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS ISO 10934-1:2002 Optics and optical instruments. Vocabulary for microscopy-Light microscopy
BS 3836-2:1965 Specification for components of microscopes. Dimensions and marking of microscopes
BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components
BS 3836-1:1964 Specification for components of microscopes. Microscope cover slips and slides
BS ISO 10934-1:2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy
18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 8578:2012 Microscopes. Marking of objectives and eyepieces
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 8038:2013 Microscopes. Screw threads for objectives and related nosepieces
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS 7012-1:1990 Light microscopes-Specification for the magnifying power of microscope imaging components
23/30444981 DC BS ISO 19012-4. Microscopes. Designation of microscope objectives - Part 4. Polarization characteristics
BS ISO 19012-2:2009 Optics and photonics. Designation of microscope objectives-Chromatic correction
BS ISO 19056-1:2015 Microscopes. Definition and measurement of illumination properties. Image brightness and uniformity in bright field microscopy

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO 8578:2015 Microscopes -- Marking of objectives and eyepieces

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 19012-1:2016 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
BH GSO ISO 11883:2016 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
BH GSO ISO 8576:2016 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS B 7148:1992 Microscope eyepieces
JIS B 7150:1993 Micrometer microscopes
JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
JIS B 7147:1993 Biological microscope objectives
JIS B 7141:2003 Microscope -- Screw thread for objectives
JIS B 7141:1994 Microscope -- Screw thread for objectives
JIS B 7139-4:2008 Stereomicroscopes -- Part 4: Marking of stereomicroscopes
JIS B 7139-2:2008 Stereomicroscopes -- Part 2: Testing of stereomicroscopes
JIS B 7132:1998 Biological microscopes
JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
JIS B 7140:1986 Microscope test specimens
JIS B 7139:1997 Stereo microscopes
JIS B 7153:1995 Measuring microscopes
JIS B 7252:2001 Marking of microscope objectives and eyepieces
JIS K 0149-1:2019 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS B 7252:2015 Marking of microscope objectives and eyepieces
JIS B 7141:2012 Microscopes.Screw threads for objectives and related nosepieces
JIS B 7139-1:2008 Stereomicroscopes -- Part 1: Minimum requirements for stereomicroscopes
JIS K 2400:1988 Immersion oil for microscope
JIS T 7317:1988 Operation microscopes

Korean Agency for Technology and Standards (KATS)

KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
KS B ISO 19012-1:2016 Optics and photonics － Designation of microscope objectives － Part 1: Flatness of field/Plan
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS I 0051-2019 General rules for scanning electron microscopy
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2024 General rules for scanning electron microscopy
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D 8544-2021 Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B 5601-1995 Micrometer microscopes
KS B 5601-1995(2021) Micrometer microscopes
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS B 5601-2021 Micrometer microscopes
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2016) Optics and photonics － Minimum requirements for stereomicroscope － Part 2: High performance microscopes
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS B 5615-2016(2021) Biological microscope objectives
KS B 5615-1997 Biological microscope objectives
KS L 2010-2009(2024) Slide glasses for microscope
KS L 2010-2009(2019) Slide glasses for microscope
KS B 5617-1993 Stage micrometer for biological microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS B 5617-2013 Stage micrometer for biological microscope
KS B 5616-2013 Biological microscope eyepieces
KS B 5616-2023 Biological microscope eyepieces
KS B 5616-2018 Biological microscope eyepieces
KS B 5615-2021 Biological microscope objectives
KS B 5616-1981 Biological Microscope Eyepieces
KS B 5615-2016 Biological microscope objectives
KS B ISO 11884-2:2011 Optics and photonics － Minimum requirements for stereomicroscope － Part 2: High performance microscopes
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS B ISO 19012-1-2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS B ISO 11884-2-2021 Optics and photonics － Minimum requirements for stereomicroscope － Part 2: High performance microscopes
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS B 5602-1995 Toolmakers’ microscopes
KS B 5614-1998 Stereo microscopes
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B 5619-2019(2024) Microscopes — Eyepiece reticles
KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS L 2010-1999 Slide glasses for microscope
KS B 5614-2018 Stereo microscopes
KS L 2010-2009 Slide glasses for microscope
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
KS P 1232-2019 Operation microscopes
KS B 5603-1990(2021) Microscope Test Specimens
KS B 5618-1993 Net stage micrometer for biological microscope
KS B 5613-1996 SINGLE OBJECTIVE BINOCULAR MICROSCOPES
KS B 5614-2013 Stereo microscopes
KS B 5603-1985 Microscope Test Specimens
KS L 2010-1981 Slide glasses for microscope
KS P 1231-2008 Slit-lamp microscopes
KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B 5619-2019 Microscopes — Eyepiece reticles
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B 5618-2013 Net stage micrometer for biological microscope
KS B ISO 8578:2006 Optics and optical instruments-Microscopes-Marking of objectives and eyepieces
KS B 5603-1990 Microscope Test Specimens
KS P 1232-2024 Operation microscopes
KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS B ISO 8578:2016 Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B 5619-1999 Microscopes-Eyepiece reticles
KS B 5605-1987 Biological Microscopes for Immersion Objectives
KS M 2617-2022 Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS P 1231-2019 Slit-lamp microscopes
KS M 2617-2007(2017) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS L 2009-2019 Cover glass for microscope
KS L 2010-2024 Slide glasses for microscope
KS B ISO 19012-1-2016(2021) Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS P 1232-2008 Operation microscopes
KS B 5601-1995(2016) Micrometer microscopes
KS L 2009-2024 Cover glass for microscope

GCC Standardization Organization

GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
GSO ISO 19012-1:2015 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
GSO ISO 11883:2013 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces

Association Francaise de Normalisation

NF ISO 15932:2014 Microbeam Analysis - Analytical Electron Microscopy - Vocabulary
NF X11-660:1983 Granulometry - Granulometric analysis by optical microscopy - General information on the microscope
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of confocal fluorescence microscopes for biological imaging
NF X43-050:2021 Air quality - Determination of the asbestos fiber concentration by transmission electron microscopy - Indirect method

Swedish Institute for Standards

SS-ISO 9220:1989 Metallic coatings - Measurements of coating thickness - Scanning electron microscope method
SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SS-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

Ente Nazionale Italiano di Unificazione

UNI EN ISO 9220:1998 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
UNI ISO 9220:1990 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
UNI EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
UNI 6500-1969 Anodic oxidation lining of aluminum and its alloys. Measuring lining thickness by optical microscope

Danish Standards Foundation

DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)
DVS 2801-1968 Resistance welding in microscopy (survey)

Military Standards (MIL-STD)

DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
DOD A-A-51689-1986 DISK, MICROMETER, MICROSCOPE EYEPIECE
DOD A-A-54868-1993 MICROSCOPE, OPTICAL STEREOSCOPIC
DOD A-A-50831-1982 SLIDE, MICROSCOPE
DOD A-A-54970-1994 MICROSCOPE, OPTICAL
DOD A-A-54434-1991 DRAPE, OPERATING MICROSCOPE

European Committee for Standardization (CEN)

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)

German Institute for Standardization

DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
DIN EN ISO 9220:1995-01 Metallic coatings - Measurement of coating thickness with the scanning electron microscope method (ISO 9220:1988)
DIN EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
DIN 58881:1956 Microscopes - Oculars, fitting dimensions
DIN 58889:1986-09 Lenses and oculars for microscops - Marking
DIN 58888:1979 Microscope eyepiece interface thread DIN RMS-58888
DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN EN ISO 9220:2021-04 Draft Document - Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
DIN 58889:1986 Lenses and oculars for microscops - Marking
DIN 58881:1956-05 Microscopes - Oculars, fitting dimensions

Bureau of Indian Standards

IS 13108-2019 Optics and Photonics —— Microscopes —— Immersion Liquids for Light Microscopy ( Second Revision )
IS 17849-2022 Nanotechnologies Measurements of particle size and shape distributions by transmission electron microscopy
IS 3099-1 AND 2-1992 Microscopes - Slips and slides: Specification: Part 1 Microscope slips-2 Microscope slides

Spanish Association for Standardization (UNE)

AENOR UNE 1059:1956 Microcopy.
UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
AENOR UNE-EN ISO 9220:1996 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
IPC JEDEC J-STD-035A-2022 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Devices

Magyar Szabványügyi Testület

MNOSZ 5534-1956 Microscope light mirror
MNOSZ 15577-1953 microscope light
MSZ 7902-1962 microscope. enlarge

Gosstandart of Russia

GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
GOST 3469-1991 Mikroscopes. Screw threads for objectives. Dimensions
GOST R ISO 14966-2022 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method

GM Holden Ltd

HOLDEN HN 0295-2004 MICROSCOPIC MEASUREMENT OF DRY FILM BUILD THICKNESS
HOLDEN HN 0295-2012 Microscopic Measurement of Dry Film Build Thickness

Bureau of Philippine Standards

PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

International Electrotechnical Commission (IEC)

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

American Society of Mechanical Engineers (ASME)

ASME B1.11-1958(R2016) Microscope Objective Thread Errata - July 1972
ASME B1.11-1958 Microscope Objective Thread Errata - July 1972

American National Standards Institute （ANSI)

ANSI B1.11-1958 Microscope Objective Thread
ANSI/ASME B1.11-1958 Microscope Objective Thread
ANSI/ASTM D6057:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Phase Contrast Microscopy

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

Society of Automotive Engineers (SAE)

SAE ARP598C-2003 (R) Aerospace Microscopic Sizing and Counting of Particulate Contamination for Fluid Power Systems

Lithuanian Standards Office

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

Portuguese Institute of Quality

E E 15-1971 Optical microscope

Austrian Standards

OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)

National Standardisation Body (ASRO)

STAS 7353/1-1981 MICROSCOPES Terminology
STAS 12693-1988 SLIDES FOR MICROSCOPES

Standards Norway

NS-EN ISO 9220:1994 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method (ISO 9220:1988)

Thai Industrial Standards Institute (TISI)

TIS 1083-1992 Standard for measurement of coating thickness by microscopical method

Polski Komitet Normalizacyjny (PKN)

PN N53053-1991 Microscopes. Eyepieces. Requirements